Gordon W. Roberts

Person

Montreal-West, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Extremely-fine resolution sub-ranging current mode Digital-Analog-C...
- Patent number 10,425,099
- Issue date Sep 24, 2019
- Ciena Corporation
- Sadok Aouini
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor systems and methods for analyte detection
- Patent number 9,680,271
- Issue date Jun 13, 2017
- McGill University
- Jonathan Ikola Saari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for detecting target chemicals and methods for their prepar...
- Patent number 9,400,269
- Issue date Jul 26, 2016
- The Royal Institution for the Advancement of Learning/McGill University
- Patanjali Kambhampati
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Methods and devices relating to time-variable signal processing
- Patent number 8,933,742
- Issue date Jan 13, 2015
- The Royal Institution for the Advancement of Learning/McGill University
- Gordon Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase/frequency synthesis using periodic sigma-delta modulated bit-...
- Patent number 8,855,215
- Issue date Oct 7, 2014
- The Royal Institution for the Advancement of Learning/McGill University
- Gordon Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Generation of an analog Gaussian noise signal having predetermined...
- Patent number 8,849,882
- Issue date Sep 30, 2014
- The Royal Institution for the Association of Learning
- Sadok Aouini
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High-speed bandpass serial data link
- Patent number 8,258,892
- Issue date Sep 4, 2012
- The Royal Institution for the Advancement of Learning/McGill University
- Ramesh Abhari
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Embedded time domain analyzer for high speed circuits
- Patent number 7,474,974
- Issue date Jan 6, 2009
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating a jittered test signal
- Patent number 7,315,574
- Issue date Jan 1, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for testing integrated circuits
- Patent number 7,242,209
- Issue date Jul 10, 2007
- DFT Microsystems, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for distributed synchronous clocking
- Patent number 7,035,269
- Issue date Apr 25, 2006
- McGill University
- David Robert Cameron Rolston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated excitation/extraction system for test and measurement
- Patent number 6,931,579
- Issue date Aug 16, 2005
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for use in DC parametric tests
- Patent number 6,917,320
- Issue date Jul 12, 2005
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Programmable DC voltage generator
- Patent number 6,914,548
- Issue date Jul 5, 2005
- McGill University
- Gordon W. Roberts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing measurement device using a component-invariant vernier delay...
- Patent number 6,850,051
- Issue date Feb 1, 2005
- McGill University
- Gordon W. Roberts
- G04 - HOROLOGY
Information Patent Grant
Method and device for use in DC parametric tests
- Patent number 6,727,834
- Issue date Apr 27, 2004
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-STAGE TRANSIMPEDANCE AMPLIFIER WITH RESISTOR-CAPACITOR (RC) C...
- Publication number 20240348212
- Publication date Oct 17, 2024
- The Royal Institution for the advancement of Learning/McGill University
- Muhammad Bilal BABAR
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ENHANCED GAIN OF OPERATIONAL AMPLIFIERS THROUGH LOW-FREQUENCY ZERO...
- Publication number 20220399863
- Publication date Dec 15, 2022
- The Royal Institution for the advancement of Learning/McGill University
- Mahmood A. MOHAMMED
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND DEVICES RELATING TO HIGH GAIN AMPLIFIERS
- Publication number 20170373650
- Publication date Dec 28, 2017
- The Royal Institution for the advancement of Learning/McGill University
- Gordon ROBERTS
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSOR SYSTEMS AND METHODS FOR ANALYTE DETECTION
- Publication number 20160084705
- Publication date Mar 24, 2016
- McGill University
- Jonathan Ikola SAARI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR DETECTING TARGET CHEMICALS AND METHODS FOR THEIR PREPAR...
- Publication number 20160084810
- Publication date Mar 24, 2016
- McGill University
- Patanjali KAMBHAMPATI
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHODS AND DEVICES RELATING TO TIME-VARIABLE SIGNAL PROCESSING
- Publication number 20130300483
- Publication date Nov 14, 2013
- The Royal Institution for the Advancement of Learning / McGill University
- Gordon Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHASE / FREQUENCY SYNTHESIS USING PERIODIC SIGMA-DELTA MODULATED BI...
- Publication number 20120288044
- Publication date Nov 15, 2012
- The Royal Institution for the advancement of Learning/McGill University
- Gordon Roberts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH-SPEED BANDPASS SERIAL DATA LINK
- Publication number 20090220240
- Publication date Sep 3, 2009
- The Royal Institution for the advancement of Learning/McGill University
- Ramesh ABHARI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Generation of an Analog Gaussian Noise Signal Having Predetermined...
- Publication number 20090121749
- Publication date May 14, 2009
- McGill University
- Gordon W. ROBERTS
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Embedded time domain analyzer for high speed circuits
- Publication number 20080183409
- Publication date Jul 31, 2008
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
System and method for generating a jittered test signal
- Publication number 20050271131
- Publication date Dec 8, 2005
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for testing integrated circuits
- Publication number 20050253617
- Publication date Nov 17, 2005
- DFT Microsystems Canada, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Method and device for use in DC parametric tests
- Publication number 20040246002
- Publication date Dec 9, 2004
- McGill University
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for use in DSP-based testing
- Publication number 20040161028
- Publication date Aug 19, 2004
- Gordon Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and device for use in DC parametric tests
- Publication number 20030206127
- Publication date Nov 6, 2003
- Gordon W. Roberts
- G01 - MEASURING TESTING
Information Patent Application
Programmable DC voltage generator
- Publication number 20030006924
- Publication date Jan 9, 2003
- Gordon W. Roberts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timing measurement device using a component-invariant vernier delay...
- Publication number 20030006750
- Publication date Jan 9, 2003
- McGill University
- Gordon W. Roberts
- G04 - HOROLOGY
Information Patent Application
Method and apparatus for distributed synchronous clocking
- Publication number 20020031199
- Publication date Mar 14, 2002
- David Robert Cameron Rolston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Integrated excitation/extraction system for test and measurement
- Publication number 20020019962
- Publication date Feb 14, 2002
- Gordon W. Roberts
- G01 - MEASURING TESTING

