Daniel N. Maynard

Person

Craftsbury Common, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pixel sensors of multiple pixel size and methods of implant dose co...
- Patent number 8,704,325
- Issue date Apr 22, 2014
- International Business Machines Corporation
- John J. Ellis-Monaghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor pixel structure employing a shared floating diffusion
- Patent number 8,405,751
- Issue date Mar 26, 2013
- International Business Machines Corporation
- Jason D. Hibbeler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pixel sensors of multiple pixel size and methods of implant dose co...
- Patent number 8,334,195
- Issue date Dec 18, 2012
- International Business Machines Corporation
- John J. Ellis-Monaghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 8,201,132
- Issue date Jun 12, 2012
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and computer program product for semiconductor yield esti...
- Patent number 8,136,066
- Issue date Mar 13, 2012
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optical sensor including stacked photodiodes
- Patent number 7,893,468
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical sensor including stacked photosensitive diodes
- Patent number 7,883,916
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC layout optimization to improve yield
- Patent number 7,818,694
- Issue date Oct 19, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus, and computer program product for displaying and...
- Patent number 7,752,589
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for analyzing an integrated circuit based on samp...
- Patent number 7,752,580
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Sarah C. Braasch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC design modeling allowing dimension-dependent rule checking
- Patent number 7,703,061
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing pattern sensitive algorithms for semiconductor design
- Patent number 7,685,544
- Issue date Mar 23, 2010
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Content based yield prediction of VLSI designs
- Patent number 7,661,081
- Issue date Feb 9, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design characterization system
- Patent number 7,584,077
- Issue date Sep 1, 2009
- International Business Machines Corporation
- Betty L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC design modeling allowing dimension-dependent rule checking
- Patent number 7,577,927
- Issue date Aug 18, 2009
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC design modeling allowing dimension-dependent rule checking
- Patent number 7,555,735
- Issue date Jun 30, 2009
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,552,417
- Issue date Jun 23, 2009
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC layout optimization to improve yield
- Patent number 7,503,020
- Issue date Mar 10, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,415,695
- Issue date Aug 19, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC design modeling allowing dimension-dependent rule checking
- Patent number 7,404,164
- Issue date Jul 22, 2008
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
method for generating a set of test patterns for an optical proximi...
- Patent number 7,404,174
- Issue date Jul 22, 2008
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Yield optimization in router for systematic defects
- Patent number 7,398,485
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Content based yield prediction of VLSI designs
- Patent number 7,389,480
- Issue date Jun 17, 2008
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 7,353,472
- Issue date Apr 1, 2008
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,284,230
- Issue date Oct 16, 2007
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for improving integrated circuit manufacturing pr...
- Patent number 7,076,749
- Issue date Jul 11, 2006
- International Business Machines Corporation
- Douglas W. Kemerer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design characterization system
- Patent number 6,823,496
- Issue date Nov 23, 2004
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for prediction random defect yields of integrated circuits w...
- Patent number 6,738,954
- Issue date May 18, 2004
- International Business Machines Corporation
- Archibald J. Allen
- G01 - MEASURING TESTING
Information Patent Grant
Trench isolation for active areas and first level conductors
- Patent number 6,394,638
- Issue date May 28, 2002
- International Business Machines Corporation
- Edward W. Sengle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of trench isolation for active areas and first level cond...
- Patent number 6,063,687
- Issue date May 16, 2000
- International Business Machines Corporation
- Edward W. Sengle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PIXEL SENSORS OF MULTIPLE PIXEL SIZE AND METHODS OF IMPLANT DOSE CO...
- Publication number 20130001732
- Publication date Jan 3, 2013
- International Business Machines Corporation
- John J. ELLIS-MONAGHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SENSOR INCLUDING STACKED PHOTODIODES
- Publication number 20110072409
- Publication date Mar 24, 2011
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL SENSORS OF MULTIPLE PIXEL SIZE AND METHODS OF IMPLANT DOSE CO...
- Publication number 20110057282
- Publication date Mar 10, 2011
- International Business Machines Corporation
- John J. ELLIS-MONAGHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR PIXEL STRUCTURE EMPLOYING A SHARED FLOATING DIFFUSION
- Publication number 20110025892
- Publication date Feb 3, 2011
- International Business Machines Corporation
- Jason D. Hibbeler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...
- Publication number 20100095254
- Publication date Apr 15, 2010
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical Sensor Including Stacked Photodiodes
- Publication number 20090294813
- Publication date Dec 3, 2009
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Sensor Including Stacked Photosensitive Diodes
- Publication number 20090294812
- Publication date Dec 3, 2009
- International Business Machines Corporation
- Jeffrey P. Gambino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND COMPUTER PROGRAM PRODUCT FOR SEMICONDUCTOR YIELD ESTI...
- Publication number 20090113364
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC Layout Optimization to Improve Yield
- Publication number 20090100386
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING
- Publication number 20090031265
- Publication date Jan 29, 2009
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ANALYZING AN INTEGRATED CIRCUIT BASED ON SAMP...
- Publication number 20090031263
- Publication date Jan 29, 2009
- Sarah C. Braasch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING
- Publication number 20090031266
- Publication date Jan 29, 2009
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEATURE EXTRACTION THAT SUPPORTS PROGRESSIVELY REFINED SEARCH AND C...
- Publication number 20080320421
- Publication date Dec 25, 2008
- David L. Demaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...
- Publication number 20080247633
- Publication date Oct 9, 2008
- David L DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20080232675
- Publication date Sep 25, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTENT BASED YIELD PREDICTION OF VLSI DESIGNS
- Publication number 20080195989
- Publication date Aug 14, 2008
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DISPLAYING AND...
- Publication number 20080168414
- Publication date Jul 10, 2008
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN
- Publication number 20080104555
- Publication date May 1, 2008
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING
- Publication number 20080059929
- Publication date Mar 6, 2008
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC Layout Optimization To Improve Yield
- Publication number 20070294648
- Publication date Dec 20, 2007
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
YIELD OPTIMIZATION IN ROUTER FOR SYSTEMATIC DEFECTS
- Publication number 20070240090
- Publication date Oct 11, 2007
- Jeanne P Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20070211933
- Publication date Sep 13, 2007
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for testing pattern sensitive algorithms for semi...
- Publication number 20070038970
- Publication date Feb 15, 2007
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTENT BASED YIELD PREDICTION OF VLSI DESIGNS
- Publication number 20060253806
- Publication date Nov 9, 2006
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...
- Publication number 20060023932
- Publication date Feb 2, 2006
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING INTEGRATED CIRCUIT MANUFACTURING PR...
- Publication number 20050278663
- Publication date Dec 15, 2005
- International Business Machines Corporation
- Douglas W. Kemerer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC design modeling allowing dimension-dependent rule checking
- Publication number 20050172247
- Publication date Aug 4, 2005
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20050094863
- Publication date May 5, 2005
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DESIGN CHARACTERIZATION SYSTEM
- Publication number 20040221250
- Publication date Nov 4, 2004
- International Business Machines Corporation
- Betty L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Physical design characterization system
- Publication number 20030200513
- Publication date Oct 23, 2003
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING

