Dureseti Chidambarrao

Person

Weston, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Device mismatch mitigation for medium range and beyond distances
- Patent number 12,218,120
- Issue date Feb 4, 2025
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exploratory data interface
- Patent number 11,960,830
- Issue date Apr 16, 2024
- International Business Machines Corporation
- Jonathan Fry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacked via rivets in chip hotspots
- Patent number 11,308,257
- Issue date Apr 19, 2022
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-mode design and operation for transistor mismatch immunity
- Patent number 11,303,285
- Issue date Apr 12, 2022
- International Business Machines Corporation
- James Strom
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuit layout similarity metric for semiconductor testsite coverage
- Patent number 10,839,133
- Issue date Nov 17, 2020
- International Business Machines Corporation
- Rasit Onur Topaloglu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing integrated circuit designs based on interactions between...
- Patent number 10,628,544
- Issue date Apr 21, 2020
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep trench floorplan distribution design methodology for semicondu...
- Patent number 10,614,190
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing integrated circuit designs based on interactions between...
- Patent number 10,592,627
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit (IC) design analysis and feature extraction
- Patent number 9,754,071
- Issue date Sep 5, 2017
- GLOBALFOUNDRIES Inc.
- Haraprasad Nanjundappa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modeling transistor performance considering non-uniform local layou...
- Patent number 9,646,124
- Issue date May 9, 2017
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical proximity correction (OPC) accounting for critical dimensio...
- Patent number 9,536,039
- Issue date Jan 3, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...
- Patent number 9,401,424
- Issue date Jul 26, 2016
- Samsung Electronics Co., Ltd.
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical proximity correction (OPC) accounting for critical dimensio...
- Patent number 9,342,648
- Issue date May 17, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correcting for stress induced pattern shifts in semiconductor manuf...
- Patent number 9,311,443
- Issue date Apr 12, 2016
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress-generating structure for semiconductor-on-insulator devices
- Patent number 9,305,999
- Issue date Apr 5, 2016
- GLOBALFOUNDRIES Inc.
- Huilong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary metal oxide semiconductor (CMOS) device having gate s...
- Patent number 9,082,877
- Issue date Jul 14, 2015
- International Business Machines Corporation
- Yue Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for mobility enhanced MOSFETs with unalloyed s...
- Patent number 9,059,316
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Yaocheng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon device on SI:C-OI and SGOI and method of manufacture
- Patent number 9,040,373
- Issue date May 26, 2015
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...
- Patent number 9,023,698
- Issue date May 5, 2015
- Samsung Electronics Co., Ltd.
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and system for analysis and management of parametric yield
- Patent number 8,997,028
- Issue date Mar 31, 2015
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Grant
Minimizing leakage current and junction capacitance in CMOS transis...
- Patent number 8,993,395
- Issue date Mar 31, 2015
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit technique to electrically characterize block mask shifts
- Patent number 8,969,104
- Issue date Mar 3, 2015
- International Business Machines Corporation
- Emrah Acar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...
- Patent number 8,901,566
- Issue date Dec 2, 2014
- International Business Machines Corporation
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon nanotube MOSFET
- Patent number 8,871,576
- Issue date Oct 28, 2014
- International Business Machines Corporation
- Daniel Tekleab
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Silicon nanotube MOSFET
- Patent number 8,866,266
- Issue date Oct 21, 2014
- International Business Machines Corporation
- Daniel Tekleab
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MOS having a sic/sige alloy stack
- Patent number 8,835,234
- Issue date Sep 16, 2014
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary metal oxide semiconductor (CMOS) device having gate s...
- Patent number 8,803,243
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Yue Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for mobility enhanced MOSFETS with unalloyed s...
- Patent number 8,642,434
- Issue date Feb 4, 2014
- International Business Machines Corporation
- Yaocheng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Asymmetric FET including sloped threshold voltage adjusting materia...
- Patent number 8,629,022
- Issue date Jan 14, 2014
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress-generating structure for semiconductor-on-insulator devices
- Patent number 8,629,501
- Issue date Jan 14, 2014
- International Business Machines Corporation
- Huilong Zhu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)
- Publication number 20250072017
- Publication date Feb 27, 2025
- International Business Machines Corporation
- ATSUSHI OGINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)
