Florian Schamberger

Person

Reichenhall, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit
- Patent number 7,808,272
- Issue date Oct 5, 2010
- Qimonda AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Means of mounting for electronic components, arrangement and procedure
- Patent number 7,427,202
- Issue date Sep 23, 2008
- Infineon Technologies AG
- Florian Schamberger
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for testing semiconductor memory modules
- Patent number 7,296,198
- Issue date Nov 13, 2007
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for repairing hardware faults in memory chips
- Patent number 7,222,271
- Issue date May 22, 2007
- Infineon Technologies AG
- Hermann Ruckerbauer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for comparing the address of a memory access with an already...
- Patent number 7,181,643
- Issue date Feb 20, 2007
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and circuit for adjusting a resistance in an integrated circuit
- Patent number 7,054,180
- Issue date May 30, 2006
- Infineon Technologies AG
- Florian Schamberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having a data processing unit and a buffer memory
- Patent number 7,047,454
- Issue date May 16, 2006
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for producing an antifuse in a substrate and an antifuse str...
- Patent number 6,919,234
- Issue date Jul 19, 2005
- Infineon Technologies AG
- Jürgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit configuration for driving a programmable link
- Patent number 6,868,028
- Issue date Mar 15, 2005
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for level boosting, in particular for driving...
- Patent number 6,856,186
- Issue date Feb 15, 2005
- Infineon Technologies AG
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for driving a programmable link
- Patent number 6,807,123
- Issue date Oct 19, 2004
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for operating a semiconductor memory at double...
- Patent number 6,804,166
- Issue date Oct 12, 2004
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor component for connection to a test system
- Patent number 6,800,817
- Issue date Oct 5, 2004
- Infineon Technologies AG
- Helmut Schneider
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having a programmable element and method of oper...
- Patent number 6,788,129
- Issue date Sep 7, 2004
- Infineon Technologies AG
- Jörg Peter
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for driving a programmable link
- Patent number 6,768,695
- Issue date Jul 27, 2004
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having a self-test device for carrying out a sel...
- Patent number 6,728,902
- Issue date Apr 27, 2004
- Infineon Technologies AG
- Robert Kaiser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor module
- Patent number 6,717,437
- Issue date Apr 6, 2004
- Infineon Technologies AG
- Heinrich Hemmert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vertical field effect transistor with internal annular gate and met...
- Patent number 6,717,200
- Issue date Apr 6, 2004
- Siemens Aktiengesellschaft
- Florian Schamberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configuration for generating signal impulses of defined lengths in...
- Patent number 6,715,118
- Issue date Mar 30, 2004
- Infineon Technologies AG
- Robert Kaiser
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having a self-test device
- Patent number 6,675,322
- Issue date Jan 6, 2004
- Siemens Aktiengesellschaft
- Thilo Schaffroth
- G01 - MEASURING TESTING
Information Patent Grant
Configuration and method for storing the test results obtained by a...
- Patent number 6,557,130
- Issue date Apr 29, 2003
- Siemens Aktiengesellschaft
- Hans-Jürgen Krasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated semiconductor circuit with an increased operating voltage
- Patent number 6,535,046
- Issue date Mar 18, 2003
- Infineon Technologies AG
- Robert Kaiser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor circuit configuration
- Patent number 6,449,206
- Issue date Sep 10, 2002
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor circuit with an increased operating voltage
- Patent number 6,441,677
- Issue date Aug 27, 2002
- Infineon Technologies AG
- Robert Kaiser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of repairing defective memory cells of an integrated memory
- Patent number 6,418,069
- Issue date Jul 9, 2002
- Infineon Technologies AG
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having a self-test device and method for produci...
- Patent number 6,415,406
- Issue date Jul 2, 2002
- Siemens Aktiengesellschaft
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for programming an electrically programmable...
- Patent number 6,366,518
- Issue date Apr 2, 2002
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for programming an electrically programmable...
- Patent number 6,344,757
- Issue date Feb 5, 2002
- Infineon Technologies AG
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for determining the drive capability of a driver circuit of...
- Patent number 6,320,368
- Issue date Nov 20, 2001
- Siemens Aktiengesellschaft
- Florian Schamberger
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing leakage current at a contact-making point in an i...
- Patent number 6,313,656
- Issue date Nov 6, 2001
- Siemens Aktiengesellschaft
- Thilo Schaffroth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD
- Publication number 20080155313
- Publication date Jun 26, 2008
- QIMONDA AG
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE ELEMENT AND METHOD FOR OPERATING A STORAGE ELEMENT
- Publication number 20080062738
- Publication date Mar 13, 2008
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit
- Publication number 20060265440
- Publication date Nov 23, 2006
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Means of mounting for electronic components, arrangement and procedure
- Publication number 20060170115
- Publication date Aug 3, 2006
- Florian Schamberger
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and circuit for adjusting a resistance in an integrated circuit
- Publication number 20050196909
- Publication date Sep 8, 2005
- Florian Schamberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing an antifuse structure and antifuse
- Publication number 20050023637
- Publication date Feb 3, 2005
- Jurgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing an antifuse in a substrate and an antifuse str...
- Publication number 20050003647
- Publication date Jan 6, 2005
- Jurgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for comparing the address of a memory access with an already...
- Publication number 20040153843
- Publication date Aug 5, 2004
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for operating a semiconductor memory at double...
- Publication number 20040066701
- Publication date Apr 8, 2004
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration for driving a programmable link
- Publication number 20040037128
- Publication date Feb 26, 2004
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration for driving a programmable link
- Publication number 20040032787
- Publication date Feb 19, 2004
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration for level boosting, in particular for driving...
- Publication number 20040027189
- Publication date Feb 12, 2004
- Florian Schamberger
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit configuration for driving a programmable link
- Publication number 20040004892
- Publication date Jan 8, 2004
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit having a programmable element and method of oper...
- Publication number 20030094996
- Publication date May 22, 2003
- Jorg Peter
- G11 - INFORMATION STORAGE
Information Patent Application
Method for repairing hardware faults in memory chips
- Publication number 20020188897
- Publication date Dec 12, 2002
- Hermann Ruckerbauer
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor circuit with an increased operating voltage
- Publication number 20020171469
- Publication date Nov 21, 2002
- Infineon Technologies AG
- Robert Kaiser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for supplying current to a semiconductor memor...
- Publication number 20020170023
- Publication date Nov 14, 2002
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing semiconductor memory modules
- Publication number 20020157049
- Publication date Oct 24, 2002
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Method for identifying an integrated circuit and integrated circuit
- Publication number 20020149979
- Publication date Oct 17, 2002
- Robert Kaiser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and memory system for writing in data
- Publication number 20020136061
- Publication date Sep 26, 2002
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor module
- Publication number 20020135411
- Publication date Sep 26, 2002
- Heinrich Hemmert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor component for connection to a test system
- Publication number 20020097616
- Publication date Jul 25, 2002
- Helmut Schneider
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit having a data processing unit and a buffer memory
- Publication number 20020083380
- Publication date Jun 27, 2002
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor circuit configuration
- Publication number 20010050416
- Publication date Dec 13, 2001
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Configuration for generating signal impulses of defined lengths in...
- Publication number 20010018754
- Publication date Aug 30, 2001
- Robert Kaiser
- G01 - MEASURING TESTING
Information Patent Application
Method of repairing defective memory cells of an integrated memory
- Publication number 20010017806
- Publication date Aug 30, 2001
- Florian Schamberger
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit having a self-test device for carrying out a sel...
- Publication number 20010011904
- Publication date Aug 9, 2001
- Robert Kaiser
- G01 - MEASURING TESTING

