Francis T. McQuade

Person

Watertown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Flexible microcircuit space transformer assembly
- Patent number 7,282,934
- Issue date Oct 16, 2007
- Wentworth Laboratories, Inc.
- Dean C. Mazza
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming photo-defined micro electrical contacts
- Patent number 6,977,515
- Issue date Dec 20, 2005
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Method for chemically etching photo-defined micro electrical contacts
- Patent number 6,906,540
- Issue date Jun 14, 2005
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Nickel alloy probe card frame laminate
- Patent number 6,661,244
- Issue date Dec 9, 2003
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,633,175
- Issue date Oct 14, 2003
- Wenworth Laboratories, Inc.
- Stephen Evans
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,566,898
- Issue date May 20, 2003
- Wentworth Laboratories, Inc.
- William F. Theissen
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,297,657
- Issue date Oct 2, 2001
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Grant
Impedance-matched interconnection device for connecting a vertical-...
- Patent number 6,160,412
- Issue date Dec 12, 2000
- Wentworth Laboratories, Inc.
- Anthony Paul Martel
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for testing integrated circuits
- Patent number 5,416,429
- Issue date May 16, 1995
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Flexible microcircuit space transformer assembly
- Publication number 20050218429
- Publication date Oct 6, 2005
- Dean C. Mazza
- G01 - MEASURING TESTING
Information Patent Application
Method for forming photo-defined micro electrical contacts
- Publication number 20040157350
- Publication date Aug 12, 2004
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Application
Nickel alloy probe card frame laminate
- Publication number 20030146769
- Publication date Aug 7, 2003
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Application
Temperature compensated vertical pin probing device
- Publication number 20020011858
- Publication date Jan 31, 2002
- William F. Theissen
- G01 - MEASURING TESTING

Francis T. McQuade

Person

Patents Grantslast 30 patents

Flexible microcircuit space transformer assembly

Method for forming photo-defined micro electrical contacts

Method for chemically etching photo-defined micro electrical contacts

Nickel alloy probe card frame laminate

Temperature compensated vertical pin probing device

Temperature compensated vertical pin probing device

Temperature compensated vertical pin probing device

Impedance-matched interconnection device for connecting a vertical-...

Probe assembly for testing integrated circuits

Patents Applicationslast 30 patents

Flexible microcircuit space transformer assembly

Method for forming photo-defined micro electrical contacts

Nickel alloy probe card frame laminate

Temperature compensated vertical pin probing device