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Frank B. Parrish
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Simi Valley, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Interposer
Patent number
11,862,901
Issue date
Jan 2, 2024
Teradyne, Inc.
Frank Parrish
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductance control system
Patent number
11,651,910
Issue date
May 16, 2023
Teradyne, Inc.
Frank Parrish
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system having distributed resources
Patent number
10,677,815
Issue date
Jun 9, 2020
Teradyne, Inc.
Mohamadreza Ray Mirkhani
G01 - MEASURING TESTING
Information
Patent Grant
Pocketed circuit board
Patent number
9,786,977
Issue date
Oct 10, 2017
Teradyne, Inc.
Timothy Daniel Lyons
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe-card interposer constructed using hexagonal modules
Patent number
8,622,752
Issue date
Jan 7, 2014
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial cable to printed circuit board interface module
Patent number
8,201,328
Issue date
Jun 19, 2012
Tyco Electronics Corporation
Roya Yaghmai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Shielded cable interface module and method of fabrication
Patent number
7,977,583
Issue date
Jul 12, 2011
Teradyne, Inc.
Roya Yaghmai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Coaxial cable to printed circuit board interface module
Patent number
7,815,466
Issue date
Oct 19, 2010
Teradyne, Inc.
Roya Yaghmai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Rotational positioner and methods for semiconductor wafer test systems
Patent number
7,701,232
Issue date
Apr 20, 2010
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Modularized device interface with grounding insert between two strips
Patent number
7,541,819
Issue date
Jun 2, 2009
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Automatic testing equipment instrument card and probe cabling syste...
Patent number
7,504,822
Issue date
Mar 17, 2009
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Tester interface module
Patent number
7,180,321
Issue date
Feb 20, 2007
Teradyne, Inc.
Arash Behziz
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial cable for overvoltage protection
Patent number
6,939,175
Issue date
Sep 6, 2005
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Grant
High power interface
Patent number
6,916,990
Issue date
Jul 12, 2005
Teradyne, Inc.
Arash Behziz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low-cost tester interface module
Patent number
6,686,732
Issue date
Feb 3, 2004
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Modular semiconductor tester interface assembly for high performanc...
Patent number
6,515,499
Issue date
Feb 4, 2003
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Grant
High density printed circuit board
Patent number
6,215,320
Issue date
Apr 10, 2001
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Grant
Digital-to-analog calibration system
Patent number
4,829,236
Issue date
May 9, 1989
Teradyne, Inc.
Ara Brenardi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INDUCTANCE CONTROL SYSTEM
Publication number
20220189712
Publication date
Jun 16, 2022
Teradyne, Inc.
Frank Parrish
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERPOSER
Publication number
20220190527
Publication date
Jun 16, 2022
Teradyne, Inc.
Frank Parrish
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST SYSTEM HAVING DISTRIBUTED RESOURCES
Publication number
20190377007
Publication date
Dec 12, 2019
Teradyne, Inc.
Mohamadreza Ray Mirkhani
G01 - MEASURING TESTING
Information
Patent Application
Pocketed Circuit Board
Publication number
20170170537
Publication date
Jun 15, 2017
Teradyne, Inc.
Timothy Daniel Lyons
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE-CARD INTERPOSER CONSTRUCTED USING HEXAGONAL MODULES
Publication number
20120264320
Publication date
Oct 18, 2012
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Application
Coaxial cable to printed circuit board interface module
Publication number
20090258538
Publication date
Oct 15, 2009
Roya Yaghmai
G01 - MEASURING TESTING
Information
Patent Application
COAXIAL CABLE TO PRINTED CIRCUIT BOARD INTERFACE MODULE
Publication number
20090176406
Publication date
Jul 9, 2009
Roya Yaghmai
G01 - MEASURING TESTING
Information
Patent Application
SHIELDED CABLE INTERFACE MODULE AND METHOD OF FABRICATION
Publication number
20090151993
Publication date
Jun 18, 2009
Roya Yaghmai
G01 - MEASURING TESTING
Information
Patent Application
Rotational positioner and methods for semiconductor wafer test systems
Publication number
20080174330
Publication date
Jul 24, 2008
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automatic test equipment
Publication number
20070096755
Publication date
May 3, 2007
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Application
Automatic testing equipment instrument card and probe cabling syste...
Publication number
20070096756
Publication date
May 3, 2007
Teradyne, Inc.
Frank B. Parrish
G01 - MEASURING TESTING
Information
Patent Application
Tester interface module
Publication number
20060071680
Publication date
Apr 6, 2006
Arash Behziz
G01 - MEASURING TESTING
Information
Patent Application
High power interface
Publication number
20040060725
Publication date
Apr 1, 2004
Arash Behziz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Coaxial cable for ATE with overvoltage protection
Publication number
20030122538
Publication date
Jul 3, 2003
Teradyne, Inc.
Frank Parrish
G01 - MEASURING TESTING
Information
Patent Application
Low-cost tester interface module
Publication number
20030117129
Publication date
Jun 26, 2003
Frank Parrish
G01 - MEASURING TESTING