Concetta Riccobene

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active l...
- Patent number 6,765,227
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Bin Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leaky, thermally conductive insulator material (LTCIM) in semicondu...
- Patent number 6,717,212
- Issue date Apr 6, 2004
- Advanced Micro Devices, Inc.
- Dong-Hyuk Ju
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Asymmetric retrograde halo metal-oxide-semiconductor field-effect t...
- Patent number 6,667,512
- Issue date Dec 23, 2003
- Advanced Micro Devices, Inc.
- Carl R. Huster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective epitaxy to reduce gate/gate dielectric interface roughness
- Patent number 6,548,335
- Issue date Apr 15, 2003
- Advanced Micro Devices, Inc.
- Carl Robert Huster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI device with body recombination region, and method
- Patent number 6,538,284
- Issue date Mar 25, 2003
- Advanced Micro Devices, Inc.
- Concetta E. Riccobene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raised S/D region for optimal silicidation to control floating body...
- Patent number 6,525,378
- Issue date Feb 25, 2003
- Advanced Micro Devices, Inc.
- Concetta E. Riccobene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Removal of heat from SOI device
- Patent number 6,515,333
- Issue date Feb 4, 2003
- Advanced Micro Devices, Inc.
- Concetta E. Riccobene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon-on-insulator transistors with asymmetric source/drain junct...
- Patent number 6,479,868
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Xilin Judy An
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring source and drain junction depth in silicon on...
- Patent number 6,475,816
- Issue date Nov 5, 2002
- Advanced Micro Devices, Inc.
- Concetta Riccobene
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabrication of semiconductor-on-insulator (SOI) wafer hav...
- Patent number 6,410,371
- Issue date Jun 25, 2002
- Advanced Micro Devices, Inc.
- Bin Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized single side pocket implant location for a field effect tr...
- Patent number 6,396,103
- Issue date May 28, 2002
- Advanced Micro Devices, Inc.
- Concetta Riccobene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual silicide process to reduce gate resistance
- Patent number 6,391,767
- Issue date May 21, 2002
- Advanced Micro Devices, Inc.
- Carl Robert Huster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of structure to accurately measure source/drain resistance
- Patent number 6,274,501
- Issue date Aug 14, 2001
- Advanced Micro Devices, Inc.
- Concetta Riccobene
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing asymmetric channel transistor
- Patent number 6,242,329
- Issue date Jun 5, 2001
- Advanced Micro Devices, Inc.
- Carl Robert Huster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with a modulated gate oxide thickness
- Patent number 6,229,184
- Issue date May 8, 2001
- Advanced Micro Devices, Inc.
- Concetta Riccobene
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED METROLOGY AND PROCESS TOOL TO ENABLE LOCAL STRESS/OVERLA...
- Publication number 20170287752
- Publication date Oct 5, 2017
- Applied Materials, Inc.
- Ludovic GODET
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhancing Memory Yield Through Memory Subsystem Repair
- Publication number 20140169113
- Publication date Jun 19, 2014
- Ting Zhou
- G11 - INFORMATION STORAGE
Information Patent Application
Leaky, thermally conductive insulator material (LTCIM) in semicondu...
- Publication number 20020185685
- Publication date Dec 12, 2002
- Dong-Hyuk Ju
- H01 - BASIC ELECTRIC ELEMENTS

Concetta Riccobene

Person

Patents Grantslast 30 patents

Semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active l...

Leaky, thermally conductive insulator material (LTCIM) in semicondu...

Asymmetric retrograde halo metal-oxide-semiconductor field-effect t...

Selective epitaxy to reduce gate/gate dielectric interface roughness

SOI device with body recombination region, and method

Raised S/D region for optimal silicidation to control floating body...

Removal of heat from SOI device

Silicon-on-insulator transistors with asymmetric source/drain junct...

Method for measuring source and drain junction depth in silicon on...

Method of fabrication of semiconductor-on-insulator (SOI) wafer hav...

Optimized single side pocket implant location for a field effect tr...

Dual silicide process to reduce gate resistance

Formation of structure to accurately measure source/drain resistance

Method for manufacturing asymmetric channel transistor

Semiconductor device with a modulated gate oxide thickness

Patents Applicationslast 30 patents

INTEGRATED METROLOGY AND PROCESS TOOL TO ENABLE LOCAL STRESS/OVERLA...

Enhancing Memory Yield Through Memory Subsystem Repair

Leaky, thermally conductive insulator material (LTCIM) in semicondu...