David Maxwell Gage

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Technique for training neural network for use in in-situ monitoring...
- Patent number 12,136,574
- Issue date Nov 5, 2024
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Grant
Trained neural network in in-situ monitoring during polishing and p...
- Patent number 12,057,354
- Issue date Aug 6, 2024
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Grant
Methods and apparatus for forming dual metal interconnects
- Patent number 11,948,885
- Issue date Apr 2, 2024
- Applied Materials, Inc.
- Suketu A Parikh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Profile control with multiple instances of contol algorithm during...
- Patent number 11,865,664
- Issue date Jan 9, 2024
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Grant
Switching control algorithms on detection of exposure of underlying...
- Patent number 11,850,699
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical mechanical polishing with applied magnetic field
- Patent number 11,787,008
- Issue date Oct 17, 2023
- Applied Materials, Inc.
- Xingfeng Wang
- B24 - GRINDING POLISHING
Information Patent Grant
Technique for training neural network for use in in-situ monitoring...
- Patent number 11,791,224
- Issue date Oct 17, 2023
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compensation for substrate doping for in-situ electromagnetic induc...
- Patent number 11,780,045
- Issue date Oct 10, 2023
- Applied Materials, Inc.
- Wei Lu
- B24 - GRINDING POLISHING
Information Patent Grant
Using a trained neural network for use in in-situ monitoring during...
- Patent number 11,658,078
- Issue date May 23, 2023
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for forming dual metal interconnects
- Patent number 11,075,165
- Issue date Jul 27, 2021
- Applied Materials, Inc.
- Suketu A Parikh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overpolishing based on electromagnetic inductive monitoring of tren...
- Patent number 10,350,723
- Issue date Jul 16, 2019
- Applied Materials, Inc.
- Shih-Haur Shen
- B24 - GRINDING POLISHING
Information Patent Grant
Feedback control of polishing using optical detection of clearance
- Patent number 9,073,169
- Issue date Jul 7, 2015
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING THE ORIENTATION OF A SUBSTRATE IN-SITU
- Publication number 20240359291
- Publication date Oct 31, 2024
- Applied Materials, Inc.
- Wei LU
- B24 - GRINDING POLISHING
Information Patent Application
Layered Substrate with Ruthenium Layer and Method for Producing
- Publication number 20240282709
- Publication date Aug 22, 2024
- Zhaoxuan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING CONTROL ALGORITHMS ON DETECTION OF EXPOSURE OF UNDERLYING...
- Publication number 20240116152
- Publication date Apr 11, 2024
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Application
TECHNIQUE FOR TRAINING NEURAL NETWORK FOR USE IN IN-SITU MONITORING...
- Publication number 20240014080
- Publication date Jan 11, 2024
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINED NEURAL NETWORK IN IN-SITU MONITORING DURING POLISHING AND P...
- Publication number 20230290691
- Publication date Sep 14, 2023
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL MECHANICAL POLISHING WITH APPLIED MAGNETIC FIELD
- Publication number 20220193859
- Publication date Jun 23, 2022
- Applied Materials, Inc.
- Xingfeng WANG
- B24 - GRINDING POLISHING
Information Patent Application
PROFILE CONTROL WITH MULTIPLE INSTANCES OF CONTOL ALGORITHM DURING...
- Publication number 20210379722
- Publication date Dec 9, 2021
- Applied Materials, Inc.
- Kun Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROFILE CONTROL DURING POLISHING OF A STACK OF ADJACENT CONDUCTIVE...
- Publication number 20210379721
- Publication date Dec 9, 2021
- Applied Materials, Inc.
- Kun Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING CONTROL ALGORITHMS ON DETECTION OF EXPOSURE OF UNDERLYING...
- Publication number 20210379724
- Publication date Dec 9, 2021
- Applied Materials, Inc.
- Kun Xu
- B24 - GRINDING POLISHING
Information Patent Application
COMPENSATION FOR SUBSTRATE DOPING IN EDGE RECONSTRUCTION FOR IN-SIT...
- Publication number 20210379723
- Publication date Dec 9, 2021
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING A TRAINED NEURAL NETWORK FOR USE IN IN-SITU MONITORING DURING...
- Publication number 20210358819
- Publication date Nov 18, 2021
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR TRAINING NEURAL NETWORK FOR USE IN IN-SITU MONITORING...
- Publication number 20210354265
- Publication date Nov 18, 2021
- Applied Materials, Inc.
- Kun Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR FORMING DUAL METAL INTERCONNECTS
- Publication number 20210320064
- Publication date Oct 14, 2021
- Applied Materials, Inc.
- SUKETU A. PARIKH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR FORMING DUAL METAL INTERCONNECTS
- Publication number 20210020569
- Publication date Jan 21, 2021
- Applied Materials, Inc.
- SUKETU A. PARIKH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPENSATION FOR SUBSTRATE DOPING FOR IN-SITU ELECTROMAGNETIC INDUC...
- Publication number 20190389028
- Publication date Dec 26, 2019
- Wei Lu
- B24 - GRINDING POLISHING
Information Patent Application
OVERPOLISHING BASED ON ELECTROMAGNETIC INDUCTIVE MONITORING OF TREN...
- Publication number 20180079048
- Publication date Mar 22, 2018
- Applied Materials, Inc.
- Shih-Haur Shen
- B24 - GRINDING POLISHING
Information Patent Application
CHEMICAL MECHANICAL POLISHING METHODS AND SYSTEMS INCLUDING PRE-TRE...
- Publication number 20140308814
- Publication date Oct 16, 2014
- Applied Materials, Inc.
- David Maxwell Gage
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
CHEMICAL MECHANICAL POLISHING PROCESS AND SLURRY CONTAINING SILICON...
- Publication number 20140199842
- Publication date Jul 17, 2014
- Vishwas V. Hardikar
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
EDDY CURRENT MONITORING OF METAL RESIDUE OR METAL PILLARS
- Publication number 20120276817
- Publication date Nov 1, 2012
- Hassan G. Iravani
- B24 - GRINDING POLISHING
Information Patent Application
EDDY CURRENT MONITORING OF METAL FEATURES
- Publication number 20120276662
- Publication date Nov 1, 2012
- Hassan G. Iravani
- B24 - GRINDING POLISHING
Information Patent Application
Feedback Control of Polishing Using Optical Detection of Clearance
- Publication number 20120064801
- Publication date Mar 15, 2012
- Kun Xu
- B24 - GRINDING POLISHING