- Publication number 20250062219
- Publication date Feb 20, 2025
- International Business Machines Corporation
- ATSUSHI OGINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)
- Publication number 20250062218
- Publication date Feb 20, 2025
- International Business Machines Corporation
- ATSUSHI OGINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRENCH ISOLATION FOR BACKSIDE CONTACT FORMATION
- Publication number 20250022913
- Publication date Jan 16, 2025
- International Business Machines Corporation
- Juntao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT CIRCUIT DETECTION IN A READ/WRITE ASSIST CAPACITOR OF A MEMORY
- Publication number 20240355382
- Publication date Oct 24, 2024
- International Business Machines Corporation
- Noam Jungmann
- G11 - INFORMATION STORAGE
Information Patent Application
GATE CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20240332293
- Publication date Oct 3, 2024
- International Business Machines Corporation
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION BREAK STRUCTURE FOR TRANSISTORS
- Publication number 20240204042
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE MISMATCH MITIGATION FOR MEDIUM RANGE AND BEYOND DISTANCES
- Publication number 20220406769
- Publication date Dec 22, 2022
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXPLORATORY DATA INTERFACE
- Publication number 20210240921
- Publication date Aug 5, 2021
- International Business Machines Corporation
- Jonathan Fry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT LAYOUT SIMILARITY METRIC FOR SEMICONDUCTOR TESTSITE COVERAGE
- Publication number 20200364316
- Publication date Nov 19, 2020
- International Business Machines Corporation
- Rasit Onur Topaloglu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP TRENCH FLOORPLAN DISTRIBUTION DESIGN METHODOLOGY FOR SEMICONDU...
- Publication number 20200004910
- Publication date Jan 2, 2020
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING INTEGRATED CIRCUIT DESIGNS BASED ON INTERACTIONS BETWEEN...
- Publication number 20190095551
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING INTEGRATED CIRCUIT DESIGNS BASED ON INTERACTIONS BETWEEN...
- Publication number 20190095550
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT (IC) DESIGN ANALYSIS AND FEATURE EXTRACTION
- Publication number 20170242952
- Publication date Aug 24, 2017
- GLOBALFOUNDRIES INC.
- Haraprasad Nanjundappa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELING TRANSISTOR PERFORMANCE CONSIDERING NON-UNIFORM LOCAL LAYOU...
- Publication number 20160378888
- Publication date Dec 29, 2016
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...
- Publication number 20160217249
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTING FOR STRESS INDUCED PATTERN SHIFTS IN SEMICONDUCTOR MANUF...
- Publication number 20150363536
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...
- Publication number 20150356230
- Publication date Dec 10, 2015
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS
- Publication number 20150179536
- Publication date Jun 25, 2015
- International Business Machines Corporation
- Emrah Acar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) DEVICE HAVING GATE S...
- Publication number 20140349451
- Publication date Nov 27, 2014
- International Business Machines Corporation
- Yue Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PERFORMANCE STRESS-ENHANCED MOSFETS USING SI:C AND SIGE EPITAX...
- Publication number 20140322873
- Publication date Oct 30, 2014
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON DEVICE ON SI:C-OI AND SGOI AND METHOD OF MANUFACTURE
- Publication number 20140103366
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Dureseti CHIDAMBARRAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON NANOTUBE MOSFET
- Publication number 20140061583
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Daniel Tekleab
- B82 - NANO-TECHNOLOGY
Information Patent Application
CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS
- Publication number 20130320340
- Publication date Dec 5, 2013
- International Business Machines Corporation
- Emrah Acar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MINIMIZING LEAKAGE CURRENT AND JUNCTION CAPACITANCE IN CMOS TRANSIS...
- Publication number 20130288440
- Publication date Oct 31, 2013
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS HAVING A SIC/SIGE ALLOY STACK
- Publication number 20130273699
- Publication date Oct 17, 2013
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
- Publication number 20130238263
- Publication date Sep 12, 2013
- Mentor Graphics Corporation
- James A. Culp
- G01 - MEASURING TESTING
Information Patent Application
CMOS HAVING A SIC/SIGE ALLOY STACK
- Publication number 20130168695
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS-GENERATING STRUCTURE FOR SEMICONDUCTOR-ON-INSULATOR DEVICES
- Publication number 20130168804
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Huilong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Complementary Metal Oxide Semiconductor (CMOS) Device Having Gate S...
- Publication number 20130168776
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Yue Liang
- H01 - BASIC ELECTRIC ELEMENTS

Dureseti Chidambarrao

Person

Patents Grantslast 30 patents

Device mismatch mitigation for medium range and beyond distances

Exploratory data interface

Stacked via rivets in chip hotspots

Multi-mode design and operation for transistor mismatch immunity

Circuit layout similarity metric for semiconductor testsite coverage

Optimizing integrated circuit designs based on interactions between...

