Chrong-Jung Lin

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Defect measurement method
- Patent number 12,142,537
- Issue date Nov 12, 2024
- National Tsing Hua University
- Burn-Jeng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell including programmable resistors with transistor compon...
- Patent number 12,051,466
- Issue date Jul 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Grant
Low voltage one-time-programmable memory and array thereof
- Patent number 12,040,028
- Issue date Jul 16, 2024
- National Tsing Hua University
- Ya-Chin King
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistive memory device and method for manufacturing with protrusio...
- Patent number 12,041,860
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Der Chih
Information Patent Grant
Detection using semiconductor detector
- Patent number 12,009,177
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ya-Chin King
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 11,943,936
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection using semiconductor detector
- Patent number 11,824,133
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ya-Chin King
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory cell and non-volatile memory
- Patent number 11,695,082
- Issue date Jul 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jiun Shiung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with data storage structure and method for...
- Patent number 11,653,503
- Issue date May 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Woan-Yun Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell including programmable resistors with transistor compon...
- Patent number 11,646,079
- Issue date May 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro detector
- Patent number 11,335,609
- Issue date May 17, 2022
- National Tsing Hua University
- Burn-Jeng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory cell and non-volatile memory
- Patent number 11,043,601
- Issue date Jun 22, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jiun Shiung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with conducting structure for reducing parasit...
- Patent number 10,910,469
- Issue date Feb 2, 2021
- Vanguard International Semiconductor Corporation
- Wen-Hua Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with data storage structure
- Patent number 10,763,305
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Woan-Yun Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory cell and non-volatile memory
- Patent number 10,276,726
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jiun Shiung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory device and operation method of the same
- Patent number 10,269,437
- Issue date Apr 23, 2019
- Copee Technology Company
- Chrong-Jung Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing a semiconductor structure including a plura...
- Patent number 10,090,360
- Issue date Oct 2, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Woan-Yun Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming semiconductor device structure
- Patent number 9,831,130
- Issue date Nov 28, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- An-Lun Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory device and operating method thereof
- Patent number 9,805,796
- Issue date Oct 31, 2017
- Copee Technology Company
- Chrong-Jung Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device structure and method for forming the same
- Patent number 9,679,818
- Issue date Jun 13, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- An-Lun Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory array and non-volatile memory device of the same
- Patent number 9,653,469
- Issue date May 16, 2017
- Copee Technology Company
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory with resistive element and manufacturing method...
- Patent number 9,287,324
- Issue date Mar 15, 2016
- GLYPHTRON CORP.
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control method for nonvolatile memory device with vertically stacke...
- Patent number 9,218,853
- Issue date Dec 22, 2015
- Lite-On Technology Corporation
- Chrong-Jung Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Cell structure of resistive non-volatile memory and manufacturing m...
- Patent number 9,209,225
- Issue date Dec 8, 2015
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional integrated circuit and method of transmitting dat...
- Patent number 9,178,132
- Issue date Nov 3, 2015
- National Tsing Hua University
- Chrong Jung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Resistive non-volatile memory, cell structure and manufacturing met...
- Patent number 9,130,166
- Issue date Sep 8, 2015
- Chrong-Jung Lin
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive element and memory cell of non-volatile memory and manufa...
- Patent number 9,117,750
- Issue date Aug 25, 2015
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile semiconductor device, and method of operating the same
- Patent number 8,837,227
- Issue date Sep 16, 2014
- National Tsing Hua University
- Chrong-Jung Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Antifuse and method of making the antifuse
- Patent number 8,754,498
- Issue date Jun 17, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yue-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile semiconductor device, and method of operating the same
- Patent number 8,724,398
- Issue date May 13, 2014
- National Tsing Hua University
- Chrong-Jung Lin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ONE-TIME-PROGRAMMABLE MEMORY DEVICES AND METHODS FOR FORMING THE SAME
- Publication number 20240407159
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der Chih
Information Patent Application
ONE-TIME-PROGRAMMABLE MEMORY DEVICES
- Publication number 20240404611
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chrong Jung Lin
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240405087
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR VOLTAGE GENERATING
- Publication number 20240395641
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin King
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL INCLUDING PROGRAMMABLE RESISTORS WITH TRANSISTOR COMPON...
- Publication number 20240355388
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
RESISTIVE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240324474
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der CHIH
Information Patent Application
DETECTION USING SEMICONDUCTOR DETECTOR
- Publication number 20240290575
- Publication date Aug 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240105504
- Publication date Mar 28, 2024
- Vanguard International Semiconductor Corporation
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20240038921
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND DETECTING M...
- Publication number 20230378377
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW VOLTAGE ONE-TIME-PROGRAMMABLE MEMORY AND ARRAY THEREOF
- Publication number 20230343403
- Publication date Oct 26, 2023
- National Tsing Hua University
- Ya-Chin KING
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND SYSTEM
- Publication number 20230326521
- Publication date Oct 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der CHIH
- G11 - INFORMATION STORAGE
Information Patent Application
NEURAL NETWORK SYSTEM, HIGH DENSITY EMBEDDED-ARTIFICIAL SYNAPTIC EL...
- Publication number 20230289577
- Publication date Sep 14, 2023
- National Tsing Hua University
- Ya-Chin KING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NEURAL NETWORK SYSTEM, HIGH EFFICIENCY EMBEDDED-ARTIFICIAL SYNAPTIC...
- Publication number 20230292533
- Publication date Sep 14, 2023
- National Tsing Hua University
- Ya-Chin KING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CELL INCLUDING PROGRAMMABLE RESISTORS WITH TRANSISTOR COMPON...
- Publication number 20230253040
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL RESISTIVE RANDOM ACCESS MEMORY STRUCTURE
- Publication number 20230240083
- Publication date Jul 27, 2023
- National Tsing Hua University
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESISTIVE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230240156
- Publication date Jul 27, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der CHIH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230050978
- Publication date Feb 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- YU-DER CHIH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION USING SEMICONDUCTOR DETECTOR
- Publication number 20230026707
- Publication date Jan 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FABRICATION APPARATUS AND METHOD OF USING THE SAME
- Publication number 20220252989
- Publication date Aug 11, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Cell Including Programmable Resistors With Transistor Compon...
- Publication number 20220068378
- Publication date Mar 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Der Chih
- G11 - INFORMATION STORAGE
Information Patent Application
DETECTION USING SEMICONDUCTOR DETECTOR
- Publication number 20210407764
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ya-Chin KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY CELL AND NON-VOLATILE MEMORY
- Publication number 20210313472
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiun Shiung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT MEASUREMENT METHOD
- Publication number 20210159129
- Publication date May 27, 2021
- National Tsing Hua University
- Burn-Jeng LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR...
- Publication number 20200395411
- Publication date Dec 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Woan-Yun HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH CONDUCTING STRUCTURE FOR REDUCING PARASIT...
- Publication number 20200388676
- Publication date Dec 10, 2020
- Vanguard International Semiconductor Corporation
- Wen-Hua WEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO DETECTOR AND DEFECT MEASUREMENT METHOD
- Publication number 20200321255
- Publication date Oct 8, 2020
- National Tsing Hua University
- Burn-Jeng LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY CELL AND NON-VOLATILE MEMORY
- Publication number 20190252552
- Publication date Aug 15, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jiun Shiung Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR...
- Publication number 20190035850
- Publication date Jan 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Woan-Yun HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY DEVICE AND OPERATION METHOD OF THE SAME
- Publication number 20180315481
- Publication date Nov 1, 2018
- Copee Technology Company
- Chrong-Jung LIN
- G11 - INFORMATION STORAGE