Gordon W. Roberts

Person

Patents Grantslast 30 patents

Extremely-fine resolution sub-ranging current mode Digital-Analog-C...

Sensor systems and methods for analyte detection

Systems for detecting target chemicals and methods for their prepar...

Methods and devices relating to time-variable signal processing

Phase/frequency synthesis using periodic sigma-delta modulated bit-...

Generation of an analog Gaussian noise signal having predetermined...

High-speed bandpass serial data link

Embedded time domain analyzer for high speed circuits

System and method for generating a jittered test signal

System and method for testing integrated circuits

Method and apparatus for distributed synchronous clocking

Integrated excitation/extraction system for test and measurement

Method and device for use in DC parametric tests

Programmable DC voltage generator

Timing measurement device using a component-invariant vernier delay...

Method and device for use in DC parametric tests

Patents Applicationslast 30 patents

MULTI-STAGE TRANSIMPEDANCE AMPLIFIER WITH RESISTOR-CAPACITOR (RC) C...

ENHANCED GAIN OF OPERATIONAL AMPLIFIERS THROUGH LOW-FREQUENCY ZERO...

METHODS AND DEVICES RELATING TO HIGH GAIN AMPLIFIERS

SENSOR SYSTEMS AND METHODS FOR ANALYTE DETECTION

SYSTEMS FOR DETECTING TARGET CHEMICALS AND METHODS FOR THEIR PREPAR...

METHODS AND DEVICES RELATING TO TIME-VARIABLE SIGNAL PROCESSING

PHASE / FREQUENCY SYNTHESIS USING PERIODIC SIGMA-DELTA MODULATED BI...

HIGH-SPEED BANDPASS SERIAL DATA LINK

Generation of an Analog Gaussian Noise Signal Having Predetermined...

Embedded time domain analyzer for high speed circuits

System and method for generating a jittered test signal

System and method for testing integrated circuits

Method and device for use in DC parametric tests

Method and apparatus for use in DSP-based testing

Method and device for use in DC parametric tests

Programmable DC voltage generator

Timing measurement device using a component-invariant vernier delay...

Method and apparatus for distributed synchronous clocking

Integrated excitation/extraction system for test and measurement