Frank B. Parrish

Person

Simi Valley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interposer
- Patent number 11,862,901
- Issue date Jan 2, 2024
- Teradyne, Inc.
- Frank Parrish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductance control system
- Patent number 11,651,910
- Issue date May 16, 2023
- Teradyne, Inc.
- Frank Parrish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system having distributed resources
- Patent number 10,677,815
- Issue date Jun 9, 2020
- Teradyne, Inc.
- Mohamadreza Ray Mirkhani
- G01 - MEASURING TESTING
Information Patent Grant
Pocketed circuit board
- Patent number 9,786,977
- Issue date Oct 10, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe-card interposer constructed using hexagonal modules
- Patent number 8,622,752
- Issue date Jan 7, 2014
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial cable to printed circuit board interface module
- Patent number 8,201,328
- Issue date Jun 19, 2012
- Tyco Electronics Corporation
- Roya Yaghmai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Shielded cable interface module and method of fabrication
- Patent number 7,977,583
- Issue date Jul 12, 2011
- Teradyne, Inc.
- Roya Yaghmai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Coaxial cable to printed circuit board interface module
- Patent number 7,815,466
- Issue date Oct 19, 2010
- Teradyne, Inc.
- Roya Yaghmai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Rotational positioner and methods for semiconductor wafer test systems
- Patent number 7,701,232
- Issue date Apr 20, 2010
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Modularized device interface with grounding insert between two strips
- Patent number 7,541,819
- Issue date Jun 2, 2009
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Automatic testing equipment instrument card and probe cabling syste...
- Patent number 7,504,822
- Issue date Mar 17, 2009
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Tester interface module
- Patent number 7,180,321
- Issue date Feb 20, 2007
- Teradyne, Inc.
- Arash Behziz
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial cable for overvoltage protection
- Patent number 6,939,175
- Issue date Sep 6, 2005
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Grant
High power interface
- Patent number 6,916,990
- Issue date Jul 12, 2005
- Teradyne, Inc.
- Arash Behziz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-cost tester interface module
- Patent number 6,686,732
- Issue date Feb 3, 2004
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Modular semiconductor tester interface assembly for high performanc...
- Patent number 6,515,499
- Issue date Feb 4, 2003
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Grant
High density printed circuit board
- Patent number 6,215,320
- Issue date Apr 10, 2001
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Digital-to-analog calibration system
- Patent number 4,829,236
- Issue date May 9, 1989
- Teradyne, Inc.
- Ara Brenardi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD FOR LED TEST SYSTEM
- Publication number 20250123319
- Publication date Apr 17, 2025
- Teradyne, Inc.
- Frank Brian Parrish
- G01 - MEASURING TESTING
Information Patent Application
INDUCTANCE CONTROL SYSTEM
- Publication number 20220189712
- Publication date Jun 16, 2022
- Teradyne, Inc.
- Frank Parrish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERPOSER
- Publication number 20220190527
- Publication date Jun 16, 2022
- Teradyne, Inc.
- Frank Parrish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM HAVING DISTRIBUTED RESOURCES
- Publication number 20190377007
- Publication date Dec 12, 2019
- Teradyne, Inc.
- Mohamadreza Ray Mirkhani
- G01 - MEASURING TESTING
Information Patent Application
Pocketed Circuit Board
- Publication number 20170170537
- Publication date Jun 15, 2017
- Teradyne, Inc.
- Timothy Daniel Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE-CARD INTERPOSER CONSTRUCTED USING HEXAGONAL MODULES
- Publication number 20120264320
- Publication date Oct 18, 2012
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Application
Coaxial cable to printed circuit board interface module
- Publication number 20090258538
- Publication date Oct 15, 2009
- Roya Yaghmai
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL CABLE TO PRINTED CIRCUIT BOARD INTERFACE MODULE
- Publication number 20090176406
- Publication date Jul 9, 2009
- Roya Yaghmai
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED CABLE INTERFACE MODULE AND METHOD OF FABRICATION
- Publication number 20090151993
- Publication date Jun 18, 2009
- Roya Yaghmai
- G01 - MEASURING TESTING
Information Patent Application
Rotational positioner and methods for semiconductor wafer test systems
- Publication number 20080174330
- Publication date Jul 24, 2008
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for automatic test equipment
- Publication number 20070096755
- Publication date May 3, 2007
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Application
Automatic testing equipment instrument card and probe cabling syste...
- Publication number 20070096756
- Publication date May 3, 2007
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Application
Tester interface module
- Publication number 20060071680
- Publication date Apr 6, 2006
- Arash Behziz
- G01 - MEASURING TESTING
Information Patent Application
High power interface
- Publication number 20040060725
- Publication date Apr 1, 2004
- Arash Behziz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Coaxial cable for ATE with overvoltage protection
- Publication number 20030122538
- Publication date Jul 3, 2003
- Teradyne, Inc.
- Frank Parrish
- G01 - MEASURING TESTING
Information Patent Application
Low-cost tester interface module
- Publication number 20030117129
- Publication date Jun 26, 2003
- Frank Parrish
- G01 - MEASURING TESTING

Frank B. Parrish

Person

Patents Grantslast 30 patents

Interposer

Inductance control system

Test system having distributed resources

Pocketed circuit board

Probe-card interposer constructed using hexagonal modules

Coaxial cable to printed circuit board interface module

Shielded cable interface module and method of fabrication

Coaxial cable to printed circuit board interface module

Rotational positioner and methods for semiconductor wafer test systems

Modularized device interface with grounding insert between two strips

Automatic testing equipment instrument card and probe cabling syste...

Tester interface module

Coaxial cable for overvoltage protection

High power interface

Low-cost tester interface module

Modular semiconductor tester interface assembly for high performanc...

High density printed circuit board

Digital-to-analog calibration system

Patents Applicationslast 30 patents

PROBE HEAD FOR LED TEST SYSTEM

INDUCTANCE CONTROL SYSTEM

INTERPOSER

TEST SYSTEM HAVING DISTRIBUTED RESOURCES

Pocketed Circuit Board

PROBE-CARD INTERPOSER CONSTRUCTED USING HEXAGONAL MODULES

Coaxial cable to printed circuit board interface module

COAXIAL CABLE TO PRINTED CIRCUIT BOARD INTERFACE MODULE

SHIELDED CABLE INTERFACE MODULE AND METHOD OF FABRICATION

Rotational positioner and methods for semiconductor wafer test systems

Method and apparatus for automatic test equipment

Automatic testing equipment instrument card and probe cabling syste...

Tester interface module

High power interface

Coaxial cable for ATE with overvoltage protection

Low-cost tester interface module