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Hiroaki Takasu

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
    • Publication number 20230010077
    • Publication date Jan 12, 2023
    • ABLIC Inc.
    • Riki NAGASAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20220238510
    • Publication date Jul 28, 2022
    • ABLIC Inc.
    • Hiroaki TAKASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
    • Publication number 20210013114
    • Publication date Jan 14, 2021
    • ABLIC Inc.
    • Hiroaki TAKASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
    • Publication number 20200293553
    • Publication date Sep 17, 2020
    • NS Solutios Corporation
    • Isao SONOBE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20200295124
    • Publication date Sep 17, 2020
    • ABLIC Inc.
    • Hiroaki TAKASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND SEMICONDUCTOR CHIP
    • Publication number 20200006260
    • Publication date Jan 2, 2020
    • ABLIC Inc.
    • Hiroaki TAKASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20190305075
    • Publication date Oct 3, 2019
    • ABLIC Inc.
    • Hiroaki TAKASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20130187232
    • Publication date Jul 25, 2013
    • Seiko Instruments Inc.
    • Hiroaki TAKASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Nonvolatile semiconductor memory device
    • Publication number 20120168844
    • Publication date Jul 5, 2012
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Nonvolatile semiconductor memory device
    • Publication number 20120168845
    • Publication date Jul 5, 2012
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    IMAGE SENSOR IC
    • Publication number 20120161272
    • Publication date Jun 28, 2012
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Nonvolatile semiconductor memory device
    • Publication number 20120153375
    • Publication date Jun 21, 2012
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device and method of manufacturing semiconductor device
    • Publication number 20110278686
    • Publication date Nov 17, 2011
    • Atsushi Iwasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110163384
    • Publication date Jul 7, 2011
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20110073948
    • Publication date Mar 31, 2011
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20110073947
    • Publication date Mar 31, 2011
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20090152633
    • Publication date Jun 18, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090121223
    • Publication date May 14, 2009
    • Seiko Instruments Inc.
    • Hiroaki Takasu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Field effect transistor formed on an insulating substrate and integ...
    • Publication number 20090101973
    • Publication date Apr 23, 2009
    • Yutaka Hayashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090050966
    • Publication date Feb 26, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090050969
    • Publication date Feb 26, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090050967
    • Publication date Feb 26, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090050968
    • Publication date Feb 26, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090039431
    • Publication date Feb 12, 2009
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20080197425
    • Publication date Aug 21, 2008
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20080191308
    • Publication date Aug 14, 2008
    • SEIKO INSTRUMENTS INC.
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Image sensor IC
    • Publication number 20080150070
    • Publication date Jun 26, 2008
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Image sensor IC
    • Publication number 20080150068
    • Publication date Jun 26, 2008
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20080001146
    • Publication date Jan 3, 2008
    • Hiroaki Takasu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device
    • Publication number 20070291148
    • Publication date Dec 20, 2007
    • Hiroaki Takasu
    • H01 - BASIC ELECTRIC ELEMENTS