Fayez E. Abboud

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
In-line electron beam test system
- Patent number 7,973,546
- Issue date Jul 5, 2011
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated substrate transfer module
- Patent number 7,919,972
- Issue date Apr 5, 2011
- Applied Materials, Inc.
- Shinichi Kurita
- G01 - MEASURING TESTING
Information Patent Grant
Configurable prober for TFT LCD array test
- Patent number 7,847,566
- Issue date Dec 7, 2010
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
In-line electron beam test system
- Patent number 7,746,088
- Issue date Jun 29, 2010
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line electron beam test system
- Patent number 7,535,238
- Issue date May 19, 2009
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable prober for TFT LCD array test
- Patent number 7,355,418
- Issue date Apr 8, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Integrated substrate transfer module
- Patent number 7,330,021
- Issue date Feb 12, 2008
- Applied Materials, Inc.
- Shinichi Kurita
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Configurable prober for TFT LCD array testing
- Patent number 7,319,335
- Issue date Jan 15, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Lithography using multiple pass raster-shaped beam
- Patent number 6,433,348
- Issue date Aug 13, 2002
- Applied Materials, Inc.
- Fayez E. Abboud
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
- Publication number 20100327162
- Publication date Dec 30, 2010
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
- Publication number 20090195262
- Publication date Aug 6, 2009
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Substrate Transfer Module
- Publication number 20080111577
- Publication date May 15, 2008
- Shinichi Kurita
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Configurable Prober for TFT LCD Array Test
- Publication number 20080061807
- Publication date Mar 13, 2008
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Charged particle beam system and method for manufacturing and inspe...
- Publication number 20070235665
- Publication date Oct 11, 2007
- APPLIED MATERIALS, INC.
- Bassaam Shamoun
- B82 - NANO-TECHNOLOGY
Information Patent Application
Substrate support with integrated prober drive
- Publication number 20060273815
- Publication date Dec 7, 2006
- APPLIED MATERIALS, INC.
- Benjamin M. Johnston
- G01 - MEASURING TESTING
Information Patent Application
In-line electron beam test system
- Publication number 20060244467
- Publication date Nov 2, 2006
- APPLIED MATERIALS, INC.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Prober tester
- Publication number 20060158208
- Publication date Jul 20, 2006
- APPLIED MATERIALS, INC.
- Fayez E. Abboud
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Electron beam test system stage
- Publication number 20060038554
- Publication date Feb 23, 2006
- APPLIED MATERIALS, INC.
- Shinichi Kurita
- G01 - MEASURING TESTING
Information Patent Application
Integrated substrate transfer module
- Publication number 20050179453
- Publication date Aug 18, 2005
- Shinichi Kurita
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Configurable prober for TFT LCD array test
- Publication number 20050179452
- Publication date Aug 18, 2005
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Fayez E. Abboud

Person

Patents Grantslast 30 patents

In-line electron beam test system

Integrated substrate transfer module

Configurable prober for TFT LCD array test

In-line electron beam test system

In-line electron beam test system

Configurable prober for TFT LCD array test

Integrated substrate transfer module

Configurable prober for TFT LCD array testing

Lithography using multiple pass raster-shaped beam

Patents Applicationslast 30 patents

IN-LINE ELECTRON BEAM TEST SYSTEM

IN-LINE ELECTRON BEAM TEST SYSTEM

Integrated Substrate Transfer Module

Configurable Prober for TFT LCD Array Test

Charged particle beam system and method for manufacturing and inspe...

Substrate support with integrated prober drive

In-line electron beam test system

Prober tester

Electron beam test system stage

Integrated substrate transfer module

Configurable prober for TFT LCD array test