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Craig E. Uhrich
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Redwood City, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Imaging systems with movable scan mirrors
Patent number
9,917,990
Issue date
Mar 13, 2018
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Grant
Imaging systems with movable scan mirrors
Patent number
9,628,676
Issue date
Apr 18, 2017
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Grant
Techniques for scanned illumination
Patent number
9,488,823
Issue date
Nov 8, 2016
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Grant
Method for imaging high density biochemical arrays with sub-pixel a...
Patent number
9,285,578
Issue date
Mar 15, 2016
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for imaging high density biochemical arrays with...
Patent number
8,965,196
Issue date
Feb 24, 2015
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for imaging high density biochemical arrays with...
Patent number
8,660,421
Issue date
Feb 25, 2014
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for imaging high density biochemical arrays with...
Patent number
8,428,454
Issue date
Apr 23, 2013
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for imaging high density biochemical arrays with...
Patent number
8,175,452
Issue date
May 8, 2012
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Calibration and alignment of X-ray reflectometric systems
Patent number
6,987,832
Issue date
Jan 17, 2006
KLA-Tencor Technologies Corp.
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Grant
Refractive focusing element for spectroscopic ellipsometry
Patent number
6,940,596
Issue date
Sep 6, 2005
Therma-Wave, Inc.
Craig Uhrich
G01 - MEASURING TESTING
Information
Patent Grant
Thin film optical measurement system and method with calibrating el...
Patent number
6,934,025
Issue date
Aug 23, 2005
Therma-Wave, Inc.
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Grant
Sample positioning system to improve edge measurements
Patent number
6,885,019
Issue date
Apr 26, 2005
Therma-Wave, Inc.
Jeffrey T. Fanton
G01 - MEASURING TESTING
Information
Patent Grant
Small spot spectroscopic ellipsometer with refractive focusing
Patent number
6,829,049
Issue date
Dec 7, 2004
Therma-Wave, Inc.
Craig Uhrich
G01 - MEASURING TESTING
Information
Patent Grant
Calibration and alignment of X-ray reflectometric systems
Patent number
6,768,785
Issue date
Jul 27, 2004
Therma-Wave, Inc.
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Grant
Thin film optical measurement system and method with calibrating el...
Patent number
6,753,962
Issue date
Jun 22, 2004
Therma-Wave, Inc.
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectance measurement system with adjustable resolution
Patent number
6,744,850
Issue date
Jun 1, 2004
Therma-Wave, Inc.
Jeffrey T. Fanton
G01 - MEASURING TESTING
Information
Patent Grant
Stage rotation system to improve edge measurements
Patent number
6,707,056
Issue date
Mar 16, 2004
Therma-Wave, Inc.
Jeffrey T. Fanton
G01 - MEASURING TESTING
Information
Patent Grant
Calibration and alignment of X-ray reflectometric systems
Patent number
6,643,354
Issue date
Nov 4, 2003
Therma-Wave, Inc.
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Grant
Thin film optical measurement system and method with calibrating el...
Patent number
6,515,746
Issue date
Feb 4, 2003
Therma-Wave, Inc.
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Grant
Calibration and alignment of X-ray reflectometric systems
Patent number
6,453,006
Issue date
Sep 17, 2002
Therma-Wave, Inc.
Louis N. Koppel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGING SYSTEMS WITH MOVABLE SCAN MIRRORS
Publication number
20170289412
Publication date
Oct 5, 2017
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
TECHNIQUES FOR SCANNED ILLUMINATION
Publication number
20170013220
Publication date
Jan 12, 2017
Complete Genomics, Inc.
Bryan P. Staker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH SUB-PIXEL A...
Publication number
20150160451
Publication date
Jun 11, 2015
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH...
Publication number
20140232845
Publication date
Aug 21, 2014
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
TECHNIQUES FOR SCANNED ILLUMINATION
Publication number
20140152793
Publication date
Jun 5, 2014
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
IMAGING SYSTEMS WITH MOVABLE SCAN MIRRORS
Publication number
20140152888
Publication date
Jun 5, 2014
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH...
Publication number
20130222570
Publication date
Aug 29, 2013
Complete Genomics, Inc.
Bryan P. Staker
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH...
Publication number
20120200692
Publication date
Aug 9, 2012
Complete Genomics, Inc. (027752)
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND SYSTEM FOR IMAGING HIGH DENSITY BIOCHEMICAL ARRAYS WITH...
Publication number
20120099852
Publication date
Apr 26, 2012
Complete Genomics, Inc.
Bryan P. Staker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Methods for eliminating artifacts in two-dimensional optical metrology
Publication number
20070076976
Publication date
Apr 5, 2007
Craig Uhrich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Refractive focusing element for spectroscopic ellipsometry
Publication number
20050046842
Publication date
Mar 3, 2005
Craig Uhrich
G02 - OPTICS
Information
Patent Application
Calibration and alignment of X-ray reflectometric systems
Publication number
20040218717
Publication date
Nov 4, 2004
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Application
Thin film optical measurement system and method with calibrating el...
Publication number
20040207845
Publication date
Oct 21, 2004
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Application
Sample positioning system to improve edge measurements
Publication number
20040201839
Publication date
Oct 14, 2004
Jeffrey T. Fanton
G01 - MEASURING TESTING
Information
Patent Application
Calibration and alignment of X-ray reflectometric systems
Publication number
20040052330
Publication date
Mar 18, 2004
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Application
Thin film optical measurement system and method with calibrating el...
Publication number
20030123060
Publication date
Jul 3, 2003
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Application
Stage rotation system to improve edge measurements
Publication number
20020191740
Publication date
Dec 19, 2002
Jeffrey T. Fanton
G01 - MEASURING TESTING
Information
Patent Application
Thin film optical measurement system and method with calibrating el...
Publication number
20020176081
Publication date
Nov 28, 2002
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Application
Calibration and alignment of X-ray reflectometric systems
Publication number
20020110218
Publication date
Aug 15, 2002
Louis N. Koppel
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectance measurement system with adjustable resolution
Publication number
20020097837
Publication date
Jul 25, 2002
Jeffrey T. Fanton
G01 - MEASURING TESTING