Eyal Fayneh

Person

Givatyim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit margin measurement for structural testing
- Patent number 12,241,933
- Issue date Mar 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 12,216,976
- Issue date Feb 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Loopback testing of integrated circuits
- Patent number 12,123,908
- Issue date Oct 22, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die-to-die and chip-to-chip connectivity monitoring
- Patent number 12,013,800
- Issue date Jun 18, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device degradation monitoring
- Patent number 11,929,131
- Issue date Mar 12, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G11 - INFORMATION STORAGE
Information Patent Grant
In-package RF waveguides as high bandwidth chip-to-chip interconnec...
- Patent number 11,894,324
- Issue date Feb 6, 2024
- Intel Corporation
- Aleksandar Aleksov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring using a clocked receiver
- Patent number 11,815,551
- Issue date Nov 14, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,762,789
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Thermal sensor for integrated circuit
- Patent number 11,619,551
- Issue date Apr 4, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature and/or subthreshold leakag...
- Patent number 11,408,932
- Issue date Aug 9, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 11,391,771
- Issue date Jul 19, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to utilize a digital-time-conversion (DTC) bas...
- Patent number 11,327,523
- Issue date May 10, 2022
- Intel Corporation
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 11,293,977
- Issue date Apr 5, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,275,700
- Issue date Mar 15, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-package RF waveguides as high bandwidth chip-to-chip interconnec...
- Patent number 11,211,345
- Issue date Dec 28, 2021
- Intel Corporation
- Aleksandar Aleksov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 11,132,485
- Issue date Sep 28, 2021
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 10,740,262
- Issue date Aug 11, 2020
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Divider-less fractional PLL architecture
- Patent number 10,659,061
- Issue date May 19, 2020
- Intel Corporation
- Elias Nassar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to utilize a digital-time-conversion (DTC) bas...
- Patent number 10,571,953
- Issue date Feb 25, 2020
- Intel Corporation
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable interleaved digital-to-time converter circuit for clock ge...
- Patent number 10,218,379
- Issue date Feb 26, 2019
- Intel Corporation
- Rotem Banin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Efficient integrated switching voltage regulator comprising switche...
- Patent number 10,203,742
- Issue date Feb 12, 2019
- Intel Corporation
- Gregory Sizikov
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scalable interleaved digital-to-time converter circuit for clock ge...
- Patent number 9,941,898
- Issue date Apr 10, 2018
- Intel Corporation
- Rotem Banin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital phase-locked loop supply voltage control
- Patent number 9,866,225
- Issue date Jan 9, 2018
- Intel Corporation
- Noam Familia
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fast digital to time converter linearity calibration to improve clo...
- Patent number 9,791,834
- Issue date Oct 17, 2017
- Intel Corporation
- Elias Nassar
- G04 - HOROLOGY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT
- Publication number 20240372554
- Publication date Nov 7, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING WITH A CLOCKED RECEIVER
- Publication number 20240038602
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20240004812
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER
- Publication number 20230393196
- Publication date Dec 7, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20230341460
- Publication date Oct 26, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT FOR STRUCTURAL TESTING
- Publication number 20230258719
- Publication date Aug 17, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE DEGRADATION MONITORING
- Publication number 20230009637
- Publication date Jan 12, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20220349935
- Publication date Nov 3, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...
- Publication number 20220343048
- Publication date Oct 27, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS
- Publication number 20220268644
- Publication date Aug 25, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20220260630
- Publication date Aug 18, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20220229107
- Publication date Jul 21, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20220156206
- Publication date May 19, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-PACKAGE RF WAVEGUIDES AS HIGH BANDWIDTH CHIP-TO-CHIP INTERCONNEC...
- Publication number 20220084965
- Publication date Mar 17, 2022
- Intel Corporation
- Aleksandar ALEKSOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20220012395
- Publication date Jan 13, 2022
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20210325455
- Publication date Oct 21, 2021
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20210165941
- Publication date Jun 3, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20200371972
- Publication date Nov 26, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20200363468
- Publication date Nov 19, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...
- Publication number 20200333393
- Publication date Oct 22, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO UTILIZE A DIGITAL-TIME-CONVERSION (DTC) BAS...
- Publication number 20200301465
- Publication date Sep 24, 2020
- Intel Corporation
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING

Eyal Fayneh

Person

Patents Grantslast 30 patents

Integrated circuit margin measurement for structural testing

Efficient integrated circuit simulation and testing

Loopback testing of integrated circuits

Integrated circuit workload, temperature, and/or sub-threshold leak...

Die-to-die connectivity monitoring

Die-to-die and chip-to-chip connectivity monitoring

Memory device degradation monitoring

In-package RF waveguides as high bandwidth chip-to-chip interconnec...

Integrated circuit margin measurement and failure prediction device

Die-to-die connectivity monitoring using a clocked receiver

Integrated circuit I/O integrity and degradation monitoring

Integrated circuit profiling and anomaly detection

Integrated circuit degradation estimation and time-of-failure predi...

Thermal sensor for integrated circuit

Integrated circuit workload, temperature and/or subthreshold leakag...

Integrated circuit pad failure detection

Integrated circuit margin measurement and failure prediction device

Method and apparatus to utilize a digital-time-conversion (DTC) bas...

Die-to-die connectivity monitoring

Integrated circuit I/O integrity and degradation monitoring

In-package RF waveguides as high bandwidth chip-to-chip interconnec...

Efficient integrated circuit simulation and testing

Integrated circuit I/O integrity and degradation monitoring

Divider-less fractional PLL architecture

Method and apparatus to utilize a digital-time-conversion (DTC) bas...

Scalable interleaved digital-to-time converter circuit for clock ge...

Efficient integrated switching voltage regulator comprising switche...

Scalable interleaved digital-to-time converter circuit for clock ge...

Digital phase-locked loop supply voltage control

Fast digital to time converter linearity calibration to improve clo...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

DIE-TO-DIE CONNECTIVITY MONITORING

ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

DIE-TO-DIE CONNECTIVITY MONITORING WITH A CLOCKED RECEIVER

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

INTEGRATED CIRCUIT MARGIN MEASUREMENT FOR STRUCTURAL TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

MEMORY DEVICE DEGRADATION MONITORING

INTEGRATED CIRCUIT PAD FAILURE DETECTION

DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...

ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

DIE-TO-DIE CONNECTIVITY MONITORING

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

IN-PACKAGE RF WAVEGUIDES AS HIGH BANDWIDTH CHIP-TO-CHIP INTERCONNEC...

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

DIE-TO-DIE CONNECTIVITY MONITORING

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...

METHOD AND APPARATUS TO UTILIZE A DIGITAL-TIME-CONVERSION (DTC) BAS...