Felician Muntean

Person

Andover, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gas retaining ion guide with axial acceleration
- Patent number 12,205,809
- Issue date Jan 21, 2025
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source for spectrometry using inductively heated gas
- Patent number 12,100,583
- Issue date Sep 24, 2024
- Anil Mavanur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source for spectrometry using inductively heated gas
- Patent number 11,784,036
- Issue date Oct 10, 2023
- Anil Mavanur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer having multi-dynode multiplier(s) of high dynamic...
- Patent number 10,468,239
- Issue date Nov 5, 2019
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer using gastight radio frequency ion guide
- Patent number 10,141,177
- Issue date Nov 27, 2018
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer comprising a radio frequency ion guide having con...
- Patent number 9,899,199
- Issue date Feb 20, 2018
- Anil Mavanur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple quadrupole mass spectrometry coupled to trapped ion mobility...
- Patent number 9,741,552
- Issue date Aug 22, 2017
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetically assisted electron impact ion source for mass spectrometry
- Patent number 9,721,777
- Issue date Aug 1, 2017
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filament for mass spectrometric electron impact ion source
- Patent number 9,401,266
- Issue date Jul 26, 2016
- Maurizio Splendore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contamination-proof ion guide for mass spectrometry
- Patent number 9,312,113
- Issue date Apr 12, 2016
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curved ion guide and related methods
- Patent number 9,236,235
- Issue date Jan 12, 2016
- Agilent Technologies, Inc.
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of cross-talk between RF components in a mass spectrometer
- Patent number 8,921,770
- Issue date Dec 30, 2014
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly for an electrospray ion source
- Patent number 8,772,709
- Issue date Jul 8, 2014
- Bruker Daltonics, Inc.
- Roy P Moeller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas chromatograph-mass spectrometer transfer line
- Patent number 8,759,758
- Issue date Jun 24, 2014
- Bruker Daltonics, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Grant
Curved heated ion transfer optics
- Patent number 8,680,462
- Issue date Mar 25, 2014
- Bruker Daltonics, Inc.
- Stephen Zanon
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for transmitting ions in a mass spectrometer m...
- Patent number 8,525,106
- Issue date Sep 3, 2013
- Bruker Daltonics, Inc.
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens free collision cell with improved efficiency
- Patent number 8,481,929
- Issue date Jul 9, 2013
- Bruker Daltonics, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Grant
Curved ion guide with varying ion deflecting field and related methods
- Patent number 8,084,750
- Issue date Dec 27, 2011
- Agilent Technologies, Inc.
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample ionization at above-vacuum pressures
- Patent number 7,564,029
- Issue date Jul 21, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling space charge-driven ion instabilities in ele...
- Patent number 7,291,845
- Issue date Nov 6, 2007
- Varian, Inc.
- Roy Moeller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GAS RETAINING ION GUIDE WITH AXIAL ACCELERATION
- Publication number 20240006172
- Publication date Jan 4, 2024
- Bruker Switzerland AG
- Urs STEINER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSPRAY ION SOURCE FOR SPECTROMETRY USING INDUCTIVELY HEATED GAS
- Publication number 20230411137
- Publication date Dec 21, 2023
- Bruker Scientific LLC
- Anil MAVANUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSPRAY ION SOURCE FOR SPECTROMETRY USING INDUCTIVELY HEATED GAS
- Publication number 20210375610
- Publication date Dec 2, 2021
- Bruker Scientific LLC
- Anil MAVANUR
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER HAVING MULTI-DYNODE MULTIPLIER(S) OF HIGH DYNAMIC...
- Publication number 20190348265
- Publication date Nov 14, 2019
- Bruker Daltonics, Inc.
- Urs STEINER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER USING GASTIGHT RADIO FREQUENCY ION GUIDE
- Publication number 20180233346
- Publication date Aug 16, 2018
- Bruker Daltonics, Inc.
- Felician MUNTEAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER COMPRISING A RADIO FREQUENCY ION GUIDE HAVING CON...
- Publication number 20180005812
- Publication date Jan 4, 2018
- Bruker Daltonics, Inc.
- Anil MAVANUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRIPLE QUADRUPOLE MASS SPECTROMETRY COUPLED TO TRAPPED ION MOBILITY...
- Publication number 20170178887
- Publication date Jun 22, 2017
- Bruker Daltonics, Inc.
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILAMENT FOR MASS SPECTROMETRIC ELECTRON IMPACT ION SOURCE
- Publication number 20160027630
- Publication date Jan 28, 2016
- Bruker Daltonics, Inc.
- Maurizio SPLENDORE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF CROSS-TALK BETWEEN RF COMPONENTS IN A MASS SPECTROMETER
- Publication number 20150008311
- Publication date Jan 8, 2015
- Bruker Daltonics, Inc.
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSEMBLY FOR AN ELECTROSPRAY ION SOURCE
- Publication number 20140014747
- Publication date Jan 16, 2014
- Bruker Daltonics, Inc.
- Roy P. MOELLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS CHROMATOGRAPH-MASS SPECTROMETER TRANSFER LINE
- Publication number 20130256523
- Publication date Oct 3, 2013
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Application
CURVED HEATED ION TRANSFER OPTICS
- Publication number 20130015348
- Publication date Jan 17, 2013
- Bruker Daltonics, Inc.
- Stephen ZANON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LENS FREE COLLISION CELL WITH IMPROVED EFFICIENCY
- Publication number 20130015349
- Publication date Jan 17, 2013
- Bruker Daltonics, Inc.
- Urs STEINER
- G01 - MEASURING TESTING
Information Patent Application
BACKGROUND NOISE CORRECTION IN QUADRUPOLE MASS SPECTROMETERS
- Publication number 20130015344
- Publication date Jan 17, 2013
- Bruker Daltonics, Inc.
- Felician MUNTEAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TRANSMITTING IONS IN A MASS SPECTROMETER M...
- Publication number 20120286150
- Publication date Nov 15, 2012
- Bruker Daltonik GmbH
- Felician MUNTEAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVED ION GUIDE WITH VARYING ION DEFLECTING FIELD AND RELATED METHODS
- Publication number 20100301227
- Publication date Dec 2, 2010
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVED ION GUIDE AND RELATED METHODS
- Publication number 20090294663
- Publication date Dec 3, 2009
- Felician Muntean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample ionization at above-vacuum pressures
- Publication number 20090045330
- Publication date Feb 19, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for controlling space charge-driven ion instabilities in ele...
- Publication number 20060237641
- Publication date Oct 26, 2006
- Roy Moeller
- H01 - BASIC ELECTRIC ELEMENTS