Daniel N. Maynard

Person

Patents Grantslast 30 patents

Pixel sensors of multiple pixel size and methods of implant dose co...

Image sensor pixel structure employing a shared floating diffusion

Pixel sensors of multiple pixel size and methods of implant dose co...

System and method for testing pattern sensitive algorithms for semi...

Apparatus and computer program product for semiconductor yield esti...

Optical sensor including stacked photodiodes

Optical sensor including stacked photosensitive diodes

IC layout optimization to improve yield

Method, apparatus, and computer program product for displaying and...

Method and system for analyzing an integrated circuit based on samp...

IC design modeling allowing dimension-dependent rule checking

Testing pattern sensitive algorithms for semiconductor design

Content based yield prediction of VLSI designs

Physical design characterization system

IC design modeling allowing dimension-dependent rule checking

IC design modeling allowing dimension-dependent rule checking

System for search and analysis of systematic defects in integrated...

IC layout optimization to improve yield

System for search and analysis of systematic defects in integrated...

IC design modeling allowing dimension-dependent rule checking

method for generating a set of test patterns for an optical proximi...

Yield optimization in router for systematic defects

Content based yield prediction of VLSI designs

System and method for testing pattern sensitive algorithms for semi...

System for search and analysis of systematic defects in integrated...

Method and system for improving integrated circuit manufacturing pr...

Physical design characterization system

Method for prediction random defect yields of integrated circuits w...

Trench isolation for active areas and first level conductors

Formation of trench isolation for active areas and first level cond...

Patents Applicationslast 30 patents

PIXEL SENSORS OF MULTIPLE PIXEL SIZE AND METHODS OF IMPLANT DOSE CO...

OPTICAL SENSOR INCLUDING STACKED PHOTODIODES

PIXEL SENSORS OF MULTIPLE PIXEL SIZE AND METHODS OF IMPLANT DOSE CO...

IMAGE SENSOR PIXEL STRUCTURE EMPLOYING A SHARED FLOATING DIFFUSION

SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...

Optical Sensor Including Stacked Photodiodes

Optical Sensor Including Stacked Photosensitive Diodes

APPARATUS AND COMPUTER PROGRAM PRODUCT FOR SEMICONDUCTOR YIELD ESTI...

IC Layout Optimization to Improve Yield

IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING

METHOD AND SYSTEM FOR ANALYZING AN INTEGRATED CIRCUIT BASED ON SAMP...

IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING

FEATURE EXTRACTION THAT SUPPORTS PROGRESSIVELY REFINED SEARCH AND C...

SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

CONTENT BASED YIELD PREDICTION OF VLSI DESIGNS

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DISPLAYING AND...

TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN

IC DESIGN MODELING ALLOWING DIMENSION-DEPENDENT RULE CHECKING

IC Layout Optimization To Improve Yield

YIELD OPTIMIZATION IN ROUTER FOR SYSTEMATIC DEFECTS

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

System and method for testing pattern sensitive algorithms for semi...

CONTENT BASED YIELD PREDICTION OF VLSI DESIGNS

SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...

METHOD AND SYSTEM FOR IMPROVING INTEGRATED CIRCUIT MANUFACTURING PR...

IC design modeling allowing dimension-dependent rule checking

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

PHYSICAL DESIGN CHARACTERIZATION SYSTEM

Physical design characterization system