David R. Cuthbert

Person

Meridian, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
CMOS amplifiers with frequency compensating capacitors
- Patent number 7,705,677
- Issue date Apr 27, 2010
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time delay oscillator for integrated circuits
- Patent number 7,629,858
- Issue date Dec 8, 2009
- Micron Technology, Inc.
- Leonard Forbes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique to improve the gain and signal to noise ratio in CMOS swi...
- Patent number 7,498,875
- Issue date Mar 3, 2009
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sample and hold memory sense amplifier
- Patent number 7,453,751
- Issue date Nov 18, 2008
- Micron Technology, Inc.
- Leonard Forbes
- G11 - INFORMATION STORAGE
Information Patent Grant
CMOS amplifiers with frequency compensating capacitors
- Patent number 7,417,505
- Issue date Aug 26, 2008
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Technique to improve the gain and signal to noise ratio in CMOS swi...
- Patent number 7,339,423
- Issue date Mar 4, 2008
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
CMOS amplifiers with frequency compensating capacitors
- Patent number 7,339,431
- Issue date Mar 4, 2008
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time delay oscillator for integrated circuits
- Patent number 7,295,081
- Issue date Nov 13, 2007
- Micron Technology, Inc.
- Leonard Forbes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 7,294,790
- Issue date Nov 13, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit characterization printed circuit board, test equ...
- Patent number 7,271,581
- Issue date Sep 18, 2007
- Micron Technology, Inc.
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring parasitic capacitance and inductance of I/O l...
- Patent number 7,239,152
- Issue date Jul 3, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Sample and hold memory sense amplifier
- Patent number 7,236,415
- Issue date Jun 26, 2007
- Micron Technology, Inc.
- Leonard Forbes
- G11 - INFORMATION STORAGE
Information Patent Grant
Technique to improve the gain and signal to noise ratio in CMOS swi...
- Patent number 7,230,479
- Issue date Jun 12, 2007
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 7,212,013
- Issue date May 1, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 7,208,935
- Issue date Apr 24, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring parasitic capacitance and inductance of I/O l...
- Patent number 7,208,959
- Issue date Apr 24, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
CMOS amplifiers with frequency compensating capacitors
- Patent number 7,202,739
- Issue date Apr 10, 2007
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and methods for measuring parasitic capacitance and induc...
- Patent number 7,199,593
- Issue date Apr 3, 2007
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
CMOS amplifiers with frequency compensating capacitors
- Patent number 7,180,370
- Issue date Feb 20, 2007
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 7,145,323
- Issue date Dec 5, 2006
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit characterization printed circuit board
- Patent number 7,119,563
- Issue date Oct 10, 2006
- Micron Technology, Inc.
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Grant
Low profile antenna
- Patent number 6,967,629
- Issue date Nov 22, 2005
- Micron Technology, Inc.
- David R. Cuthbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit characterization printed circuit board, test equ...
- Patent number 6,924,637
- Issue date Aug 2, 2005
- Micron Technology, Inc.
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 6,822,438
- Issue date Nov 23, 2004
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing signal timing skew on a printed c...
- Patent number 6,675,313
- Issue date Jan 6, 2004
- Micron Technology, Inc.
- David Cuthbert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Patent number 6,563,299
- Issue date May 13, 2003
- Micron Technology, Inc.
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing signal timing skew on a printed c...
- Patent number 6,526,519
- Issue date Feb 25, 2003
- Micron Technology, Inc.
- David Cuthbert
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CMOS AMPLIFIERS WITH FREQUENCY COMPENSATING CAPACITORS
- Publication number 20080297249
- Publication date Dec 4, 2008
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Time delay oscillator for integrated circuits
- Publication number 20080007359
- Publication date Jan 10, 2008
- Micron Technology, Inc.
- Leonard Forbes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE TO IMPROVE THE GAIN AND SIGNAL TO NOISE RATIO IN CMOS SWI...
- Publication number 20070290741
- Publication date Dec 20, 2007
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Technique to improve the gain and signal to noise ratio in CMOS swi...
- Publication number 20070182482
- Publication date Aug 9, 2007
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CMOS amplifiers with frequency compensating capacitors
- Publication number 20070139115
- Publication date Jun 21, 2007
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Time delay oscillator for integrated circuits
- Publication number 20070046385
- Publication date Mar 1, 2007
- Micron Technology, Inc.
- Leonard Forbes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Technique to improve the gain and signal to noise ratio in CMOS swi...
- Publication number 20070030059
- Publication date Feb 8, 2007
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CMOS amplifiers with frequency compensating capacitors
- Publication number 20060291312
- Publication date Dec 28, 2006
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for reducing noise in analog amplifier circuit...
- Publication number 20060268140
- Publication date Nov 30, 2006
- Micron Technology, Inc.
- Leonard Forbes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CMOS amplifiers with frequency compensating capacitors
- Publication number 20060261896
- Publication date Nov 23, 2006
- Micron Technology, Inc.
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Sample and hold memory sense amplifier
- Publication number 20060250871
- Publication date Nov 9, 2006
- Micron Technology, Inc.
- Leonard Forbes
- G11 - INFORMATION STORAGE
Information Patent Application
Methods for measuring parasitic capacitance and inductance of I/O l...
- Publication number 20060043987
- Publication date Mar 2, 2006
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Sample and hold memory sense amplifier
- Publication number 20060044907
- Publication date Mar 2, 2006
- Leonard Forbes
- G11 - INFORMATION STORAGE
Information Patent Application
CMOS amplifiers with frequency compensating capacitors
- Publication number 20060044066
- Publication date Mar 2, 2006
- Leonard Forbes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated circuit characterization printed circuit board
- Publication number 20050206400
- Publication date Sep 22, 2005
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Application
Low profile antenna
- Publication number 20050184917
- Publication date Aug 25, 2005
- David R. Cuthbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and methods for measuring parasitic capacitance and induc...
- Publication number 20050161801
- Publication date Jul 28, 2005
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring parasitic capacitance and induc...
- Publication number 20050161256
- Publication date Jul 28, 2005
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Integratged circuit characterization printed circuit board, test eq...
- Publication number 20050024039
- Publication date Feb 3, 2005
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Publication number 20050024068
- Publication date Feb 3, 2005
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring parasitic capacitance and induc...
- Publication number 20040231887
- Publication date Nov 25, 2004
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit characterization printed circuit board, test equ...
- Publication number 20040196025
- Publication date Oct 7, 2004
- William J. Casey
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring parasitic capacitance and induc...
- Publication number 20030132768
- Publication date Jul 17, 2003
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring parasitic capacitance and inductance of I/O...
- Publication number 20030128042
- Publication date Jul 10, 2003
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring parasitic capacitance and induc...
- Publication number 20030122565
- Publication date Jul 3, 2003
- Mark T. Van Horn
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reducing signal timing skew on a printed c...
- Publication number 20030088802
- Publication date May 8, 2003
- David Cuthbert
- G06 - COMPUTING CALCULATING COUNTING

