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Hideshi Maeno
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Itami, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and diagnostic method therefor
Patent number
10,580,513
Issue date
Mar 3, 2020
Renesas Electronics Corporation
Yoichi Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device and diagnosis method thereof
Patent number
10,504,609
Issue date
Dec 10, 2019
Renesas Electronics Corporation
Yoichi Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit with test circuit
Patent number
7,441,169
Issue date
Oct 21, 2008
Renesas Technology Corp.
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit with test circuit
Patent number
7,149,942
Issue date
Dec 12, 2006
Renesas Technology Corp.
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit device having a test circuit of a...
Patent number
6,964,000
Issue date
Nov 8, 2005
Renesas Technology Corp.
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit with a scan path circuit
Patent number
6,678,846
Issue date
Jan 13, 2004
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit device with fault analysis function
Patent number
6,571,364
Issue date
May 27, 2003
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device
Patent number
6,516,431
Issue date
Feb 4, 2003
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing method and test apparatus in semiconductor apparatus
Patent number
6,504,772
Issue date
Jan 7, 2003
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit
Patent number
6,420,896
Issue date
Jul 16, 2002
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Electronic system with self-test function and simulation circuit fo...
Patent number
6,401,226
Issue date
Jun 4, 2002
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit device
Patent number
6,400,292
Issue date
Jun 4, 2002
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit device with test circuit
Patent number
6,397,363
Issue date
May 28, 2002
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device
Patent number
6,286,121
Issue date
Sep 4, 2001
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and a redundancy circuit for an internal memory circuit
Patent number
6,275,963
Issue date
Aug 14, 2001
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit device
Patent number
6,229,741
Issue date
May 8, 2001
Mitsubishi Denki Kabushiki Kaisha Chiyoda-Ku
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit
Patent number
5,960,008
Issue date
Sep 28, 1999
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor memory testing device
Patent number
5,946,247
Issue date
Aug 31, 1999
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit
Patent number
5,905,737
Issue date
May 18, 1999
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Scan path forming circuit
Patent number
5,903,579
Issue date
May 11, 1999
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for testing content addressable memory circuit an...
Patent number
5,848,074
Issue date
Dec 8, 1998
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory
Patent number
5,841,690
Issue date
Nov 24, 1998
Mitsubishi Denki Kabushiki Kaisha
Koji Shibutani
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit device having multi-port RAM memor...
Patent number
5,829,015
Issue date
Oct 27, 1998
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory device and method of reading data therefrom
Patent number
5,818,776
Issue date
Oct 6, 1998
Mitsubishi Denki Kabushiki Kaisha
Koji Shibutani
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory testing device
Patent number
5,815,512
Issue date
Sep 29, 1998
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory device with reduced probability of power consu...
Patent number
5,787,033
Issue date
Jul 28, 1998
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Flip-flop circuit, scan path and storage circuit
Patent number
5,784,384
Issue date
Jul 21, 1998
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory circuit, data control circuit of memory circuit and address...
Patent number
5,771,194
Issue date
Jun 23, 1998
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory and layout/circuit information generating appa...
Patent number
5,742,540
Issue date
Apr 21, 1998
Mitsubishi Denki Kabushiki Kaisha
Hirohiko Wakasugi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory device having scan path for testing
Patent number
5,724,367
Issue date
Mar 3, 1998
Mitsubishi Denki Kabushiki Kaisha
Tokuya Osawa
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSTIC METHOD THEREFOR
Publication number
20180277237
Publication date
Sep 27, 2018
RENESAS ELECTRONICS CORPORATION
Yoichi MAEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSIS METHOD THEREOF
Publication number
20180090225
Publication date
Mar 29, 2018
RENESAS ELECTRONICS CORPORATION
Yoichi MAEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT WITH MEMORY REPAIR CIRCUIT
Publication number
20110161751
Publication date
Jun 30, 2011
Renesas Electronics Corporation
Hideshi MAENO
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT WITH MEMORY REPAIR CIRCUIT
Publication number
20090158087
Publication date
Jun 18, 2009
RENESAS TECHNOLOGY CORP.
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor integrated circuit with test circuit
Publication number
20070168802
Publication date
Jul 19, 2007
RENESAS TECHNOLOGY CORP.
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit with test circuit
Publication number
20040117706
Publication date
Jun 17, 2004
RENESA'S TECHNOLOGY CORP.
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit device with test circuit
Publication number
20040117704
Publication date
Jun 17, 2004
RENESAS TECHNOLOGY CORPORATION
Hideshi Maeno
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit device having a test circuit of a...
Publication number
20040059976
Publication date
Mar 25, 2004
Mitsubishi Denki Kabushiki Kaisha
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20020062458
Publication date
May 23, 2002
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Application
Testing method and test apparatus in semiconductor apparatus
Publication number
20010009523
Publication date
Jul 26, 2001
Hideshi Maeno
G11 - INFORMATION STORAGE