Chrong-Jung Lin

Person

Patents Grantslast 30 patents

Defect measurement method

Memory cell including programmable resistors with transistor compon...

Low voltage one-time-programmable memory and array thereof

Resistive memory device and method for manufacturing with protrusio...

Detection using semiconductor detector

Semiconductor device and method of manufacturing the same

Detection using semiconductor detector

Non-volatile memory cell and non-volatile memory

Semiconductor structure with data storage structure and method for...

Memory cell including programmable resistors with transistor compon...

Micro detector

Non-volatile memory cell and non-volatile memory

Semiconductor device with conducting structure for reducing parasit...

Semiconductor structure with data storage structure

Non-volatile memory cell and non-volatile memory

Non-volatile memory device and operation method of the same

Method of manufacturing a semiconductor structure including a plura...

Method for forming semiconductor device structure

Non-volatile memory device and operating method thereof

Semiconductor device structure and method for forming the same

Memory array and non-volatile memory device of the same

Non-volatile memory with resistive element and manufacturing method...

Control method for nonvolatile memory device with vertically stacke...

Cell structure of resistive non-volatile memory and manufacturing m...

Three-dimensional integrated circuit and method of transmitting dat...

Resistive non-volatile memory, cell structure and manufacturing met...

Resistive element and memory cell of non-volatile memory and manufa...

Non-volatile semiconductor device, and method of operating the same

Antifuse and method of making the antifuse

Non-volatile semiconductor device, and method of operating the same

Patents Applicationslast 30 patents

ONE-TIME-PROGRAMMABLE MEMORY DEVICES AND METHODS FOR FORMING THE SAME

ONE-TIME-PROGRAMMABLE MEMORY DEVICES

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

DEVICE, SYSTEM AND METHOD FOR VOLTAGE GENERATING

MEMORY CELL INCLUDING PROGRAMMABLE RESISTORS WITH TRANSISTOR COMPON...

RESISTIVE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

DETECTION USING SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND DETECTING M...

LOW VOLTAGE ONE-TIME-PROGRAMMABLE MEMORY AND ARRAY THEREOF

MEMORY DEVICE AND SYSTEM

NEURAL NETWORK SYSTEM, HIGH DENSITY EMBEDDED-ARTIFICIAL SYNAPTIC EL...

NEURAL NETWORK SYSTEM, HIGH EFFICIENCY EMBEDDED-ARTIFICIAL SYNAPTIC...

MEMORY CELL INCLUDING PROGRAMMABLE RESISTORS WITH TRANSISTOR COMPON...

THREE-DIMENSIONAL RESISTIVE RANDOM ACCESS MEMORY STRUCTURE

RESISTIVE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

DETECTION USING SEMICONDUCTOR DETECTOR

SEMICONDUCTOR FABRICATION APPARATUS AND METHOD OF USING THE SAME

Memory Cell Including Programmable Resistors With Transistor Compon...

DETECTION USING SEMICONDUCTOR DETECTOR

NON-VOLATILE MEMORY CELL AND NON-VOLATILE MEMORY

DEFECT MEASUREMENT METHOD

SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR...

SEMICONDUCTOR DEVICE WITH CONDUCTING STRUCTURE FOR REDUCING PARASIT...

MICRO DETECTOR AND DEFECT MEASUREMENT METHOD

NON-VOLATILE MEMORY CELL AND NON-VOLATILE MEMORY

SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR...

NON-VOLATILE MEMORY DEVICE AND OPERATION METHOD OF THE SAME