Hari Balachandran

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
All digital built-in self-test circuit for phase-locked loops
- Patent number 6,661,266
- Issue date Dec 9, 2003
- Texas Instruments Incorporated
- Pramodchandran N. Variyam
- G01 - MEASURING TESTING
Information Patent Grant
System and method for pruning a bridging diagnostic list
- Patent number 6,618,830
- Issue date Sep 9, 2003
- Texas Instruments Incorporated
- Hari Balachandran
- G01 - MEASURING TESTING
Information Patent Grant
System for mapping logical functional test data of logical integrat...
- Patent number 6,553,329
- Issue date Apr 22, 2003
- Texas Instruments Incorporated
- Hari Balachandran
- G01 - MEASURING TESTING
Information Patent Grant
IC test software system for mapping logical functional test data of...
- Patent number 6,185,707
- Issue date Feb 6, 2001
- Knights Technology, Inc.
- Shawn Smith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Simultaneous scan testing for identical modules
- Publication number 20060242508
- Publication date Oct 26, 2006
- TEXAS INSTRUMENTS INCORPORATION
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for efficient burn-in of electronic circuits
- Publication number 20030149913
- Publication date Aug 7, 2003
- Hari Balachandran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for mapping logical functional test data of logical integrat...
- Publication number 20020010560
- Publication date Jan 24, 2002
- Hari Balachandran
- G01 - MEASURING TESTING