Donald W. Sting

Person

New Canaan, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometer maintaining optical relationship between elements
- Patent number 7,630,081
- Issue date Dec 8, 2009
- SAS Photonics, LLC
- Gregg Ressler
- G01 - MEASURING TESTING
Information Patent Grant
System and method for optical analysis
- Patent number 7,582,869
- Issue date Sep 1, 2009
- SAS Photonics, LLC
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Mid-infrared spectrometer attachment to light microscopes
- Patent number 6,972,409
- Issue date Dec 6, 2005
- Smiths Detection Inc.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized opto-electronic magnifying system
- Patent number 6,907,390
- Issue date Jun 14, 2005
- Smiths Detection Inc.
- John A. Reffner
- G02 - OPTICS
Information Patent Grant
Mid-infrared spectrometer attachment to light microscopes
- Patent number 6,693,280
- Issue date Feb 17, 2004
- Sensir Technologies, L.L.C.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensing with crystal assembly sensing tip
- Patent number 5,703,366
- Issue date Dec 30, 1997
- ASI Applied Systems, L.L.C.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Optically coupled infrared transmitting composite internal reflecti...
- Patent number 5,616,922
- Issue date Apr 1, 1997
- John A. Reffner
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensing with crystal assembly sensing tip
- Patent number 5,552,604
- Issue date Sep 3, 1996
- Sting; Donald W.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Radiant energy spectroscopy system with diamond internal reflection...
- Patent number 5,200,609
- Issue date Apr 6, 1993
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Internal reflectance element with very small sample contacting surface
- Patent number 5,172,182
- Issue date Dec 15, 1992
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
ATR objective and method for sample analyzation using an ATR crystal
- Patent number 5,093,580
- Issue date Mar 3, 1992
- Spectra-Tech, Inc.
- Donald W. Sting
- G02 - OPTICS
Information Patent Grant
Optical system and method for sample analyzation
- Patent number 5,051,602
- Issue date Sep 24, 1991
- Spectra-Tech, Inc.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for sample analyzation
- Patent number 5,019,715
- Issue date May 28, 1991
- Spectra-Tech, Inc.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Sampling probe for optical analyzation of a sample
- Patent number 5,015,092
- Issue date May 14, 1991
- Spectra-Tech, Inc.
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Grant
Aperture image beam splitter
- Patent number 4,878,747
- Issue date Nov 7, 1989
- Spectra-Tech, Inc.
- Donald W. Sting
- G02 - OPTICS
Information Patent Grant
Microscope having dual remote image masking
- Patent number 4,877,960
- Issue date Oct 31, 1989
- Spectra-Tech, Inc.
- Robert G. Messerschmidt
- G02 - OPTICS
Information Patent Grant
Diffuse reflectance spectroscopy system and method
- Patent number 4,859,064
- Issue date Aug 22, 1989
- Spectra-Tech, Inc.
- Robert G. Messerschmidt
- G01 - MEASURING TESTING
Information Patent Grant
Grazing angle microscope
- Patent number 4,810,077
- Issue date Mar 7, 1989
- Spectra-Tech, Inc.
- Donald W. Sting
- G02 - OPTICS
Information Patent Grant
Blocker device for eliminating specular reflectance from a diffuse...
- Patent number 4,661,706
- Issue date Apr 28, 1987
- Spectra-Tech Inc.
- Robert G. Messerschmidt
- G01 - MEASURING TESTING
Information Patent Grant
Reflective beam splitting objective
- Patent number 4,653,880
- Issue date Mar 31, 1987
- Spectra-Tech Inc.
- Donald W. Sting
- G02 - OPTICS
Information Patent Grant
Multiple internal reflection cell optical system for use in infrare...
- Patent number 4,595,833
- Issue date Jun 17, 1986
- Donald W. Sting
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER MAINTAINING OPTICAL RELATIONSHIP BETWEEN ELEMENTS
- Publication number 20080170231
- Publication date Jul 17, 2008
- SAS PHOTONICS, LLC
- Gregg Ressler
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL ANALYSIS
- Publication number 20080017799
- Publication date Jan 24, 2008
- SAS PHOTONICS, LLC
- Donald W. Sting
- G01 - MEASURING TESTING
Information Patent Application
Mid-infrared spectrometer attachment to light microscopes
- Publication number 20040135084
- Publication date Jul 15, 2004
- Donald W. Sting
- G02 - OPTICS
Information Patent Application
Mid-infrared spectrometer attachment to light microscopes
- Publication number 20030025080
- Publication date Feb 6, 2003
- Donald W. Sting
- G01 - MEASURING TESTING

Donald W. Sting

Person

Patents Grantslast 30 patents

Interferometer maintaining optical relationship between elements

System and method for optical analysis

Mid-infrared spectrometer attachment to light microscopes

Miniaturized opto-electronic magnifying system

Mid-infrared spectrometer attachment to light microscopes

Optical sensing with crystal assembly sensing tip

Optically coupled infrared transmitting composite internal reflecti...

Optical sensing with crystal assembly sensing tip

Radiant energy spectroscopy system with diamond internal reflection...

Internal reflectance element with very small sample contacting surface

ATR objective and method for sample analyzation using an ATR crystal

Optical system and method for sample analyzation

Optical system and method for sample analyzation

Sampling probe for optical analyzation of a sample

Aperture image beam splitter

Microscope having dual remote image masking

Diffuse reflectance spectroscopy system and method

Grazing angle microscope

Blocker device for eliminating specular reflectance from a diffuse...

Reflective beam splitting objective

Multiple internal reflection cell optical system for use in infrare...

Patents Applicationslast 30 patents

INTERFEROMETER MAINTAINING OPTICAL RELATIONSHIP BETWEEN ELEMENTS

SYSTEM AND METHOD FOR OPTICAL ANALYSIS

Mid-infrared spectrometer attachment to light microscopes

Mid-infrared spectrometer attachment to light microscopes