Daniel N. Tang

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
MEMS sample holder, packaged product thereof, and apparatus of char...
- Patent number 11,854,762
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as scanning electron micros...
- Patent number 11,664,189
- Issue date May 30, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Grant
Apparatus of electron beam comprising pinnacle limiting plate and m...
- Patent number 11,664,186
- Issue date May 30, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid and automatic virus imaging and analysis system as well as me...
- Patent number 11,593,938
- Issue date Feb 28, 2023
- BORRIRS PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,569,059
- Issue date Jan 31, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Grant
Stage driving system and apparatus or device such as apparatus of c...
- Patent number 11,355,312
- Issue date Jun 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital detector, apparatus of charged-particle beam such as electr...
- Patent number 11,328,898
- Issue date May 10, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,295,927
- Issue date Apr 5, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode assembly, electronic apparatus/device using the same, and...
- Patent number 11,257,659
- Issue date Feb 22, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,094,499
- Issue date Aug 17, 2021
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming punch-through stopper regions in finFET devices
- Patent number 9,450,078
- Issue date Sep 20, 2016
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement source/drain finFET fabrication
- Patent number 9,209,278
- Issue date Dec 8, 2015
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Doping a non-planar semiconductor device
- Patent number 9,159,810
- Issue date Oct 13, 2015
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma doping a non-planar semiconductor device
- Patent number 9,006,065
- Issue date Apr 14, 2015
- Advanced Ion Beam Technology, Inc.
- Tzu-Shih Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement source/drain finFET fabrication
- Patent number 8,871,584
- Issue date Oct 28, 2014
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement source/drain finFET fabrication
- Patent number 8,685,825
- Issue date Apr 1, 2014
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device with less leakage c...
- Patent number 8,211,784
- Issue date Jul 3, 2012
- Advanced Ion Beam Technology, Inc.
- Jason Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming memristor material and electrode structure with...
- Patent number 7,846,807
- Issue date Dec 7, 2010
- Hermes-Epitek Corp.
- Daniel Tang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Self-aligned contact process in semiconductor fabrication and devic...
- Patent number 6,194,784
- Issue date Feb 27, 2001
- Intel Corporation
- Krishna K. Parat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned contact process in semiconductor fabrication
- Patent number 5,731,242
- Issue date Mar 24, 1998
- Intel Corporation
- Krishna K. Parat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation between diffusion lines in a memory array
- Patent number 5,466,624
- Issue date Nov 14, 1995
- Intel Corporation
- Tong-Chern Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing hot-electron degradation in semiconductor devices
- Patent number 5,229,311
- Issue date Jul 20, 1993
- Intel Corporation
- Stefan K. Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making electrically erasable and electrically programmabl...
- Patent number 5,190,887
- Issue date Mar 2, 1993
- Intel Corporation
- Daniel N. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for self aligning a source region with a field oxide region...
- Patent number 5,120,671
- Issue date Jun 9, 1992
- Intel Corporation
- Daniel N. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned source process and apparatus
- Patent number 5,103,274
- Issue date Apr 7, 1992
- Intel Corporation
- Daniel N. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High quality oxide on an ion implanted polysilicon surface
- Patent number 4,818,711
- Issue date Apr 4, 1989
- Intel Corporation
- Himanshu Choksi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field enhanced tunnel oxide on treated substrates
- Patent number 4,806,202
- Issue date Feb 21, 1989
- Intel Corporation
- Daniel N. Tang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20240362778
- Publication date Oct 31, 2024
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20230170178
- Publication date Jun 1, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS SCANNING ELECTRON MICROS...
- Publication number 20220262596
- Publication date Aug 18, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...
- Publication number 20220115204
- Publication date Apr 14, 2022
- Zhongwei Chen
- B08 - CLEANING
Information Patent Application
NOVEL STAGE DRIVING SYSTEM AND APPARATUS OR DEVICE SUCH AS APPARATU...
- Publication number 20220108869
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20220108443
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...
- Publication number 20220108865
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL DETECTOR, APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTR...
- Publication number 20220108867
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMING PUNCH-THROUGH STOPPER REGIONS IN FINFET DEVICES
- Publication number 20160293734
- Publication date Oct 6, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA-BASED MATERIAL MODIFICATION WITH NEUTRAL BEAM
- Publication number 20160233047
- Publication date Aug 11, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT SOURCE/DRAIN FINFET FABRICATION
- Publication number 20150031181
- Publication date Jan 29, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT SOURCE/DRAIN FINFET FABRICATION
- Publication number 20140175568
- Publication date Jun 26, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA DOPING A NON-PLANAR SEMICONDUCTOR DEVICE
- Publication number 20140097487
- Publication date Apr 10, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Tzu-Shih YEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOPING A NON-PLANAR SEMICONDUCTOR DEVICE
- Publication number 20140054679
- Publication date Feb 27, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT SOURCE/DRAIN FINFET FABRICATION
- Publication number 20130187207
- Publication date Jul 25, 2013
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT SOURCE/DRAIN FINFET FABRICATION
- Publication number 20130026539
- Publication date Jan 31, 2013
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20110095339
- Publication date Apr 28, 2011
- Jason Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING MEMRISTOR MATERIAL AND ELECTRODE STRUCTURE WITH...
- Publication number 20090317958
- Publication date Dec 24, 2009
- Daniel TANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Ion implantation cooling system
- Publication number 20060163490
- Publication date Jul 27, 2006
- Advanced Ion Beam Technology Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of treating wafers with photoresist to perform metrology ana...
- Publication number 20050019697
- Publication date Jan 27, 2005
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Daniel N. Tang

