Francis J. Deck

Person

Madison, WI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Raman module for a microscope
- Patent number 11,808,707
- Issue date Nov 7, 2023
- Thermo Electron Scientific Instruments LLC
- George L. Skupniewicz
- G01 - MEASURING TESTING
Information Patent Grant
Support structure and method for focus adjustment
- Patent number 11,781,909
- Issue date Oct 10, 2023
- Thermo Electron Scientific Instruments LLC
- Matthew Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced sample imaging using structured illumination microscopy
- Patent number 11,604,341
- Issue date Mar 14, 2023
- Thermo Electron Scientific Instruments LLC
- Michael S. Georgiadis
- G02 - OPTICS
Information Patent Grant
Monochromator with stray light reduction
- Patent number 11,067,445
- Issue date Jul 20, 2021
- Thermo Electron Scientific Instruments LLC
- William R. Finch
- G01 - MEASURING TESTING
Information Patent Grant
Image analysis system and method
- Patent number 11,057,599
- Issue date Jul 6, 2021
- Thermo Electron Scientific Instruments LLC
- Alexander Grenov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffuse reflectance apparatus
- Patent number 10,983,050
- Issue date Apr 20, 2021
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
System and method of dimensional calibration for an analytical micr...
- Patent number 10,846,882
- Issue date Nov 24, 2020
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image analysis system and method
- Patent number 10,630,951
- Issue date Apr 21, 2020
- Thermo Electron Scientific Instruments LLC
- Alexander Grenov
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectrometer with underfilled fiber optic sample interface
- Patent number 8,730,466
- Issue date May 20, 2014
- Thermo Electron Scientific Instruments LLC
- Damian W. Ashmead
- G01 - MEASURING TESTING
Information Patent Grant
Correction of chemical image collected using ATR through germanium...
- Patent number 8,521,491
- Issue date Aug 27, 2013
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Raman spectrometer with display of laser power at the sample
- Patent number 8,111,392
- Issue date Feb 7, 2012
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Rapid spatial averaging over an extended sample in a Raman spectrom...
- Patent number 7,595,873
- Issue date Sep 29, 2009
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Confocal spectrometer with astigmatic aperturing
- Patent number 7,483,135
- Issue date Jan 27, 2009
- Thermo Electron Scientific Instruments, LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer signal quality improvement via background subtraction
- Patent number 7,471,390
- Issue date Dec 30, 2008
- Thermo Electron Scientific Instruments, LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Beam alignment in spectroscopic microscopes
- Patent number 7,460,229
- Issue date Dec 2, 2008
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Vibrational circular dichroism spectrometer using reflective optics
- Patent number 7,456,956
- Issue date Nov 25, 2008
- Thermo Electron Scientific Instruments LLC
- Eric Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope with spatial resolution control
- Patent number 7,456,950
- Issue date Nov 25, 2008
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope with vignetting reduction
- Patent number 7,440,095
- Issue date Oct 21, 2008
- Thermo Finnigan LLC.
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for multi-mode analytical microscopy, in partic...
- Patent number 7,391,509
- Issue date Jun 24, 2008
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Grating monochromator/spectrograph
- Patent number 7,345,760
- Issue date Mar 18, 2008
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic microscope with multi-mode illumination
- Patent number 7,324,272
- Issue date Jan 29, 2008
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Multifunctional fourier transform infrared spectrometer system
- Patent number 6,667,808
- Issue date Dec 23, 2003
- Thermo Electron Scientific Instruments Corporation
- Todd R. Clermont
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for alignment of multiple beam paths in spectr...
- Patent number 6,661,509
- Issue date Dec 9, 2003
- Thermo Electron Scientific Instruments Corporation
- Francis J. Deck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HOLOGRAPHIC GRISM AS DISPERSIVE ELEMENT IN RAMAN SPECTROGRAPHS
- Publication number 20240385460
- Publication date Nov 21, 2024
- Thermo Electron Scientific Instruments LLC
- Theodore Wiley
- G01 - MEASURING TESTING
Information Patent Application
LASER DEVICE WITH SAFETY INTERLOCK AND SCIENTIFIC INSTRUMENT FOR US...
- Publication number 20240204470
- Publication date Jun 20, 2024
- FEI Company
- Francis Deck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL EXTRACTION PROBE FOR ELECTRON MICROSCOPE AND OTHER VACUUM C...
- Publication number 20230333034
- Publication date Oct 19, 2023
- Thermo Electron Scientific Instruments LLC
- Francis Deck
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Reflective Microscope Objective
- Publication number 20230168122
- Publication date Jun 1, 2023
- Thermo Electron Scientific Instruments LLC
- Yan Min
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONTINUUM LASER BASED WEB GAUGING SYSTEM
- Publication number 20230168204
- Publication date Jun 1, 2023
- Thermo Electron Scientific Instruments LLC
- Damian ASHMEAD
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE AND METHOD FOR FOCUS ADJUSTMENT
- Publication number 20220283026
- Publication date Sep 8, 2022
- THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
- Matthew Meyer
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MODULE FOR A MICROSCOPE
- Publication number 20200333253
- Publication date Oct 22, 2020
- THERMO ELECTRON SCIENTIFIC INSTUMENTS LLC
- George L. SKUPNIEWICZ
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED SAMPLE IMAGING USING STRUCTURED ILLUMINATION MICROSCOPY
- Publication number 20200319446
- Publication date Oct 8, 2020
- Thermo Electron Scientific Instruments LLC
- Michael S. Georgiadis
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYSIS SYSTEM AND METHOD
- Publication number 20200213569
- Publication date Jul 2, 2020
- Thermo Electron Scientific Instruments LLC
- Alexander GRENOV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONOCHROMATOR WITH STRAY LIGHT REDUCTION
- Publication number 20200041344
- Publication date Feb 6, 2020
- Thermo Electron Scientific Instruments LLC
- William R. Finch
- G01 - MEASURING TESTING
Information Patent Application
Diffuse Reflectance Apparatus
- Publication number 20200033263
- Publication date Jan 30, 2020
- Thermo Electron Scientific Instruments LLC
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Carbon Nanotube-Based Device for Sensing Molecular Interaction
- Publication number 20190128829
- Publication date May 2, 2019
- Thermo Electron Scientific Instruments LLC
- Matthew Wayne Meyer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF DIMENSIONAL CALIBRATION FOR AN ANALYTICAL MICR...
- Publication number 20180130233
- Publication date May 10, 2018
- Thermo Electron Scientific Instruments LLC
- Francis J. DECK
- G02 - OPTICS
Information Patent Application
IMAGE ANALYSIS SYSTEM AND METHOD
- Publication number 20170078634
- Publication date Mar 16, 2017
- Thermo Electron Scientific Instruments LLC
- Alexander GRENOV
- G01 - MEASURING TESTING
Information Patent Application
Optical Spectrometer with Underfilled Fiber Optic Sample Interface
- Publication number 20130016348
- Publication date Jan 17, 2013
- Damian W. ASHMEAD
- G01 - MEASURING TESTING
Information Patent Application
Correction of Chemical Image Collected Using ATR Through Germanium...
- Publication number 20120259599
- Publication date Oct 11, 2012
- Francis J. DECK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPE WITH VIGNETTING REDUCTION
- Publication number 20080049304
- Publication date Feb 28, 2008
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE WITH SPATIAL RESOLUTION CONTROL
- Publication number 20080049293
- Publication date Feb 28, 2008
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Confocal spectrometer with astigmatic aperturing
- Publication number 20080013086
- Publication date Jan 17, 2008
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Vibrational circular dichroism spectrometer using reflective optics
- Publication number 20070222988
- Publication date Sep 27, 2007
- Eric Jiang
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer signal quality improvement via background subtraction
- Publication number 20070216899
- Publication date Sep 20, 2007
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Grating monochromator / spectrograph
- Publication number 20070165224
- Publication date Jul 19, 2007
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Beam alignment in spectroscopic microscopes
- Publication number 20070165221
- Publication date Jul 19, 2007
- Francis J. Deck
- G02 - OPTICS
Information Patent Application
Method and apparatus for alignment of multiple beam paths in spectr...
- Publication number 20020105640
- Publication date Aug 8, 2002
- Francis J. Deck
- G01 - MEASURING TESTING
Information Patent Application
Multifunctional fourier transform infrared spectrometer system
- Publication number 20010035957
- Publication date Nov 1, 2001
- Todd R. Clermont
- G01 - MEASURING TESTING