Deep trench floorplan distribution design methodology for semicondu...

Optimizing integrated circuit designs based on interactions between...

Integrated circuit (IC) design analysis and feature extraction

Modeling transistor performance considering non-uniform local layou...

Optical proximity correction (OPC) accounting for critical dimensio...

High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...

Optical proximity correction (OPC) accounting for critical dimensio...

Correcting for stress induced pattern shifts in semiconductor manuf...

Stress-generating structure for semiconductor-on-insulator devices

Complementary metal oxide semiconductor (CMOS) device having gate s...

Structure and method for mobility enhanced MOSFETs with unalloyed s...

Silicon device on SI:C-OI and SGOI and method of manufacture

High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...

Methods and system for analysis and management of parametric yield

Minimizing leakage current and junction capacitance in CMOS transis...

Circuit technique to electrically characterize block mask shifts

High performance stress-enhanced MOSFETs using Si:C and SiGe epitax...

Silicon nanotube MOSFET

Silicon nanotube MOSFET

MOS having a sic/sige alloy stack

Complementary metal oxide semiconductor (CMOS) device having gate s...

Structure and method for mobility enhanced MOSFETS with unalloyed s...

Asymmetric FET including sloped threshold voltage adjusting materia...

Stress-generating structure for semiconductor-on-insulator devices

Patents Applicationslast 30 patents

METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)

METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)

METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)

TRENCH ISOLATION FOR BACKSIDE CONTACT FORMATION

SHORT CIRCUIT DETECTION IN A READ/WRITE ASSIST CAPACITOR OF A MEMORY

GATE CONTACTS FOR SEMICONDUCTOR DEVICES

DIFFUSION BREAK STRUCTURE FOR TRANSISTORS

DEVICE MISMATCH MITIGATION FOR MEDIUM RANGE AND BEYOND DISTANCES

EXPLORATORY DATA INTERFACE

CIRCUIT LAYOUT SIMILARITY METRIC FOR SEMICONDUCTOR TESTSITE COVERAGE

DEEP TRENCH FLOORPLAN DISTRIBUTION DESIGN METHODOLOGY FOR SEMICONDU...

OPTIMIZING INTEGRATED CIRCUIT DESIGNS BASED ON INTERACTIONS BETWEEN...

OPTIMIZING INTEGRATED CIRCUIT DESIGNS BASED ON INTERACTIONS BETWEEN...

INTEGRATED CIRCUIT (IC) DESIGN ANALYSIS AND FEATURE EXTRACTION

MODELING TRANSISTOR PERFORMANCE CONSIDERING NON-UNIFORM LOCAL LAYOU...

OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...

CORRECTING FOR STRESS INDUCED PATTERN SHIFTS IN SEMICONDUCTOR MANUF...

OPTICAL PROXIMITY CORRECTION (OPC) ACCOUNTING FOR CRITICAL DIMENSIO...

CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS

COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) DEVICE HAVING GATE S...

HIGH PERFORMANCE STRESS-ENHANCED MOSFETS USING SI:C AND SIGE EPITAX...

SILICON DEVICE ON SI:C-OI AND SGOI AND METHOD OF MANUFACTURE

SILICON NANOTUBE MOSFET

CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS

MINIMIZING LEAKAGE CURRENT AND JUNCTION CAPACITANCE IN CMOS TRANSIS...

MOS HAVING A SIC/SIGE ALLOY STACK

METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD

CMOS HAVING A SIC/SIGE ALLOY STACK

STRESS-GENERATING STRUCTURE FOR SEMICONDUCTOR-ON-INSULATOR DEVICES

Complementary Metal Oxide Semiconductor (CMOS) Device Having Gate S...