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Hirotada TERANISHI

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  • Osaka-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe pin and electronic device using the same
    • Patent number 11,187,722
    • Issue date Nov 30, 2021
    • Omron Corporation
    • Hirotada Teranishi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe pin, inspection jig, inspection unit and inspection device
    • Patent number 10,962,564
    • Issue date Mar 30, 2021
    • Omron Corporation
    • Naoya Sasano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin and inspection unit
    • Patent number 10,928,420
    • Issue date Feb 23, 2021
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket
    • Patent number 10,598,695
    • Issue date Mar 24, 2020
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin and inspection device including probe pin
    • Patent number 10,557,867
    • Issue date Feb 11, 2020
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin
    • Patent number 10,534,016
    • Issue date Jan 14, 2020
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin
    • Patent number 10,145,862
    • Issue date Dec 4, 2018
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin and electronic device using the same
    • Patent number 9,797,925
    • Issue date Oct 24, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Contact and electrical connection testing apparatus using the same
    • Patent number 9,797,926
    • Issue date Oct 24, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe pin
    • Patent number D794480
    • Issue date Aug 15, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D792793
    • Issue date Jul 25, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D792255
    • Issue date Jul 18, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D792253
    • Issue date Jul 18, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D792256
    • Issue date Jul 18, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D792254
    • Issue date Jul 18, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D789223
    • Issue date Jun 13, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D789224
    • Issue date Jun 13, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D789225
    • Issue date Jun 13, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D788616
    • Issue date Jun 6, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D788615
    • Issue date Jun 6, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Electroformed component production method
    • Patent number 9,598,784
    • Issue date Mar 21, 2017
    • Omron Corporation
    • Yoshinobu Hemmi
    • C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
  • Information Patent Grant

    Probe pin having a first plunger with a guide projection slidingly...
    • Patent number 9,595,773
    • Issue date Mar 14, 2017
    • Omron Corporation
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Connecting mechanism having two contacts with contact surfaces incl...
    • Patent number 9,590,346
    • Issue date Mar 7, 2017
    • Omron Corporation
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe pin
    • Patent number D776552
    • Issue date Jan 17, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D776551
    • Issue date Jan 17, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D775984
    • Issue date Jan 10, 2017
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D769750
    • Issue date Oct 25, 2016
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D769751
    • Issue date Oct 25, 2016
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D769747
    • Issue date Oct 25, 2016
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Probe pin
    • Patent number D769748
    • Issue date Oct 25, 2016
    • Omron Corporation
    • Hirotada Teranishi
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE PIN AND ELECTRONIC DEVICE USING THE SAME
    • Publication number 20210215740
    • Publication date Jul 15, 2021
    • Omron Corporation
    • Hirotada Teranishi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBE PIN
    • Publication number 20200158753
    • Publication date May 21, 2020
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN AND INSPECTION UNIT
    • Publication number 20190361049
    • Publication date Nov 28, 2019
    • Omron Corporation
    • Hirotada Teranishi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBE PIN, INSPECTION JIG, INSPECTION UNIT AND INSPECTION DEVICE
    • Publication number 20190242926
    • Publication date Aug 8, 2019
    • Omron Corporation
    • Naoya Sasano
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET
    • Publication number 20190128922
    • Publication date May 2, 2019
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN
    • Publication number 20190094269
    • Publication date Mar 28, 2019
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN AND INSPECTION DEVICE INCLUDING PROBE PIN
    • Publication number 20180340957
    • Publication date Nov 29, 2018
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    KELVIN PROBE AND KELVIN INSPECTION UNIT PROVIDED WITH SAME
    • Publication number 20180011127
    • Publication date Jan 11, 2018
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION TERMINAL UNIT, PROBE CARD, AND METHOD FOR MANUFACTURING...
    • Publication number 20170234907
    • Publication date Aug 17, 2017
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN AND ELECTRONIC DEVICE USING THE SAME
    • Publication number 20170138985
    • Publication date May 18, 2017
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN
    • Publication number 20170115324
    • Publication date Apr 27, 2017
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE PIN AND ELECTRONIC DEVICE USING SAME
    • Publication number 20170074903
    • Publication date Mar 16, 2017
    • Omron Corporation
    • Hirotada TERANISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONNECTING MECHANISM
    • Publication number 20160126656
    • Publication date May 5, 2016
    • Omron Corporation
    • Yoshinobu Hemmi
    • B32 - LAYERED PRODUCTS
  • Information Patent Application

    ELECTROFORMED COMPONENT PRODUCTION METHOD
    • Publication number 20160115610
    • Publication date Apr 28, 2016
    • Omron Corporation
    • Yoshinobu Hemmi
    • C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
  • Information Patent Application

    PROBE PIN AND ELECTRONIC DEVICE USING THE SAME
    • Publication number 20160072202
    • Publication date Mar 10, 2016
    • Omron Corporation
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CONTACT AND ELECTRICAL CONNECTION TESTING APPARATUS USING THE SAME
    • Publication number 20150276808
    • Publication date Oct 1, 2015
    • Omron Corporation
    • Hirotada Teranishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONNECTION TERMINAL AND CONNECTOR USING SAME
    • Publication number 20150064981
    • Publication date Mar 5, 2015
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    OPTICAL ENCODER LIGHT SHIELDING PLATE, PRODUCING METHOD THEROF, AND...
    • Publication number 20150053851
    • Publication date Feb 26, 2015
    • Omron Corporation
    • Rikuo Kawamura
    • C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
  • Information Patent Application

    CONNECTION TERMINAL AND CONNECTOR USING SAME
    • Publication number 20150031234
    • Publication date Jan 29, 2015
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL
    • Publication number 20140315449
    • Publication date Oct 23, 2014
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL
    • Publication number 20140213097
    • Publication date Jul 31, 2014
    • OMRON CORPORATION
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL
    • Publication number 20140213125
    • Publication date Jul 31, 2014
    • Omron Corporation
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CONNECTION TERMINAL AND CONNECTOR PROVIDED THEREWITH
    • Publication number 20140038469
    • Publication date Feb 6, 2014
    • Omron Corporation
    • Takahiro SAKAI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    BRUSH
    • Publication number 20140038435
    • Publication date Feb 6, 2014
    • Omron Corporation
    • Yoshinobu HEMMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL AND CONNECTOR USING SAME
    • Publication number 20140017946
    • Publication date Jan 16, 2014
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL AND CONNECTOR USING THE SAME
    • Publication number 20120238141
    • Publication date Sep 20, 2012
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL AND CONNECTOR WITH TERMINAL
    • Publication number 20120171905
    • Publication date Jul 5, 2012
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL AND CONNECTOR USING THE SAME
    • Publication number 20120108111
    • Publication date May 3, 2012
    • Omron Corporation
    • Jiro Koyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL SUPPORT STRUCTURE
    • Publication number 20110212655
    • Publication date Sep 1, 2011
    • Omron Corporation
    • Yoshinobu Hemmi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MOUNTING COMPONENT, ELECTRONIC DEVICE, AND MOUNTING METHOD
    • Publication number 20110201217
    • Publication date Aug 18, 2011
    • Omron Corporation
    • Jiro Koyama
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR