Eric Paul Tabor

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for local outlier detection
- Patent number 8,417,477
- Issue date Apr 9, 2013
- Test Acuity Solutions, Inc.
- Emilio Miguelanez
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 8,041,541
- Issue date Oct 18, 2011
- Test Advantage, Inc.
- Paul M. Buxton
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 8,000,928
- Issue date Aug 16, 2011
- Test Advantage, Inc.
- Michael J. Scott
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 7,437,271
- Issue date Oct 14, 2008
- Test Advantage, Inc.
- Eric Paul Tabor
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 7,395,170
- Issue date Jul 1, 2008
- Test Advantage, Inc.
- Michael J. Scott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 7,225,107
- Issue date May 29, 2007
- Test Advantage, Inc.
- Paul M. Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 7,167,811
- Issue date Jan 23, 2007
- Test Advantage, Inc.
- Eric Paul Tabor
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for semiconductor testing
- Patent number 6,792,373
- Issue date Sep 14, 2004
- Test Advantage, Inc.
- Eric Paul Tabor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for data smoothing
- Patent number 6,782,297
- Issue date Aug 24, 2004
- Eric Paul Tabor
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
- Publication number 20100088054
- Publication date Apr 8, 2010
- EMILIO MIGUELANEZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
- Publication number 20080249742
- Publication date Oct 9, 2008
- Michael J. Scott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
- Publication number 20080021677
- Publication date Jan 24, 2008
- Paul M. Buxton
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and apparatus for data analysis
- Publication number 20070179743
- Publication date Aug 2, 2007
- Eric Paul Tabor
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for local outlier detection
- Publication number 20060085155
- Publication date Apr 20, 2006
- Emilio Miguelanez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and apparatus for data analysis
- Publication number 20040267477
- Publication date Dec 30, 2004
- Michael J. Scott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and apparatus for data analysis
- Publication number 20040138846
- Publication date Jul 15, 2004
- Paul M. Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and apparatus for data analysis
- Publication number 20030144810
- Publication date Jul 31, 2003
- Eric Paul Tabor
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for semiconductor testing
- Publication number 20030014205
- Publication date Jan 16, 2003
- Eric Paul Tabor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and apparatus for data smoothing
- Publication number 20020183868
- Publication date Dec 5, 2002
- Eric Paul Tabor
- G05 - CONTROLLING REGULATING

Eric Paul Tabor

Person

Patents Grantslast 30 patents

Methods and apparatus for local outlier detection

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for semiconductor testing

Methods and apparatus for data smoothing

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR DATA ANALYSIS

METHODS AND APPARATUS FOR DATA ANALYSIS

METHODS AND APPARATUS FOR DATA ANALYSIS

Methods and apparatus for data analysis

Methods and apparatus for local outlier detection

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for data analysis

Methods and apparatus for semiconductor testing

Methods and apparatus for data smoothing