Person

Patents Grantslast 30 patents

MEMS sample holder, packaged product thereof, and apparatus of char...

Backscattered electron detector, apparatus of charged-particle beam...

Apparatus of charged-particle beam such as scanning electron micros...

Apparatus of electron beam comprising pinnacle limiting plate and m...

Rapid and automatic virus imaging and analysis system as well as me...

Apparatus of charged-particle beam such as electron microscope comp...

Stage driving system and apparatus or device such as apparatus of c...

Digital detector, apparatus of charged-particle beam such as electr...

Apparatus of charged-particle beam such as electron microscope comp...

Electrode assembly, electronic apparatus/device using the same, and...

Apparatus of charged-particle beam such as electron microscope comp...

Forming punch-through stopper regions in finFET devices

Replacement source/drain finFET fabrication

Doping a non-planar semiconductor device

Plasma doping a non-planar semiconductor device

Replacement source/drain finFET fabrication

Replacement source/drain finFET fabrication

Method for manufacturing a semiconductor device with less leakage c...

Method for forming memristor material and electrode structure with...

Self-aligned contact process in semiconductor fabrication and devic...

Self-aligned contact process in semiconductor fabrication

Isolation between diffusion lines in a memory array

Method of reducing hot-electron degradation in semiconductor devices

Method of making electrically erasable and electrically programmabl...

Process for self aligning a source region with a field oxide region...

Self-aligned source process and apparatus

High quality oxide on an ion implanted polysilicon surface

Field enhanced tunnel oxide on treated substrates

Patents Applicationslast 30 patents

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS SCANNING ELECTRON MICROS...

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...

NOVEL STAGE DRIVING SYSTEM AND APPARATUS OR DEVICE SUCH AS APPARATU...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...

DIGITAL DETECTOR, APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTR...

FORMING PUNCH-THROUGH STOPPER REGIONS IN FINFET DEVICES

PLASMA-BASED MATERIAL MODIFICATION WITH NEUTRAL BEAM

REPLACEMENT SOURCE/DRAIN FINFET FABRICATION

REPLACEMENT SOURCE/DRAIN FINFET FABRICATION

PLASMA DOPING A NON-PLANAR SEMICONDUCTOR DEVICE

DOPING A NON-PLANAR SEMICONDUCTOR DEVICE

REPLACEMENT SOURCE/DRAIN FINFET FABRICATION

REPLACEMENT SOURCE/DRAIN FINFET FABRICATION

Semiconductor device and method for manufacturing the same

METHOD FOR FORMING MEMRISTOR MATERIAL AND ELECTRODE STRUCTURE WITH...

Ion implantation cooling system

Method of treating wafers with photoresist to perform metrology ana...