Haruhiko Yoshioka

Person

Yamanashi-Ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Vacuum prober and vacuum probe method
- Patent number 7,221,176
- Issue date May 22, 2007
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Stage driving apparatus and probe method
- Patent number 7,106,082
- Issue date Sep 12, 2006
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Prober
- Patent number 6,933,736
- Issue date Aug 23, 2005
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 6,927,587
- Issue date Aug 9, 2005
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Probing method
- Patent number 6,850,052
- Issue date Feb 1, 2005
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Drivingly rotatable mechanism of specimen loading table and specime...
- Patent number 6,634,245
- Issue date Oct 21, 2003
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 6,262,570
- Issue date Jul 17, 2001
- Tokyo Electron Limited
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe method
- Patent number 6,140,828
- Issue date Oct 31, 2000
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,912,555
- Issue date Jun 15, 1999
- Tokyo Electron Limited
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus with tilt correction mechanisms
- Patent number 5,804,983
- Issue date Sep 8, 1998
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober
- Patent number D383683
- Issue date Sep 16, 1997
- Tokyo Electron Limited
- Osamu Kamata
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Probe apparatus for correcting the probe card posture before testing
- Patent number 5,642,056
- Issue date Jun 24, 1997
- Tokyo Electron Limited
- Hisashi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and probe method
- Patent number 5,640,101
- Issue date Jun 17, 1997
- Tokyo Electron Limited
- Motohiro Kuji
- G01 - MEASURING TESTING
Information Patent Grant
Probe system having vertical height detection and double focal imag...
- Patent number 5,585,738
- Issue date Dec 17, 1996
- Tokyo Electron Limited
- Motohiro Kuji
- G01 - MEASURING TESTING
Information Patent Grant
Method of ashing layers, and apparatus for ashing layers
- Patent number 4,812,201
- Issue date Mar 14, 1989
- Tokyo Electron Limited
- Hiroyuki Sakai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Probe apparatus
- Publication number 20050253611
- Publication date Nov 17, 2005
- TOKYO ELECTRON LIMITED
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Vacuum prober and vacuum probe method
- Publication number 20050206396
- Publication date Sep 22, 2005
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Stage driving apparatus and probe method
- Publication number 20050127898
- Publication date Jun 16, 2005
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Prober
- Publication number 20040164759
- Publication date Aug 26, 2004
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Probe apparatus
- Publication number 20040036861
- Publication date Feb 26, 2004
- TOKYO ELECTRON LIMITED
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Probing method
- Publication number 20030025495
- Publication date Feb 6, 2003
- TOKYO ELECTRON LTD.
- Shinji Ilno
- G01 - MEASURING TESTING

Haruhiko Yoshioka

Person

Patents Grantslast 30 patents

Vacuum prober and vacuum probe method

Stage driving apparatus and probe method

Prober

Probe apparatus

Probing method

Drivingly rotatable mechanism of specimen loading table and specime...

Probe apparatus

Prober and probe method

Probe apparatus

Probe apparatus with tilt correction mechanisms

Wafer prober

Probe apparatus for correcting the probe card posture before testing

Probe system and probe method

Probe system having vertical height detection and double focal imag...

Method of ashing layers, and apparatus for ashing layers

Patents Applicationslast 30 patents

Probe apparatus

Vacuum prober and vacuum probe method

Stage driving apparatus and probe method

Prober

Probe apparatus

Probing method