Felician Muntean

Person

Patents Grantslast 30 patents

Gas retaining ion guide with axial acceleration

Electrospray ion source for spectrometry using inductively heated gas

Electrospray ion source for spectrometry using inductively heated gas

Mass spectrometer having multi-dynode multiplier(s) of high dynamic...

Mass spectrometer using gastight radio frequency ion guide

Mass spectrometer comprising a radio frequency ion guide having con...

Triple quadrupole mass spectrometry coupled to trapped ion mobility...

Magnetically assisted electron impact ion source for mass spectrometry

Filament for mass spectrometric electron impact ion source

Contamination-proof ion guide for mass spectrometry

Curved ion guide and related methods

Reduction of cross-talk between RF components in a mass spectrometer

Assembly for an electrospray ion source

Gas chromatograph-mass spectrometer transfer line

Curved heated ion transfer optics

Method and apparatus for transmitting ions in a mass spectrometer m...

Lens free collision cell with improved efficiency

Curved ion guide with varying ion deflecting field and related methods

Sample ionization at above-vacuum pressures

Method for controlling space charge-driven ion instabilities in ele...

Patents Applicationslast 30 patents

GAS RETAINING ION GUIDE WITH AXIAL ACCELERATION

ELECTROSPRAY ION SOURCE FOR SPECTROMETRY USING INDUCTIVELY HEATED GAS

ELECTROSPRAY ION SOURCE FOR SPECTROMETRY USING INDUCTIVELY HEATED GAS

MASS SPECTROMETER HAVING MULTI-DYNODE MULTIPLIER(S) OF HIGH DYNAMIC...

MASS SPECTROMETER USING GASTIGHT RADIO FREQUENCY ION GUIDE

MASS SPECTROMETER COMPRISING A RADIO FREQUENCY ION GUIDE HAVING CON...

TRIPLE QUADRUPOLE MASS SPECTROMETRY COUPLED TO TRAPPED ION MOBILITY...

FILAMENT FOR MASS SPECTROMETRIC ELECTRON IMPACT ION SOURCE

REDUCTION OF CROSS-TALK BETWEEN RF COMPONENTS IN A MASS SPECTROMETER

ASSEMBLY FOR AN ELECTROSPRAY ION SOURCE

GAS CHROMATOGRAPH-MASS SPECTROMETER TRANSFER LINE

CURVED HEATED ION TRANSFER OPTICS

LENS FREE COLLISION CELL WITH IMPROVED EFFICIENCY

BACKGROUND NOISE CORRECTION IN QUADRUPOLE MASS SPECTROMETERS

METHOD AND APPARATUS FOR TRANSMITTING IONS IN A MASS SPECTROMETER M...

CURVED ION GUIDE WITH VARYING ION DEFLECTING FIELD AND RELATED METHODS

CURVED ION GUIDE AND RELATED METHODS

Sample ionization at above-vacuum pressures

Method for controlling space charge-driven ion instabilities in ele...