Gaurav Verma

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for fast chemical electrodeposition for fabri...
- Patent number 9,960,312
- Issue date May 1, 2018
- Kurt H. Weiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Maintaining flow rate of a fluid
- Patent number 9,164,517
- Issue date Oct 20, 2015
- Intermolecular, Inc.
- Rajesh Kelekar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods of combinatorial processing for screening multiple samples...
- Patent number 8,633,039
- Issue date Jan 21, 2014
- Intermolecular, Inc.
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for fast chemical electrodeposition for fabri...
- Patent number 8,343,327
- Issue date Jan 1, 2013
- Reel Solar, Inc.
- Kurt H. Weiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Measuring volume of a liquid dispensed into a vessel
- Patent number 8,220,502
- Issue date Jul 17, 2012
- Intermolecular, Inc.
- Rajesh Kelekar
- G01 - MEASURING TESTING
Information Patent Grant
Methods of combinatorial processing for screening multiple samples...
- Patent number 8,143,619
- Issue date Mar 27, 2012
- Intermolecular, Inc.
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods and systems for determining different...
- Patent number 8,102,408
- Issue date Jan 24, 2012
- KLA-Tencor Technologies Corp.
- Gaurav Verma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Maintaining flow rate of a fluid
- Patent number 8,037,894
- Issue date Oct 18, 2011
- Intermolecular, Inc.
- Rajesh Kelekar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Computer-implemented methods, systems, and computer-readable media...
- Patent number 7,962,863
- Issue date Jun 14, 2011
- KLA-Tencor Corp.
- Bo Su
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of combinatorial processing for screening multiple samples...
- Patent number 7,824,935
- Issue date Nov 2, 2010
- Intermolecular, Inc.
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and carrier media for evaluating reticle layout data
- Patent number 7,689,966
- Issue date Mar 30, 2010
- KLA-Tencor Technologies Corp.
- Gaurav Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window optical proximity correction
- Patent number 7,493,590
- Issue date Feb 17, 2009
- KLA-Tencor Technologies Corporation
- Carl Hess
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and methods for detection of systematic defects
- Patent number 7,280,945
- Issue date Oct 9, 2007
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Methodologies for efficient inspection of test structures using ele...
- Patent number 7,198,963
- Issue date Apr 3, 2007
- KLA-Tencor Technologies Corporation
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for semiconductor IC failure detection
- Patent number 7,067,335
- Issue date Jun 27, 2006
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for semiconductor IC failure detection
- Patent number 6,995,393
- Issue date Feb 7, 2006
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining and localization of failures...
- Patent number 6,861,666
- Issue date Mar 1, 2005
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for predicting multiple product chip yields t...
- Patent number 6,732,002
- Issue date May 4, 2004
- KLA-Tencor Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for reliable and efficient detection of volta...
- Patent number 6,642,726
- Issue date Nov 4, 2003
- KLA-Tencor Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a silicide region on a silicon body
- Patent number 6,387,803
- Issue date May 14, 2002
- Ultratech Stepper, Inc.
- Somit Talwar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for annealing an integrated device using a radiant energy a...
- Patent number 6,300,208
- Issue date Oct 9, 2001
- Ultratech Stepper, Inc.
- Somit Talwar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming silicide regions on an integrated device
- Patent number 6,297,135
- Issue date Oct 2, 2001
- Ultratech Stepper, Inc.
- Somit Talwar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods of Combinatorial Processing for Screening Multiple Samples...
- Publication number 20140090596
- Publication date Apr 3, 2014
- Intermolecular, Inc.
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
Methods of Combinatorial Processing for Screening Multiple Samples...
- Publication number 20130285695
- Publication date Oct 31, 2013
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
MEASURING VOLUME OF A LIQUID DISPENSED INTO A VESSEL
- Publication number 20120273072
- Publication date Nov 1, 2012
- Intermolecular, Inc.
- Rajesh Kelekar
- G01 - MEASURING TESTING
Information Patent Application
Methods of Combinatorial Processing For Screening Multiple Samples...
- Publication number 20120149137
- Publication date Jun 14, 2012
- Intermolecular, Inc.
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
ABSORBER REPAIR IN SUBSTRATE FABRICATED PHOTOVOLTAICS
- Publication number 20110312120
- Publication date Dec 22, 2011
- REEL SOLAR, INC.
- Kurt H. Weiner
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
MAINTAINING FLOW RATE OF A FLUID
- Publication number 20110303696
- Publication date Dec 15, 2011
- Intermolecular, Inc.
- Rajesh Kelekar
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS AND METHODS FOR FAST CHEMICAL ELECTRODEPOSITION FOR FABRI...
- Publication number 20110290654
- Publication date Dec 1, 2011
- REEL SOLAR, INC.
- Kurt H. Weiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
APPARATUS AND METHODS FOR FAST CHEMICAL ELECTRODEPOSITION FOR FABRI...
- Publication number 20110290641
- Publication date Dec 1, 2011
- REEL SOLAR, INC.
- Kurt H. Weiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Methods of Combinatorial Processing for Screening Multiple Samples...
- Publication number 20110248264
- Publication date Oct 13, 2011
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR INTEGRATING QUANTUM WINDOW STRUCTURES INTO SOLAR CELLS
- Publication number 20100273287
- Publication date Oct 28, 2010
- REEL SOLAR, INC.
- Kurt H. Weiner
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
APPARATUS AND METHODS FOR CHEMICAL ELECTRODEPOSITION ON A SUBSTRATE...
- Publication number 20100258444
- Publication date Oct 14, 2010
- REEL SOLAR, INC.
- Kurt H. Weiner
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Methods of Combinatorial Processing for Screening Multiple Samples...
- Publication number 20100001269
- Publication date Jan 7, 2010
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, SYSTEMS, AND COMPUTER-READABLE MEDIA...
- Publication number 20090024967
- Publication date Jan 22, 2009
- Bo Su
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTER-IMPLEMENTED METHODS AND SYSTEMS FOR DETERMINING DIFFERENT...
- Publication number 20080072207
- Publication date Mar 20, 2008
- Gaurav Verma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods, systems, and carrier media for evaluating reticle layout data
- Publication number 20060062445
- Publication date Mar 23, 2006
- Gaurav Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodologies for efficient inspection of test structures using ele...
- Publication number 20040207414
- Publication date Oct 21, 2004
- KLA-Tencor Technologies Corporation
- Gaurav Verma
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for semiconductor IC failure detection
- Publication number 20030071261
- Publication date Apr 17, 2003
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for semiconductor IC failure detection
- Publication number 20030071262
- Publication date Apr 17, 2003
- KLA-Tencor Technologies Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for reliable and efficient detection of volta...
- Publication number 20030001598
- Publication date Jan 2, 2003
- KLA-Tencor Corporation
- Kurt H. Weiner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FORMING A SILICIDE REGION ON A SILICON BODY
- Publication number 20010012693
- Publication date Aug 9, 2001
- SOMIT TALWAR
- H01 - BASIC ELECTRIC ELEMENTS