David R. Cuthbert

Person

Patents Grantslast 30 patents

CMOS amplifiers with frequency compensating capacitors

Time delay oscillator for integrated circuits

Technique to improve the gain and signal to noise ratio in CMOS swi...

Sample and hold memory sense amplifier

CMOS amplifiers with frequency compensating capacitors

Technique to improve the gain and signal to noise ratio in CMOS swi...

CMOS amplifiers with frequency compensating capacitors

Time delay oscillator for integrated circuits

Apparatus for measuring parasitic capacitance and inductance of I/O...

Integrated circuit characterization printed circuit board, test equ...

Methods for measuring parasitic capacitance and inductance of I/O l...

Sample and hold memory sense amplifier

Technique to improve the gain and signal to noise ratio in CMOS swi...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Methods for measuring parasitic capacitance and inductance of I/O l...

CMOS amplifiers with frequency compensating capacitors

Apparatus and methods for measuring parasitic capacitance and induc...

CMOS amplifiers with frequency compensating capacitors

Apparatus for measuring parasitic capacitance and inductance of I/O...

Integrated circuit characterization printed circuit board

Low profile antenna

Integrated circuit characterization printed circuit board, test equ...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Method and apparatus for reducing signal timing skew on a printed c...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Method and apparatus for reducing signal timing skew on a printed c...

Patents Applicationslast 30 patents

CMOS AMPLIFIERS WITH FREQUENCY COMPENSATING CAPACITORS

Time delay oscillator for integrated circuits

TECHNIQUE TO IMPROVE THE GAIN AND SIGNAL TO NOISE RATIO IN CMOS SWI...

Technique to improve the gain and signal to noise ratio in CMOS swi...

CMOS amplifiers with frequency compensating capacitors

Time delay oscillator for integrated circuits

Technique to improve the gain and signal to noise ratio in CMOS swi...

CMOS amplifiers with frequency compensating capacitors

Method and apparatus for reducing noise in analog amplifier circuit...

CMOS amplifiers with frequency compensating capacitors

Sample and hold memory sense amplifier

Methods for measuring parasitic capacitance and inductance of I/O l...

Sample and hold memory sense amplifier

CMOS amplifiers with frequency compensating capacitors

Integrated circuit characterization printed circuit board

Low profile antenna

Apparatus and methods for measuring parasitic capacitance and induc...

Apparatus and methods for measuring parasitic capacitance and induc...

Integratged circuit characterization printed circuit board, test eq...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Apparatus and methods for measuring parasitic capacitance and induc...

Integrated circuit characterization printed circuit board, test equ...

Apparatus and methods for measuring parasitic capacitance and induc...

Apparatus for measuring parasitic capacitance and inductance of I/O...

Apparatus and methods for measuring parasitic capacitance and induc...

Method and apparatus for reducing signal timing skew on a printed c...