Florian Schamberger

Person

Patents Grantslast 30 patents

Integrated circuit

Means of mounting for electronic components, arrangement and procedure

Method for testing semiconductor memory modules

Method for repairing hardware faults in memory chips

Method for comparing the address of a memory access with an already...

Method and circuit for adjusting a resistance in an integrated circuit

Integrated circuit having a data processing unit and a buffer memory

Method for producing an antifuse in a substrate and an antifuse str...

Circuit configuration for driving a programmable link

Circuit configuration for level boosting, in particular for driving...

Circuit configuration for driving a programmable link

Method and apparatus for operating a semiconductor memory at double...

Semiconductor component for connection to a test system

Integrated circuit having a programmable element and method of oper...

Circuit configuration for driving a programmable link

Integrated circuit having a self-test device for carrying out a sel...

Semiconductor module

Vertical field effect transistor with internal annular gate and met...

Configuration for generating signal impulses of defined lengths in...

Integrated circuit having a self-test device

Configuration and method for storing the test results obtained by a...

Integrated semiconductor circuit with an increased operating voltage

Semiconductor circuit configuration

Integrated semiconductor circuit with an increased operating voltage

Method of repairing defective memory cells of an integrated memory

Integrated circuit having a self-test device and method for produci...

Circuit configuration for programming an electrically programmable...

Circuit configuration for programming an electrically programmable...

Method for determining the drive capability of a driver circuit of...

Method of testing leakage current at a contact-making point in an i...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE AND METHOD

STORAGE ELEMENT AND METHOD FOR OPERATING A STORAGE ELEMENT

Integrated circuit

Means of mounting for electronic components, arrangement and procedure

Method and circuit for adjusting a resistance in an integrated circuit

Method for producing an antifuse structure and antifuse

Method for producing an antifuse in a substrate and an antifuse str...

Method for comparing the address of a memory access with an already...

Method and apparatus for operating a semiconductor memory at double...

Circuit configuration for driving a programmable link

Circuit configuration for driving a programmable link

Circuit configuration for level boosting, in particular for driving...

Circuit configuration for driving a programmable link

Integrated circuit having a programmable element and method of oper...

Method for repairing hardware faults in memory chips

Integrated semiconductor circuit with an increased operating voltage

Method and apparatus for supplying current to a semiconductor memor...

Method for testing semiconductor memory modules

Method for identifying an integrated circuit and integrated circuit

Method and memory system for writing in data

Semiconductor module

Semiconductor component for connection to a test system

Integrated circuit having a data processing unit and a buffer memory

Semiconductor circuit configuration

Configuration for generating signal impulses of defined lengths in...

Method of repairing defective memory cells of an integrated memory

Integrated circuit having a self-test device for carrying out a sel...