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Daniel E. Sutton
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and systems for controlling resist residue defects at gate...
Patent number
6,759,179
Issue date
Jul 6, 2004
Advanced Micro Devices, Inc.
Khoi A. Phan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for controlling resist residue defects at gate...
Patent number
6,649,525
Issue date
Nov 18, 2003
Advanced Micro Devices, Inc.
Khoi A. Phan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting ion implant induced defects
Patent number
6,524,869
Issue date
Feb 25, 2003
Advanced Micro Devices, Inc.
Michael J. Satterfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of detecting film defects using chemical exposure of photore...
Patent number
6,440,621
Issue date
Aug 27, 2002
Advanced Micro Devices, Inc.
Daniel E. Sutton
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Reduction of Charging Induced Damage in Photolithography Wet Process
Publication number
20150155162
Publication date
Jun 4, 2015
SPANSION LLC
Daniel E. SUTTON
H01 - BASIC ELECTRIC ELEMENTS