Guy Cohen

Person

D.N. Misgav, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting rare stochastic defects
- Patent number 11,860,551
- Issue date Jan 2, 2024
- Applied Materials Israel Ltd.
- Guy Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay targets with orthogonal underlayer dummyfill
- Patent number 10,890,436
- Issue date Jan 12, 2021
- KLA Corporation
- Nuriel Amir
- G01 - MEASURING TESTING
Information Patent Grant
Estimating amplitude and phase asymmetry in imaging technology for...
- Patent number 10,866,090
- Issue date Dec 15, 2020
- KLA-Tencor Corporation
- Tal Marciano
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer overlay metrology target and complimentary overlay metr...
- Patent number 10,527,954
- Issue date Jan 7, 2020
- KLA-Tencor Corporation
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-layer overlay metrology target and complimentary overlay metr...
- Patent number 9,927,718
- Issue date Mar 27, 2018
- KLA-Tencor Corporation
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for providing tool induced shift using a sub-samp...
- Patent number 9,606,453
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Pavel Izikson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for estimating and correcting misregistration target inaccuracy
- Patent number 9,329,033
- Issue date May 3, 2016
- KLA-Tencor Corporation
- Eran Amit
- G01 - MEASURING TESTING
Information Patent Grant
Optics symmetrization for metrology
- Patent number 9,164,397
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing process tool correctables
- Patent number 9,052,709
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Guy Cohen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Imaging overlay metrology target and complimentary overlay metrolog...
- Patent number 9,007,585
- Issue date Apr 14, 2015
- KLA-Tencor Corporation
- Guy Cohen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reading array cell with matched reference cell
- Patent number 7,864,612
- Issue date Jan 4, 2011
- Spansion Israel Ltd
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Grant
Rd algorithm improvement for NROM technology
- Patent number 7,742,339
- Issue date Jun 22, 2010
- Saifun Semiconductors Ltd.
- Arik Rizel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and circuit for operating a non-volatile memory array
- Patent number 7,715,237
- Issue date May 11, 2010
- Saifun Semiconductors Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and circuit for programming a non-volatile memory array
- Patent number 7,675,782
- Issue date Mar 9, 2010
- Saifun Semiconductors Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating array cells with matched reference cells
- Patent number 7,457,183
- Issue date Nov 25, 2008
- Saifun Semiconductors Ltd.
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system, and circuit for operating a non-volatile memory array
- Patent number 7,352,627
- Issue date Apr 1, 2008
- Saifon Semiconductors Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for reading non-volatile memory cells
- Patent number 7,257,025
- Issue date Aug 14, 2007
- Saifun Semiconductors Ltd.
- Eduardo Maayan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for reading non-volatile memory cells
- Patent number 7,242,618
- Issue date Jul 10, 2007
- Saifun Semiconductors Ltd.
- Assaf Shappir
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and circuit for programming a non-volatile memory array
- Patent number 7,136,304
- Issue date Nov 14, 2006
- Saifun Semiconductor Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating array cells with matched reference cells
- Patent number 7,123,532
- Issue date Oct 17, 2006
- Saifun Semiconductors Ltd.
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Grant
Method circuit and system for read error detection in a non-volatil...
- Patent number 6,992,932
- Issue date Jan 31, 2006
- Saifun Semiconductors Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method circuit and system for determining a reference voltage
- Patent number 6,963,505
- Issue date Nov 8, 2005
- Aifun Semiconductors Ltd.
- Guy Cohen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETECTING RARE STOCHASTIC DEFECTS
- Publication number 20210373441
- Publication date Dec 2, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Guy Cohen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Estimating Amplitude and Phase Asymmetry in Imaging Technology for...
- Publication number 20200132445
- Publication date Apr 30, 2020
- KLA-Tencor Corporation
- Tal Marciano
- G01 - MEASURING TESTING
Information Patent Application
Multi-Layer Overlay Metrology Target and Complimentary Overlay Metr...
- Publication number 20180275530
- Publication date Sep 27, 2018
- KLA-Tencor Corporation
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR ESTIMATING AND CORRECTING MISREGISTRATION TARGET INACCURACY
- Publication number 20140060148
- Publication date Mar 6, 2014
- Eran Amit
- G01 - MEASURING TESTING
Information Patent Application
Overlay Targets with Orthogonal Underlayer Dummyfill
- Publication number 20130293890
- Publication date Nov 7, 2013
- KLA-Tencor Corporation
- Nuriel Amir
- G01 - MEASURING TESTING
Information Patent Application
Imaging Overlay Metrology Target and Complimentary Overlay Metrolog...
- Publication number 20130242305
- Publication date Sep 19, 2013
- KLA-Tencor Corporation
- Guy Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING A QUALITY METRIC FOR IMPROVED PROCE...
- Publication number 20130035888
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING TOOL INDUCED SHIFT USING A SUB-SAMP...
- Publication number 20120084041
- Publication date Apr 5, 2012
- KLA-Tencor Corporation
- Pavel Izikson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-LAYER OVERLAY METROLOGY TARGET AND COMPLIMENTARY OVERLAY METR...
- Publication number 20120033215
- Publication date Feb 9, 2012
- KLA-TECOR CORPORATION
- Daniel Kandel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICS SYMMETRIZATION FOR METROLOGY
- Publication number 20120033226
- Publication date Feb 9, 2012
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING PROCESS TOOL CORRECTABLES
- Publication number 20120029856
- Publication date Feb 2, 2012
- KLA-TENCOR CORPORATIOIN
- Guy Cohen
- G05 - CONTROLLING REGULATING
Information Patent Application
Reading array cell with matched reference cell
- Publication number 20090231915
- Publication date Sep 17, 2009
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Application
Rd Algorithm Improvement for Nrom Technology
- Publication number 20090003073
- Publication date Jan 1, 2009
- Arik Rizel
- G11 - INFORMATION STORAGE
Information Patent Application
Method, system and circuit for operating a non-volatile memory array
- Publication number 20080180999
- Publication date Jul 31, 2008
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Application
Method, system, and circuit for operating a non-volatile memory array
- Publication number 20070153575
- Publication date Jul 5, 2007
- Saifun Semiconductors, Ltd.
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Application
Operating array cells with matched reference cells
- Publication number 20070133276
- Publication date Jun 14, 2007
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Application
Method, system and circuit for programing a non-volatile memory array
- Publication number 20070115726
- Publication date May 24, 2007
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Application
Methods for preventing fixed pattern programming
- Publication number 20060181934
- Publication date Aug 17, 2006
- Saifun Semiconductors, Ltd.
- Assaf Shappir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for reading non-volatile memory cells
- Publication number 20060126383
- Publication date Jun 15, 2006
- Saifun Semiconductors, Ltd.
- Assaf Shappir
- G11 - INFORMATION STORAGE
Information Patent Application
Method for reading non-volatile memory cells
- Publication number 20060126382
- Publication date Jun 15, 2006
- Eduardo Maayan
- G11 - INFORMATION STORAGE
Information Patent Application
Operating array cells with matched reference cells
- Publication number 20060018153
- Publication date Jan 26, 2006
- Saifun Semiconductors, Ltd.
- Eli Lusky
- G11 - INFORMATION STORAGE
Information Patent Application
Method, system and circuit for programming a non-volatile memory array
- Publication number 20050105337
- Publication date May 19, 2005
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Application
Method circuit and system for read error detection in a non-volatil...
- Publication number 20040136236
- Publication date Jul 15, 2004
- Guy Cohen
- G11 - INFORMATION STORAGE
Information Patent Application
Method circuit and system for determining a reference voltage
- Publication number 20040136220
- Publication date Jul 15, 2004
- Guy Cohen
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

