Heinz Mattes

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for the characterization of analog-to-digital...
- Patent number RE47805
- Issue date Jan 7, 2020
- Infineon Technologies AG
- Heinz Mattes
Information Patent Grant
Apparatus and method for the characterization of analog-to-digital...
- Patent number 9,088,294
- Issue date Jul 21, 2015
- Infineon Technologies AG
- Heinz Mattes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal generating circuit
- Patent number 8,860,592
- Issue date Oct 14, 2014
- Infineon Technologies AG
- Heinz Mattes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Evaluation circuit and method for detecting and/or locating faulty...
- Patent number 8,060,800
- Issue date Nov 15, 2011
- Infineon Technologies AG
- Michael Goessel
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for measuring relative phase shifts of...
- Patent number 7,945,406
- Issue date May 17, 2011
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for digitized test responses, method for testing sem...
- Patent number 7,720,645
- Issue date May 18, 2010
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit for measuring times and method for measuring times
- Patent number 7,653,170
- Issue date Jan 26, 2010
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for estimating channel properties of a transmissi...
- Patent number 7,561,639
- Issue date Jul 14, 2009
- Infineon Technologies AG
- Peter Gregorius
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for measuring jitter
- Patent number 7,558,991
- Issue date Jul 7, 2009
- Infineon Technologies AG
- Heinz Mattes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic test circuit for an integrated circuit and methods for t...
- Patent number 7,471,220
- Issue date Dec 30, 2008
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing integrated circuits
- Patent number 7,400,995
- Issue date Jul 15, 2008
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and method for testing analog/digital converters
- Patent number 7,391,349
- Issue date Jun 24, 2008
- Infineon Technologies AG
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus with low-reflection signal distribution
- Patent number 7,355,414
- Issue date Apr 8, 2008
- Infineon Technologies, AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Method and filter arrangement for digital recursive filtering in th...
- Patent number 7,290,022
- Issue date Oct 30, 2007
- Infineon Technologies AG
- Heinz Mattes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical circuit and method for testing integrated circuits
- Patent number 7,256,602
- Issue date Aug 14, 2007
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method for mixed-signal semiconductor compo...
- Patent number 7,206,712
- Issue date Apr 17, 2007
- Infineon Technologies AG
- Sebastian Sattler
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the delay time of a signal line
- Patent number 7,154,809
- Issue date Dec 26, 2006
- Infineon Technologies AG
- Peter Gregorius
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for recording, communicating and administering...
- Patent number 6,038,295
- Issue date Mar 14, 2000
- Siemens Aktiengesellschaft
- Heinz Mattes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit with memory programmable pad driver
- Patent number 5,834,955
- Issue date Nov 10, 1998
- Siemens Aktiengesellschaft
- Herbert Eichfeld
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method in a parallel test apparatus for semiconductor memories
- Patent number 5,224,107
- Issue date Jun 29, 1993
- Siemens Aktiengesellschaft
- Heinz Mattes
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR THE CHARACTERIZATION OF ANALOG-TO-DIGITAL...
- Publication number 20140333464
- Publication date Nov 13, 2014
- INFINEON TECHNOLOGIES AG
- Heinz MATTES
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST CIRCUIT
- Publication number 20140098847
- Publication date Apr 10, 2014
- Heinz MATTES
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SIGNAL GENERATING CIRCUIT
- Publication number 20140097976
- Publication date Apr 10, 2014
- Heinz MATTES
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR THE ANALYSIS OF A PERIODIC SIGNAL
- Publication number 20100079170
- Publication date Apr 1, 2010
- INFINEON TECHNOLOGIES AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Evaluation Circuit and Method for Detecting and/or Locating Faulty...
- Publication number 20080040638
- Publication date Feb 14, 2008
- Michael Goessel
- G01 - MEASURING TESTING
Information Patent Application
Measuring device and method for measuring relative phase shifts of...
- Publication number 20070226602
- Publication date Sep 27, 2007
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus And Method For Testing Analog/Digital Converters
- Publication number 20070216555
- Publication date Sep 20, 2007
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic Test Circuit For An Integrated Circuit And Methods For T...
- Publication number 20070176807
- Publication date Aug 2, 2007
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for digitized test responses, method for testing sem...
- Publication number 20070089010
- Publication date Apr 19, 2007
- Stephane Kirmser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device and method for testing integrated circuits
- Publication number 20070067129
- Publication date Mar 22, 2007
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Device and method for measuring jitter
- Publication number 20060291548
- Publication date Dec 28, 2006
- Heinz Mattes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrical circuit for measuring times and method for measuring times
- Publication number 20060274607
- Publication date Dec 7, 2006
- Heinz Mattes
- G04 - HOROLOGY
Information Patent Application
Test apparatus and test method for mixed-signal semiconductor compo...
- Publication number 20060238392
- Publication date Oct 26, 2006
- Sebastian Sattler
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with low-reflection signal distribution
- Publication number 20060186896
- Publication date Aug 24, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
Electrical circuit and method for testing integrated circuits
- Publication number 20050231228
- Publication date Oct 20, 2005
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Method and device for estimating channel properties of a transmissi...
- Publication number 20050111591
- Publication date May 26, 2005
- Peter Gregorius
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and filter arrangement for digital recursive filtering in th...
- Publication number 20050108311
- Publication date May 19, 2005
- Heinz Mattes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for measuring the delay time of a signal line
- Publication number 20040210414
- Publication date Oct 21, 2004
- Peter Gregorius
- G11 - INFORMATION STORAGE

Heinz Mattes

Person

Patents Grantslast 30 patents

Apparatus and method for the characterization of analog-to-digital...

Apparatus and method for the characterization of analog-to-digital...

Signal generating circuit

Evaluation circuit and method for detecting and/or locating faulty...

Measuring device and method for measuring relative phase shifts of...

Test apparatus for digitized test responses, method for testing sem...

Electrical circuit for measuring times and method for measuring times

Method and device for estimating channel properties of a transmissi...

Device and method for measuring jitter

Electronic test circuit for an integrated circuit and methods for t...

Device and method for testing integrated circuits

Test apparatus and method for testing analog/digital converters

Test apparatus with low-reflection signal distribution

Method and filter arrangement for digital recursive filtering in th...

Electrical circuit and method for testing integrated circuits

Test apparatus and test method for mixed-signal semiconductor compo...

Method for measuring the delay time of a signal line

Apparatus and method for recording, communicating and administering...

Integrated circuit with memory programmable pad driver

Method in a parallel test apparatus for semiconductor memories

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR THE CHARACTERIZATION OF ANALOG-TO-DIGITAL...

TEST CIRCUIT

SIGNAL GENERATING CIRCUIT

APPARATUS AND METHOD FOR THE ANALYSIS OF A PERIODIC SIGNAL

Evaluation Circuit and Method for Detecting and/or Locating Faulty...

Measuring device and method for measuring relative phase shifts of...

Test Apparatus And Method For Testing Analog/Digital Converters

Electronic Test Circuit For An Integrated Circuit And Methods For T...

Test apparatus for digitized test responses, method for testing sem...

Device and method for testing integrated circuits

Device and method for measuring jitter

Electrical circuit for measuring times and method for measuring times

Test apparatus and test method for mixed-signal semiconductor compo...

Test apparatus with low-reflection signal distribution

Electrical circuit and method for testing integrated circuits

Method and device for estimating channel properties of a transmissi...

Method and filter arrangement for digital recursive filtering in th...

Method for measuring the delay time of a signal line