Claus Koster

Person

Liliendhal, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Fragment ion mass spectra measured with tandem time-of-flight mass...
- Patent number 9,761,430
- Issue date Sep 12, 2017
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometers with cassini reflector
- Patent number 9,576,783
- Issue date Feb 21, 2017
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage supplies for mass spectrometers
- Patent number 9,245,727
- Issue date Jan 26, 2016
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introduction of ions into kingdon ion traps
- Patent number 8,946,623
- Issue date Feb 3, 2015
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introduction of ions into electrostatic ion traps
- Patent number 8,907,271
- Issue date Dec 9, 2014
- Bruker Daltonik, GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kingdon ion traps with higher-order cassini potentials
- Patent number 8,735,812
- Issue date May 27, 2014
- Bruker Daltonik GmbH
- Claus Köster
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Guiding spray droplets into an inlet capillary of a mass spectrometer
- Patent number 8,513,599
- Issue date Aug 20, 2013
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introduction of ions into Kingdon ion traps
- Patent number 8,384,019
- Issue date Feb 26, 2013
- Bruker Daltonik, GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with an electrostatic ion trap
- Patent number 7,994,473
- Issue date Aug 9, 2011
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fragmentation of ions in Kingdon ion traps
- Patent number 7,989,758
- Issue date Aug 2, 2011
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation of frequency mass spectra
- Patent number 7,964,842
- Issue date Jun 21, 2011
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multideflector
- Patent number RE38861
- Issue date Nov 1, 2005
- Bruker Daltonics, Inc.
- Melvin Park
- 250 - Radiant energy
Information Patent Grant
Ionization of high-molecular substances by laser desorption from li...
- Patent number 6,465,778
- Issue date Oct 15, 2002
- Bruker Daltonik GmbH
- Claus Koster
- G01 - MEASURING TESTING
Information Patent Grant
Daughter ion spectra with time-of-flight mass spectrometers
- Patent number 6,300,627
- Issue date Oct 9, 2001
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method for accurate mass determination of unknown...
- Patent number 6,188,064
- Issue date Feb 13, 2001
- Bruker Daltonik GmbH
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-mass detector with high mass-resolution for time-of-flight mas...
- Patent number 6,051,831
- Issue date Apr 18, 2000
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustment of the sample support in time-of-flight mass spectrometers
- Patent number 5,910,656
- Issue date Jun 8, 1999
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate mass determination with maldi time-of-flight mass spectrom...
- Patent number 5,886,345
- Issue date Mar 23, 1999
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Exact mass determination with maldi time-of-flight mass spectrometers
- Patent number 5,869,830
- Issue date Feb 9, 1999
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for introduction of sample supports into a mass s...
- Patent number 5,841,136
- Issue date Nov 24, 1998
- Bruker-Franzen Analytik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for matrix-assisted laser desorption ionization
- Patent number 5,828,063
- Issue date Oct 27, 1998
- Bruker-Franzen Analytik, GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of improving mass resolution in time-of-flight mass spectrom...
- Patent number 5,742,049
- Issue date Apr 21, 1998
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the improved mass resolution of time-of-fligh...
- Patent number 5,739,529
- Issue date Apr 14, 1998
- Bruker-Franzen Analytik GmbH
- Frank Laukien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for time-of-flight mass spectrometry of daughter ions
- Patent number 5,734,161
- Issue date Mar 31, 1998
- Bruker-Franzen Analytik, GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multideflector
- Patent number 5,696,375
- Issue date Dec 9, 1997
- Bruker Analytical Instruments, Inc.
- Melvin Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the ionization of heavy molecules at atmospheric pressure
- Patent number 5,663,561
- Issue date Sep 2, 1997
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass resolution in time-of-flight mass spectrometers with reflectors
- Patent number 5,654,545
- Issue date Aug 5, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improved mass resolution with a TOF-LD source
- Patent number 5,641,959
- Issue date Jun 24, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FRAGMENT ION MASS SPECTRA MEASURED WITH TANDEM TIME-OF-FLIGHT MASS...
- Publication number 20160225592
- Publication date Aug 4, 2016
- Bruker Daltonik GmbH
- KÖSTER Claus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETERS WITH CASSINI REFLECTOR
- Publication number 20160148795
- Publication date May 26, 2016
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE SUPPLIES FOR MASS SPECTROMETERS
- Publication number 20140117220
- Publication date May 1, 2014
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRODUCTION OF IONS INTO KINGDON ION TRAPS
- Publication number 20130146761
- Publication date Jun 13, 2013
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATION OF HARMONICS IN OSCILLATION MASS SPECTROMETERS
- Publication number 20130112863
- Publication date May 9, 2013
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRODUCTION OF IONS INTO ELECTROSTATIC ION TRAPS
- Publication number 20130037711
- Publication date Feb 14, 2013
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
KINGDON ION TRAPS WITH HIGHER-ORDER CASSINI POTENTIALS
- Publication number 20120181423
- Publication date Jul 19, 2012
- Bruker Daltonik GmbH
- Claus KÖSTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH AN ELECTROSTATIC ION TRAP
- Publication number 20110042562
- Publication date Feb 24, 2011
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUIDING SPRAY DROPLETS INTO AN INLET CAPILLARY OF A MASS SPECTROMETER
- Publication number 20110036974
- Publication date Feb 17, 2011
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRODUCTION OF IONS INTO KINGDON ION TRAPS
- Publication number 20100301204
- Publication date Dec 2, 2010
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRAGMENTATION OF IONS IN KINGDON ION TRAPS
- Publication number 20090294656
- Publication date Dec 3, 2009
- Bruker Daltonik GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION OF FREQUENCY MASS SPECTRA
- Publication number 20090294651
- Publication date Dec 3, 2009
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS

Claus Koster

Person

Patents Grantslast 30 patents

Fragment ion mass spectra measured with tandem time-of-flight mass...

Time-of-flight mass spectrometers with cassini reflector

Voltage supplies for mass spectrometers

Introduction of ions into kingdon ion traps

Introduction of ions into electrostatic ion traps

Kingdon ion traps with higher-order cassini potentials

Guiding spray droplets into an inlet capillary of a mass spectrometer

Introduction of ions into Kingdon ion traps

Mass spectrometer with an electrostatic ion trap

Fragmentation of ions in Kingdon ion traps

Evaluation of frequency mass spectra

Multideflector

Ionization of high-molecular substances by laser desorption from li...

Daughter ion spectra with time-of-flight mass spectrometers

Mass spectrometry method for accurate mass determination of unknown...

High-mass detector with high mass-resolution for time-of-flight mas...

Adjustment of the sample support in time-of-flight mass spectrometers

Accurate mass determination with maldi time-of-flight mass spectrom...

Exact mass determination with maldi time-of-flight mass spectrometers

Device and method for introduction of sample supports into a mass s...

Method for matrix-assisted laser desorption ionization

Method of improving mass resolution in time-of-flight mass spectrom...

Device and method for the improved mass resolution of time-of-fligh...

Method for time-of-flight mass spectrometry of daughter ions

Multideflector

Method for the ionization of heavy molecules at atmospheric pressure

Mass resolution in time-of-flight mass spectrometers with reflectors

Method for improved mass resolution with a TOF-LD source

Patents Applicationslast 30 patents

FRAGMENT ION MASS SPECTRA MEASURED WITH TANDEM TIME-OF-FLIGHT MASS...

TIME-OF-FLIGHT MASS SPECTROMETERS WITH CASSINI REFLECTOR

VOLTAGE SUPPLIES FOR MASS SPECTROMETERS

INTRODUCTION OF IONS INTO KINGDON ION TRAPS

GENERATION OF HARMONICS IN OSCILLATION MASS SPECTROMETERS

INTRODUCTION OF IONS INTO ELECTROSTATIC ION TRAPS

KINGDON ION TRAPS WITH HIGHER-ORDER CASSINI POTENTIALS

MASS SPECTROMETER WITH AN ELECTROSTATIC ION TRAP

GUIDING SPRAY DROPLETS INTO AN INLET CAPILLARY OF A MASS SPECTROMETER

INTRODUCTION OF IONS INTO KINGDON ION TRAPS

FRAGMENTATION OF IONS IN KINGDON ION TRAPS

EVALUATION OF FREQUENCY MASS SPECTRA