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Emil Kamieniecki
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Lexington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electrostatic hole trapping radiation detectors
Patent number
10,429,522
Issue date
Oct 1, 2019
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Electrical characterization of semiconductor materials
Patent number
8,896,338
Issue date
Nov 25, 2014
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,967,490
Issue date
Nov 22, 2005
QC Solutions, Inc.
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,924,657
Issue date
Aug 2, 2005
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,909,302
Issue date
Jun 21, 2005
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for rapid photo-thermal surfaces treatment
Patent number
6,803,588
Issue date
Oct 12, 2004
QC Solutions, Inc.
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for simulating a surface photo-voltage in a su...
Patent number
6,388,455
Issue date
May 14, 2002
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for rapid photo-thermal surface treatment
Patent number
6,325,078
Issue date
Dec 4, 2001
QC Solutions, Inc.,
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for real-time in-line testing of semiconductor wafers
Patent number
6,315,574
Issue date
Nov 13, 2001
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Method for real-time in-line testing of semiconductor wafers
Patent number
6,069,017
Issue date
May 30, 2000
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
5,661,408
Issue date
Aug 26, 1997
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for making surface photovoltage measurements of a semicon...
Patent number
5,091,691
Issue date
Feb 25, 1992
Semitest, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for making surface photovoltage measurements o...
Patent number
5,087,876
Issue date
Feb 11, 1992
Semitest, Inc.
Leszek Reiss
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for making surface photovoltage measurements of a semicon...
Patent number
4,891,584
Issue date
Jan 2, 1990
Semitest, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive readout of a latent electrostatic image formed on an...
Patent number
4,873,436
Issue date
Oct 10, 1989
Optical Diagnostic Systems, Inc.
Emil Kamieniecki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Nondestructive readout of a latent electrostatic image formed on an...
Patent number
4,847,496
Issue date
Jul 11, 1989
Optical Diagnostic Systems, Inc.
Emil Kamieniecki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Nondestructive readout of a latent electrostatic image formed on an...
Patent number
4,833,324
Issue date
May 23, 1989
Optical Diagnostic Systems, Inc.
Emil Kamieniecki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Noninvasive method and apparatus for characterization of semiconduc...
Patent number
4,827,212
Issue date
May 2, 1989
Semitest, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive readout of a latent electrostatic image formed on an...
Patent number
4,663,526
Issue date
May 5, 1987
Emil Kamieniecki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring photo-induced voltage at the surface of semicon...
Patent number
4,544,887
Issue date
Oct 1, 1985
GTE Laboratories Incorporated
Emil Kamieniecki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR MATERIALS
Publication number
20130257472
Publication date
Oct 3, 2013
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Application
Real-time in-line testing of semiconductor wafers
Publication number
20040046585
Publication date
Mar 11, 2004
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for handling and testing of wafers
Publication number
20020036774
Publication date
Mar 28, 2002
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for rapid photo-thermal surface treatment
Publication number
20020017311
Publication date
Feb 14, 2002
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Real-time in-line testing of semiconductor wafers
Publication number
20020006740
Publication date
Jan 17, 2002
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR RAPID PHOTO-THERMAL SURFACE TREATMENT
Publication number
20010001391
Publication date
May 24, 2001
Emil Kamieniecki
EMIL KAMIENIECKI
H01 - BASIC ELECTRIC ELEMENTS