Gaurav Verma

Person

Patents Grantslast 30 patents

Apparatus and methods for fast chemical electrodeposition for fabri...

Maintaining flow rate of a fluid

Methods of combinatorial processing for screening multiple samples...

Apparatus and methods for fast chemical electrodeposition for fabri...

Measuring volume of a liquid dispensed into a vessel

Methods of combinatorial processing for screening multiple samples...

Computer-implemented methods and systems for determining different...

Maintaining flow rate of a fluid

Computer-implemented methods, systems, and computer-readable media...

Methods of combinatorial processing for screening multiple samples...

Methods, systems, and carrier media for evaluating reticle layout data

Process window optical proximity correction

Apparatus and methods for detection of systematic defects

Methodologies for efficient inspection of test structures using ele...

Apparatus and methods for semiconductor IC failure detection

Apparatus and methods for semiconductor IC failure detection

Apparatus and methods for determining and localization of failures...

Apparatus and methods for predicting multiple product chip yields t...

Apparatus and methods for reliable and efficient detection of volta...

Method for forming a silicide region on a silicon body

Methods for annealing an integrated device using a radiant energy a...

Method for forming silicide regions on an integrated device

Patents Applicationslast 30 patents

Methods of Combinatorial Processing for Screening Multiple Samples...

Methods of Combinatorial Processing for Screening Multiple Samples...

MEASURING VOLUME OF A LIQUID DISPENSED INTO A VESSEL

Methods of Combinatorial Processing For Screening Multiple Samples...

ABSORBER REPAIR IN SUBSTRATE FABRICATED PHOTOVOLTAICS

MAINTAINING FLOW RATE OF A FLUID

APPARATUS AND METHODS FOR FAST CHEMICAL ELECTRODEPOSITION FOR FABRI...

APPARATUS AND METHODS FOR FAST CHEMICAL ELECTRODEPOSITION FOR FABRI...

Methods of Combinatorial Processing for Screening Multiple Samples...

METHODS FOR INTEGRATING QUANTUM WINDOW STRUCTURES INTO SOLAR CELLS

APPARATUS AND METHODS FOR CHEMICAL ELECTRODEPOSITION ON A SUBSTRATE...

Methods of Combinatorial Processing for Screening Multiple Samples...

COMPUTER-IMPLEMENTED METHODS, SYSTEMS, AND COMPUTER-READABLE MEDIA...

COMPUTER-IMPLEMENTED METHODS AND SYSTEMS FOR DETERMINING DIFFERENT...

Methods, systems, and carrier media for evaluating reticle layout data

Methodologies for efficient inspection of test structures using ele...

Apparatus and methods for semiconductor IC failure detection

Apparatus and methods for semiconductor IC failure detection

Apparatus and methods for reliable and efficient detection of volta...

METHOD FOR FORMING A SILICIDE REGION ON A SILICON BODY