Fernando J. Guarin

Person

Millbrook, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Assessment of HCI in logic circuits based on AC stress in discrete...
- Patent number 10,126,354
- Issue date Nov 13, 2018
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating transistors and structures thereof for improved...
- Patent number 8,159,814
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Ping-Chuan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for recovery of hot carrier induced degradation in bipo...
- Patent number 7,723,824
- Issue date May 25, 2010
- International Business Machines Corporation
- Fernando Guarin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for recovery of hot carrier induced degradation in bipo...
- Patent number 7,238,565
- Issue date Jul 3, 2007
- International Business Machines Corporation
- Fernando Guarin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and circuit for element wearout recovery
- Patent number 6,958,621
- Issue date Oct 25, 2005
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Line monitoring of negative bias temperature instabilities by hole...
- Patent number 6,521,469
- Issue date Feb 18, 2003
- International Business Machines Corporation
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ring oscillator design for MOSFET device reliability investigations...
- Patent number 6,476,632
- Issue date Nov 5, 2002
- International Business Machines Corporation
- Gluseppe La Rosa
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for in-line monitoring of negative bias temper...
- Patent number 6,456,104
- Issue date Sep 24, 2002
- International Business Machines Corporation
- Fernando J. Guarin
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a single crystal semiconductor on a substrate
- Patent number 5,667,586
- Issue date Sep 16, 1997
- International Business Machines Corporation
- Bruce Allen Ek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layered structure of a substrate, a dielectric layer and a single c...
- Patent number 5,563,428
- Issue date Oct 8, 1996
- Bruce A. Ek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF OPERATING TRANSISTORS AND STRUCTURES THEREOF FOR IMPROVED...
- Publication number 20100182729
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Ping-Chuan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGY FOR RECOVERY OF HOT CARRIER INDUCED DEGRADATION IN BIPO...
- Publication number 20070205434
- Publication date Sep 6, 2007
- International Business Machines Corporation
- Fernando Guarin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methodology for recovery of hot carrier induced degradation in bipo...
- Publication number 20060118912
- Publication date Jun 8, 2006
- International Business Machines Corporation
- Fernando Guarin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and circuit for element wearout recovery
- Publication number 20050116739
- Publication date Jun 2, 2005
- International Business Machines Corporation ("IBM")
- Giuseppe La Rosa
- H01 - BASIC ELECTRIC ELEMENTS

Fernando J. Guarin

Person

Patents Grantslast 30 patents

Assessment of HCI in logic circuits based on AC stress in discrete...

Method of operating transistors and structures thereof for improved...

Methodology for recovery of hot carrier induced degradation in bipo...

Methodology for recovery of hot carrier induced degradation in bipo...

Method and circuit for element wearout recovery

Line monitoring of negative bias temperature instabilities by hole...

Ring oscillator design for MOSFET device reliability investigations...

Method and structure for in-line monitoring of negative bias temper...

Method for forming a single crystal semiconductor on a substrate

Layered structure of a substrate, a dielectric layer and a single c...

Patents Applicationslast 30 patents

METHOD OF OPERATING TRANSISTORS AND STRUCTURES THEREOF FOR IMPROVED...

METHODOLOGY FOR RECOVERY OF HOT CARRIER INDUCED DEGRADATION IN BIPO...

Methodology for recovery of hot carrier induced degradation in bipo...

Method and circuit for element wearout recovery