David Maxwell Gage

Person

Patents Grantslast 30 patents

Technique for training neural network for use in in-situ monitoring...

Trained neural network in in-situ monitoring during polishing and p...

Methods and apparatus for forming dual metal interconnects

Profile control with multiple instances of contol algorithm during...

Switching control algorithms on detection of exposure of underlying...

Chemical mechanical polishing with applied magnetic field

Technique for training neural network for use in in-situ monitoring...

Compensation for substrate doping for in-situ electromagnetic induc...

Using a trained neural network for use in in-situ monitoring during...

Methods and apparatus for forming dual metal interconnects

Overpolishing based on electromagnetic inductive monitoring of tren...

Feedback control of polishing using optical detection of clearance

Patents Applicationslast 30 patents

DETERMINING THE ORIENTATION OF A SUBSTRATE IN-SITU

Layered Substrate with Ruthenium Layer and Method for Producing

SWITCHING CONTROL ALGORITHMS ON DETECTION OF EXPOSURE OF UNDERLYING...

TECHNIQUE FOR TRAINING NEURAL NETWORK FOR USE IN IN-SITU MONITORING...

TRAINED NEURAL NETWORK IN IN-SITU MONITORING DURING POLISHING AND P...

CHEMICAL MECHANICAL POLISHING WITH APPLIED MAGNETIC FIELD

PROFILE CONTROL WITH MULTIPLE INSTANCES OF CONTOL ALGORITHM DURING...

PROFILE CONTROL DURING POLISHING OF A STACK OF ADJACENT CONDUCTIVE...

SWITCHING CONTROL ALGORITHMS ON DETECTION OF EXPOSURE OF UNDERLYING...

COMPENSATION FOR SUBSTRATE DOPING IN EDGE RECONSTRUCTION FOR IN-SIT...

USING A TRAINED NEURAL NETWORK FOR USE IN IN-SITU MONITORING DURING...

TECHNIQUE FOR TRAINING NEURAL NETWORK FOR USE IN IN-SITU MONITORING...

METHODS AND APPARATUS FOR FORMING DUAL METAL INTERCONNECTS

METHODS AND APPARATUS FOR FORMING DUAL METAL INTERCONNECTS

COMPENSATION FOR SUBSTRATE DOPING FOR IN-SITU ELECTROMAGNETIC INDUC...

OVERPOLISHING BASED ON ELECTROMAGNETIC INDUCTIVE MONITORING OF TREN...

CHEMICAL MECHANICAL POLISHING METHODS AND SYSTEMS INCLUDING PRE-TRE...

CHEMICAL MECHANICAL POLISHING PROCESS AND SLURRY CONTAINING SILICON...

EDDY CURRENT MONITORING OF METAL RESIDUE OR METAL PILLARS

EDDY CURRENT MONITORING OF METAL FEATURES

Feedback Control of Polishing Using Optical Detection of Clearance