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Gerald F. Muething Jr.
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Melbourne, FL, US
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last 30 patents
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Patent Grant
Low cost CMOS tester with edge rate compensation
Patent number
6,469,493
Issue date
Oct 22, 2002
Teradyne, Inc.
Gerald F. Muething
G01 - MEASURING TESTING
Information
Patent Grant
Low cost CMOS tester with high channel density
Patent number
6,073,259
Issue date
Jun 6, 2000
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
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Patent Grant
Tester with fast refire recovery time
Patent number
5,854,797
Issue date
Dec 29, 1998
Teradyne, Inc.
Martin J. Schwartz
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring skew or phase difference in electronic systems
Patent number
4,703,448
Issue date
Oct 27, 1987
Nicolet Instrument Corporation
Gerald F. Muething
G01 - MEASURING TESTING
Information
Patent Grant
Linked microprogrammed plural processor system
Patent number
4,131,941
Issue date
Dec 26, 1978
Itek Corporation
Harvey L. Siegel
G06 - COMPUTING CALCULATING COUNTING