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Erik Maiken
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Santa Clara, CA, US
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last 30 patents
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Patent Grant
Method of inferring optical parameters outside of a measurement spe...
Patent number
6,710,865
Issue date
Mar 23, 2004
n & k Technology, Inc.
Abdul Rahim Forouhi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method of monitoring thin-film processes and metrology tool thereof
Publication number
20030053081
Publication date
Mar 20, 2003
Abdul Rahim Forouhi
G01 - MEASURING TESTING
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Patent Application
Method of inferring optical parameters outside of a measurement spe...
Publication number
20020113957
Publication date
Aug 22, 2002
Abdul Rahim Forouhi
G01 - MEASURING TESTING