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David M. Kranz
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Minneapolis, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dark field illuminator with large working area
Patent number
8,894,259
Issue date
Nov 25, 2014
CyberOptics Corporation
Carl E. Haugan
G02 - OPTICS
Information
Patent Grant
High speed optical inspection system with camera array and compact,...
Patent number
8,670,031
Issue date
Mar 11, 2014
CyberOptics Corporation
Steven K. Case
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring center of rotation of a nozzle of a pick and p...
Patent number
7,746,481
Issue date
Jun 29, 2010
CyberOptics Corporation
David M. Kranz
G01 - MEASURING TESTING
Information
Patent Grant
Multiple source alignment sensor with improved optics
Patent number
6,909,515
Issue date
Jun 21, 2005
CyberOptics Corporation
David D. Madsen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Solder paste inspection system
Patent number
6,750,899
Issue date
Jun 15, 2004
CyberOptics Corporation
David Fishbaine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated system with improved height sensing
Patent number
6,678,062
Issue date
Jan 13, 2004
CyberOptics Corporation
Paul R. Haugen
G01 - MEASURING TESTING
Information
Patent Grant
Phase profilometry system with telecentric projector
Patent number
6,577,405
Issue date
Jun 10, 2003
CyberOptics Corporation
David M. Kranz
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for three dimensional imaging using multi-phas...
Patent number
6,049,384
Issue date
Apr 11, 2000
CyberOptics Corporation
Eric P. Rudd
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH SPEED OPTICAL INSPECTION SYSTEM WITH CAMERA ARRAY AND COMPACT,...
Publication number
20110069878
Publication date
Mar 24, 2011
Steven K. Case
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DARK FIELD ILLUMINATOR WITH LARGE WORKING AREA
Publication number
20110069507
Publication date
Mar 24, 2011
Carl E. Haugan
G02 - OPTICS
Information
Patent Application
Method for Measuring Center of Rotation of a Nozzle of a Pick and P...
Publication number
20080231864
Publication date
Sep 25, 2008
David M. Kranz
G01 - MEASURING TESTING
Information
Patent Application
Multiple source alignment sensor with improved optics
Publication number
20040119987
Publication date
Jun 24, 2004
David D. Madsen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Automated system with improved height sensing
Publication number
20020078580
Publication date
Jun 27, 2002
Paul R. Haugen
G01 - MEASURING TESTING
Information
Patent Application
Phase profilometry system with telecentric projector
Publication number
20010033386
Publication date
Oct 25, 2001
David M. Kranz
G01 - MEASURING TESTING