Francis J. Deck

Person

Patents Grantslast 30 patents

Raman module for a microscope

Support structure and method for focus adjustment

Enhanced sample imaging using structured illumination microscopy

Monochromator with stray light reduction

Image analysis system and method

Diffuse reflectance apparatus

System and method of dimensional calibration for an analytical micr...

Image analysis system and method

Optical spectrometer with underfilled fiber optic sample interface

Correction of chemical image collected using ATR through germanium...

Raman spectrometer with display of laser power at the sample

Rapid spatial averaging over an extended sample in a Raman spectrom...

Confocal spectrometer with astigmatic aperturing

Spectrometer signal quality improvement via background subtraction

Beam alignment in spectroscopic microscopes

Vibrational circular dichroism spectrometer using reflective optics

Spectroscope with spatial resolution control

Spectroscope with vignetting reduction

Devices and methods for multi-mode analytical microscopy, in partic...

Grating monochromator/spectrograph

Spectroscopic microscope with multi-mode illumination

Multifunctional fourier transform infrared spectrometer system

Method and apparatus for alignment of multiple beam paths in spectr...

Patents Applicationslast 30 patents

HOLOGRAPHIC GRISM AS DISPERSIVE ELEMENT IN RAMAN SPECTROGRAPHS

LASER DEVICE WITH SAFETY INTERLOCK AND SCIENTIFIC INSTRUMENT FOR US...

OPTICAL EXTRACTION PROBE FOR ELECTRON MICROSCOPE AND OTHER VACUUM C...

Hybrid Reflective Microscope Objective

SUPERCONTINUUM LASER BASED WEB GAUGING SYSTEM

SUPPORT STRUCTURE AND METHOD FOR FOCUS ADJUSTMENT

RAMAN MODULE FOR A MICROSCOPE

ENHANCED SAMPLE IMAGING USING STRUCTURED ILLUMINATION MICROSCOPY

IMAGE ANALYSIS SYSTEM AND METHOD

MONOCHROMATOR WITH STRAY LIGHT REDUCTION

Diffuse Reflectance Apparatus

Carbon Nanotube-Based Device for Sensing Molecular Interaction

SYSTEM AND METHOD OF DIMENSIONAL CALIBRATION FOR AN ANALYTICAL MICR...

IMAGE ANALYSIS SYSTEM AND METHOD

Optical Spectrometer with Underfilled Fiber Optic Sample Interface

Correction of Chemical Image Collected Using ATR Through Germanium...

SPECTROSCOPE WITH VIGNETTING REDUCTION

SPECTROSCOPE WITH SPATIAL RESOLUTION CONTROL

Confocal spectrometer with astigmatic aperturing

Vibrational circular dichroism spectrometer using reflective optics

Spectrometer signal quality improvement via background subtraction

Grating monochromator / spectrograph

Beam alignment in spectroscopic microscopes

Method and apparatus for alignment of multiple beam paths in spectr...

Multifunctional fourier transform infrared spectrometer system