Clarence K.L. Tam

Follow

Person

Montreal, CA

People

Patents Grantslast 30 patents

Information Patent Grant
High-speed transceiver tester incorporating jitter injection
- Patent number 8,327,204
- Issue date Dec 4, 2012
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for testing integrated circuits
- Patent number 7,242,209
- Issue date Jul 10, 2007
- DFT Microsystems, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for use in DC parametric tests
- Patent number 6,917,320
- Issue date Jul 12, 2005
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for use in DC parametric tests
- Patent number 6,727,834
- Issue date Apr 27, 2004
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-Speed Transceiver Tester Incorporating Jitter Injection
- Publication number 20070113119
- Publication date May 17, 2007
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for testing integrated circuits
- Publication number 20050253617
- Publication date Nov 17, 2005
- DFT Microsystems Canada, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Method and device for use in DC parametric tests
- Publication number 20040246002
- Publication date Dec 9, 2004
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Method and device for use in DC parametric tests
- Publication number 20030206127
- Publication date Nov 6, 2003
- Gordon W. Roberts
- G01 - MEASURING TESTING