Gabriel L. Miller

Person

Westfield, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Directional capacitor microphone system
- Patent number 5,862,239
- Issue date Jan 19, 1999
- Lucent Technologies Inc.
- Robert Alfred Kubli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Mechanism for changing a probe balance beam in a scanning probe mic...
- Patent number 5,756,887
- Issue date May 26, 1998
- Lucent Technologies Inc.
- Charles E. Bryson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for continuously monitoring the integrity of an electrical c...
- Patent number 5,744,965
- Issue date Apr 28, 1998
- Lucent Technologies Inc.
- Gabriel Lorimer Miller
- G01 - MEASURING TESTING
Information Patent Grant
Cascaded multiplying current mirror driver for LED's
- Patent number 5,701,133
- Issue date Dec 23, 1997
- Lucent Technologies Inc.
- Gabriel L. Miller
- G05 - CONTROLLING REGULATING
Information Patent Grant
Reduced stress tungsten deposition
- Patent number 5,620,573
- Issue date Apr 15, 1997
- Lucent Technologies Inc.
- Charles W. Jurgensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical scanner
- Patent number 5,517,012
- Issue date May 14, 1996
- AT&T Corp.
- Robert A. Boie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for depositing low stress films
- Patent number 5,480,529
- Issue date Jan 2, 1996
- AT&T Corp.
- Ratnaji R. Kola
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Photodetector circuit with actively damped tuned input
- Patent number 5,481,104
- Issue date Jan 2, 1996
- AT&T Corp.
- Gabriel L. Miller
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Battery feed for telephone line cards
- Patent number 5,444,777
- Issue date Aug 22, 1995
- AT&T Corp.
- Joseph H. Condon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Process for reduced stress tungsten deposition
- Patent number 5,382,340
- Issue date Jan 17, 1995
- AT&T Corp.
- Ratnaji R. Kola
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Capacitive proximity sensors
- Patent number 5,337,353
- Issue date Aug 9, 1994
- AT&T Bell Laboratories
- Robert A. Boie
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices using epitaxial silicides on (111) surfaces e...
- Patent number 5,323,053
- Issue date Jun 21, 1994
- AT&T Bell Laboratories
- Sergey Luryi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force-sensing system, including a magnetically mounted rocking element
- Patent number 5,307,693
- Issue date May 3, 1994
- AT&T Bell Laboratories
- Joseph E. Griffith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Slurry polisher using ultrasonic agitation
- Patent number 5,245,796
- Issue date Sep 21, 1993
- AT&T Bell Laboratories
- Gabriel L. Miller
- B24 - GRINDING POLISHING
Information Patent Grant
Capacitive force-balance system for measuring small forces and pres...
- Patent number 5,085,070
- Issue date Feb 4, 1992
- AT&T Bell Laboratories
- Gabriel L. Miller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
In situ monitoring technique and apparatus for chemical/mechanical...
- Patent number 5,081,421
- Issue date Jan 14, 1992
- AT&T Bell Laboratories
- Gabriel L. Miller
- B24 - GRINDING POLISHING
Information Patent Grant
High resolution one and two dimensional position indicating apparat...
- Patent number 5,072,179
- Issue date Dec 10, 1991
- AT&T Bell Laboratories
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Capacitively commutated brushless DC servomotors
- Patent number 4,958,115
- Issue date Sep 18, 1990
- AT&T Bell Laboratories
- Gabriel L. Miller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Capacitive incremental position measurement and motion control
- Patent number 4,893,071
- Issue date Jan 9, 1990
- American Telephone and Telegraph Company, AT&T Bell Laboratories
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Optical ranging by phase shift measurement with return signal level...
- Patent number 4,829,172
- Issue date May 9, 1989
- American Telephone and Telegraph Company AT&T Bell Laboratories
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic ranging system
- Patent number 4,597,068
- Issue date Jun 24, 1986
- AT&T Bell Laboratories
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Noncontacting conductivity type determination and surface state spe...
- Patent number 4,551,674
- Issue date Nov 5, 1985
- AT&T Bell Laboratories
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Conformable tactile sensor
- Patent number 4,526,043
- Issue date Jul 2, 1985
- AT&T Bell Laboratories
- Robert A. Boie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for the contactless monitoring carrier lifetim...
- Patent number 4,286,215
- Issue date Aug 25, 1981
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Forming self-guarded p-n junctions by epitaxial regrowth of amorpho...
- Patent number 4,240,843
- Issue date Dec 23, 1980
- Western Electric Company, Inc.
- George K. Celler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromechanical parametric amplifier for measurement of electric...
- Patent number 4,227,147
- Issue date Oct 7, 1980
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing electrical conductor elements
- Patent number 4,213,087
- Issue date Jul 15, 1980
- Bell Telephone Laboratories, Incorporated
- Alan T. English
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for investigating dielectric semiconductor mat...
- Patent number 4,208,624
- Issue date Jun 17, 1980
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Laser deformation of semiconductor junctions
- Patent number 4,203,781
- Issue date May 20, 1980
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noncontacting measurement of hall effect in a wafer
- Patent number 4,190,799
- Issue date Feb 26, 1980
- Bell Telephone Laboratories, Incorporated
- Gabriel L. Miller
- G01 - MEASURING TESTING

Gabriel L. Miller

Person

Patents Grantslast 30 patents

Directional capacitor microphone system

Mechanism for changing a probe balance beam in a scanning probe mic...

System for continuously monitoring the integrity of an electrical c...

Cascaded multiplying current mirror driver for LED's

Reduced stress tungsten deposition

Optical scanner

Apparatus for depositing low stress films

Photodetector circuit with actively damped tuned input

Battery feed for telephone line cards

Process for reduced stress tungsten deposition

Capacitive proximity sensors

Semiconductor devices using epitaxial silicides on (111) surfaces e...

Force-sensing system, including a magnetically mounted rocking element

Slurry polisher using ultrasonic agitation

Capacitive force-balance system for measuring small forces and pres...

In situ monitoring technique and apparatus for chemical/mechanical...

High resolution one and two dimensional position indicating apparat...

Capacitively commutated brushless DC servomotors

Capacitive incremental position measurement and motion control

Optical ranging by phase shift measurement with return signal level...

Acoustic ranging system

Noncontacting conductivity type determination and surface state spe...

Conformable tactile sensor

Method and apparatus for the contactless monitoring carrier lifetim...

Forming self-guarded p-n junctions by epitaxial regrowth of amorpho...

Electromechanical parametric amplifier for measurement of electric...

Method and device for testing electrical conductor elements

Method and apparatus for investigating dielectric semiconductor mat...

Laser deformation of semiconductor junctions

Noncontacting measurement of hall effect in a wafer