Donald A. Tiffin

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thin titanium film as self-regulating filter for silicon migration...
- Patent number 6,191,032
- Issue date Feb 20, 2001
- Advanced Micro Devices, Inc.
- Don A. Tiffin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depth profile metrology using grazing incidence X-ray fluorescence
- Patent number 6,173,036
- Issue date Jan 9, 2001
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- G01 - MEASURING TESTING
Information Patent Grant
Graded PB for C4 bump technology
- Patent number 6,144,103
- Issue date Nov 7, 2000
- Advanced Micro Devices, Inc.
- Roy Mark Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Boron implanted dielectric structure
- Patent number 6,097,079
- Issue date Aug 1, 2000
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Neutron detecting semiconductor device
- Patent number 6,075,261
- Issue date Jun 13, 2000
- Advanced Micro Devices
- Tim Z. Hossain
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the roughness of a target materi...
- Patent number 6,005,915
- Issue date Dec 21, 1999
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- G01 - MEASURING TESTING
Information Patent Grant
Graded PB for C4 pump technology
- Patent number 5,965,945
- Issue date Oct 12, 1999
- Advanced Micro Devices, Inc.
- Roy Mark Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alternative process for BPTEOS/BPSG layer formation
- Patent number 5,913,131
- Issue date Jun 15, 1999
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for characterizing particles embedded within a...
- Patent number 5,754,620
- Issue date May 19, 1998
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the elemental compositions and...
- Patent number 5,742,658
- Issue date Apr 21, 1998
- Advanced Micro Devices, Inc.
- Donald A. Tiffin
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring concentration of dopant within a semiconductor...
- Patent number 5,520,769
- Issue date May 28, 1996
- Advanced Micro Devices, Inc.
- Michael C. Barrett
- H01 - BASIC ELECTRIC ELEMENTS

Donald A. Tiffin

Person

Patents Grantslast 30 patents

Thin titanium film as self-regulating filter for silicon migration...

Depth profile metrology using grazing incidence X-ray fluorescence

Graded PB for C4 bump technology

Boron implanted dielectric structure

Neutron detecting semiconductor device

Apparatus and method for measuring the roughness of a target materi...

Graded PB for C4 pump technology

Alternative process for BPTEOS/BPSG layer formation

Apparatus and method for characterizing particles embedded within a...

Apparatus and method for determining the elemental compositions and...

Method for measuring concentration of dopant within a semiconductor...