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Dale A. Harrison
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Tracy, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of inferring optical parameters outside of a measurement spe...
Patent number
6,710,865
Issue date
Mar 23, 2004
n & k Technology, Inc.
Abdul Rahim Forouhi
G01 - MEASURING TESTING
Information
Patent Grant
Method of monitoring thin-film processes and metrology tool thereof
Patent number
6,594,025
Issue date
Jul 15, 2003
N&K Technology. Inc.
Abdul Rahim Forouhi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for optically determining physical parameters...
Patent number
6,392,756
Issue date
May 21, 2002
n & k Technology, Inc.
Guoguang Li
G01 - MEASURING TESTING
Information
Patent Grant
Graded anti-reflective coatings for photolithography
Patent number
6,379,014
Issue date
Apr 30, 2002
n & k Technology, Inc.
Guoguang Li
G02 - OPTICS
Information
Patent Grant
Method and apparatus for optically examining miniature patterns
Patent number
6,327,035
Issue date
Dec 4, 2001
NSH Technology, Inc.
Guoguang Li
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for optically determining physical parameters...
Patent number
6,091,485
Issue date
Jul 18, 2000
n & k Technology, Inc.
Guoguang Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method of monitoring thin-film processes and metrology tool thereof
Publication number
20030053081
Publication date
Mar 20, 2003
Abdul Rahim Forouhi
G01 - MEASURING TESTING
Information
Patent Application
Method of inferring optical parameters outside of a measurement spe...
Publication number
20020113957
Publication date
Aug 22, 2002
Abdul Rahim Forouhi
G01 - MEASURING TESTING
Information
Patent Application
Graded anti-reflective coatings for photolithography
Publication number
20020097493
Publication date
Jul 25, 2002
Guoguang Li
G02 - OPTICS