System and method for detecting rare stochastic defects

Overlay targets with orthogonal underlayer dummyfill

Estimating amplitude and phase asymmetry in imaging technology for...

Multi-layer overlay metrology target and complimentary overlay metr...

Multi-layer overlay metrology target and complimentary overlay metr...

Method and system for providing tool induced shift using a sub-samp...

Method for estimating and correcting misregistration target inaccuracy

Optics symmetrization for metrology

Method and system for providing process tool correctables

Imaging overlay metrology target and complimentary overlay metrolog...

Reading array cell with matched reference cell

Rd algorithm improvement for NROM technology

Method, system and circuit for operating a non-volatile memory array

Method, system and circuit for programming a non-volatile memory array

Operating array cells with matched reference cells

Method, system, and circuit for operating a non-volatile memory array

Method for reading non-volatile memory cells

Method for reading non-volatile memory cells

Method, system and circuit for programming a non-volatile memory array

Operating array cells with matched reference cells

Method circuit and system for read error detection in a non-volatil...

Method circuit and system for determining a reference voltage

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR DETECTING RARE STOCHASTIC DEFECTS

Estimating Amplitude and Phase Asymmetry in Imaging Technology for...

Multi-Layer Overlay Metrology Target and Complimentary Overlay Metr...

METHOD FOR ESTIMATING AND CORRECTING MISREGISTRATION TARGET INACCURACY

Overlay Targets with Orthogonal Underlayer Dummyfill

Imaging Overlay Metrology Target and Complimentary Overlay Metrolog...

METHOD AND SYSTEM FOR PROVIDING A QUALITY METRIC FOR IMPROVED PROCE...

METHOD AND SYSTEM FOR PROVIDING TOOL INDUCED SHIFT USING A SUB-SAMP...

MULTI-LAYER OVERLAY METROLOGY TARGET AND COMPLIMENTARY OVERLAY METR...

OPTICS SYMMETRIZATION FOR METROLOGY

METHOD AND SYSTEM FOR PROVIDING PROCESS TOOL CORRECTABLES

Reading array cell with matched reference cell

Rd Algorithm Improvement for Nrom Technology

Method, system and circuit for operating a non-volatile memory array

Method, system, and circuit for operating a non-volatile memory array

Operating array cells with matched reference cells

Method, system and circuit for programing a non-volatile memory array

Methods for preventing fixed pattern programming

Method for reading non-volatile memory cells

Method for reading non-volatile memory cells

Operating array cells with matched reference cells

Method, system and circuit for programming a non-volatile memory array

Method circuit and system for read error detection in a non-volatil...

Method circuit and system for determining a reference voltage