Edward T. Laurent

Person

Amblerr, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fluxing systems, bonding machines including fluxing systems, and me...
- Patent number 10,245,668
- Issue date Apr 2, 2019
- Kulicke and Soffa Industries, Inc.
- Daniel P. Buergi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cantilever probe structure for a probe card assembly
- Patent number 8,004,299
- Issue date Aug 23, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Probes for a wafer test apparatus
- Patent number 7,808,260
- Issue date Oct 5, 2010
- Kulicke and Soffa Industries, Inc.
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating cantilever probes
- Patent number 7,721,430
- Issue date May 25, 2010
- SV Probe Pte. Ltd.
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Grant
Probe repair methods
- Patent number 7,437,813
- Issue date Oct 21, 2008
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing co-planar bonding pads on a subs...
- Patent number 7,393,773
- Issue date Jul 1, 2008
- SV Probe Pte. Ltd.
- Edward L. Malantonio
- G01 - MEASURING TESTING
Information Patent Grant
Probe attach tool
- Patent number 7,311,239
- Issue date Dec 25, 2007
- SV Probe Pte. Ltd.
- Edward T. Laurent
- G01 - MEASURING TESTING
Information Patent Grant
Prefabricated and attached interconnect structure
- Patent number 7,173,441
- Issue date Feb 6, 2007
- SV Probe Pte., Ltd.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Prefabricated and attached interconnect structure
- Patent number 6,965,245
- Issue date Nov 15, 2005
- K&S Interconnect, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Die paste transfer system and method
- Patent number 5,423,927
- Issue date Jun 13, 1995
- Kulicke and Soffa Industries, Inc.
- Edward T. Laurent
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Patents Applicationslast 30 patents

Information Patent Application
FLUXING SYSTEMS, BONDING MACHINES INCLUDING FLUXING SYSTEMS, AND ME...
- Publication number 20180117695
- Publication date May 3, 2018
- KULICKE AND SOFFA INDUSTRIES, INC.
- Daniel P. Buergi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WIRE FEED SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20120160902
- Publication date Jun 28, 2012
- KULICKE AND SOFFA INDUSTRIES, INC.
- Wei Qin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY
- Publication number 20110148449
- Publication date Jun 23, 2011
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
WIRE FEED SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20090308904
- Publication date Dec 17, 2009
- KULICKE AND SOFFA INDUSTRIES, INC.
- Wei Qin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probes for a Wafer Test Apparatus
- Publication number 20080258746
- Publication date Oct 23, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
Approach for fabricating cantilever probes
- Publication number 20070256299
- Publication date Nov 8, 2007
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Application
Probe repair methods
- Publication number 20070200577
- Publication date Aug 30, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Multi-layered probes
- Publication number 20070200576
- Publication date Aug 30, 2007
- Edward T. Laurent
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probe structure for a probe card assembly
- Publication number 20070089551
- Publication date Apr 26, 2007
- SV Probe Ptd. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
Wire feed system for a wire bonding apparatus
- Publication number 20060065695
- Publication date Mar 30, 2006
- Kulicke & Soffa Industries, Inc.
- Edward T. Laurent
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Reinforced probes for testing semiconductor devices
- Publication number 20060028220
- Publication date Feb 9, 2006
- K&S Interconnect, Inc.
- Edward L. Malantonio
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for producing co-planar bonding pads on a subs...
- Publication number 20060022690
- Publication date Feb 2, 2006
- K&S Interconnect, Inc.
- Edward L. Malantonio
- G01 - MEASURING TESTING
Information Patent Application
Probe attach tool
- Publication number 20050247755
- Publication date Nov 10, 2005
- Edward T. Laurent
- G01 - MEASURING TESTING
Information Patent Application
Prefabricated and attached interconnect structure
- Publication number 20050052194
- Publication date Mar 10, 2005
- Kulicke & Soffa Interconnect, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Prefabricated and attached interconnect structure
- Publication number 20040217768
- Publication date Nov 4, 2004
- January Kister
- G01 - MEASURING TESTING

Edward T. Laurent

Person

Patents Grantslast 30 patents

Fluxing systems, bonding machines including fluxing systems, and me...

Cantilever probe structure for a probe card assembly

Probes for a wafer test apparatus

Approach for fabricating cantilever probes

Probe repair methods

Method and apparatus for producing co-planar bonding pads on a subs...

Probe attach tool

Prefabricated and attached interconnect structure

Prefabricated and attached interconnect structure

Die paste transfer system and method

Patents Applicationslast 30 patents

FLUXING SYSTEMS, BONDING MACHINES INCLUDING FLUXING SYSTEMS, AND ME...

WIRE FEED SYSTEM AND METHOD OF OPERATING THE SAME

CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY

WIRE FEED SYSTEM AND METHOD OF OPERATING THE SAME

Probes for a Wafer Test Apparatus

Approach for fabricating cantilever probes

Probe repair methods

Multi-layered probes

Cantilever probe structure for a probe card assembly

Wire feed system for a wire bonding apparatus

Reinforced probes for testing semiconductor devices

Method and apparatus for producing co-planar bonding pads on a subs...

Probe attach tool

Prefabricated and attached interconnect structure

Prefabricated and attached interconnect structure