HIROYUKI AMISHIRO

Person

TOKYO, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 8,089,136
- Issue date Jan 3, 2012
- Renesas Electronics Corporation
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having resistor elements and method for manufa...
- Patent number 7,821,078
- Issue date Oct 26, 2010
- Renesas Electronics Corporation
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with resistor elements formed on insulating film
- Patent number 7,045,865
- Issue date May 16, 2006
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 6,838,732
- Issue date Jan 4, 2005
- Renesas Technology Corp.
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a plurality of interconnection layer...
- Patent number 6,835,647
- Issue date Dec 28, 2004
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and pattern for evaluating semiconductor device c...
- Patent number 6,779,160
- Issue date Aug 17, 2004
- Renesas Technology Corp.
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including a plurality of interconnection layer...
- Patent number 6,541,862
- Issue date Apr 1, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and pattern for evaluating semiconductor device c...
- Patent number 6,518,592
- Issue date Feb 11, 2003
- Mitsubushi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a semiconductor device having a plurality of cir...
- Patent number 6,468,857
- Issue date Oct 22, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an improved multi-layer interconnection...
- Patent number 6,445,071
- Issue date Sep 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for evaluating characteristic of insulated gate transistor
- Patent number 6,407,573
- Issue date Jun 18, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with electrical isolation means
- Patent number 6,299,314
- Issue date Oct 9, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a plurality of interconnection layers
- Patent number 6,288,447
- Issue date Sep 11, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with gate electrode portion and method of manu...
- Patent number 6,037,630
- Issue date Mar 14, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnection structure of semiconductor device
- Patent number 5,600,170
- Issue date Feb 4, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Masao Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Module cell generating device for a semiconductor integrated circuit
- Patent number 5,394,338
- Issue date Feb 28, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Hirofumi Shinohara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device for storing a plurality of data on a wo...
- Patent number 5,243,560
- Issue date Sep 7, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTER
- Publication number 20230215921
- Publication date Jul 6, 2023
- Mitsubishi Electric Corporation
- Yuichi NAGAHISA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTER
- Publication number 20230133459
- Publication date May 4, 2023
- Mitsubishi Electric Corporation
- Takanori TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20110012231
- Publication date Jan 20, 2011
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20080116526
- Publication date May 22, 2008
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20060175679
- Publication date Aug 10, 2006
- Renesas Technology Corp.
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including a plurality of interconnection layer...
- Publication number 20030146516
- Publication date Aug 7, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus, method and pattern for evaluating semiconductor device c...
- Publication number 20030126567
- Publication date Jul 3, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of arranging transistors for formin...
- Publication number 20030030075
- Publication date Feb 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and method of fabricating the semiconductor de...
- Publication number 20030015798
- Publication date Jan 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an improved multi-layer interconnection...
- Publication number 20030001270
- Publication date Jan 2, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating a semiconductor device
- Publication number 20020180047
- Publication date Dec 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device evaluation method and apparatus, semiconductor...
- Publication number 20020167034
- Publication date Nov 14, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20020145156
- Publication date Oct 10, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20020123202
- Publication date Sep 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20020081846
- Publication date Jun 27, 2002
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR EVALUATING CHARACTERISTIC OF INSULATED GATE TRANSISTOR
- Publication number 20020063572
- Publication date May 30, 2002
- KENJI YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing same
- Publication number 20020028569
- Publication date Mar 7, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Motoshige Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including a plurality of interconnection layer...
- Publication number 20020024141
- Publication date Feb 28, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Amishiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a structure of a multilayer interconnec...
- Publication number 20010048162
- Publication date Dec 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hideyo Haruhana
- H01 - BASIC ELECTRIC ELEMENTS

HIROYUKI AMISHIRO

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device having resistor elements and method for manufa...

Semiconductor device with resistor elements formed on insulating film

Semiconductor device and method for manufacturing the same

Semiconductor device including a plurality of interconnection layer...

Apparatus, method and pattern for evaluating semiconductor device c...

Semiconductor device including a plurality of interconnection layer...

Apparatus, method and pattern for evaluating semiconductor device c...

Method for forming a semiconductor device having a plurality of cir...

Semiconductor device having an improved multi-layer interconnection...

Device for evaluating characteristic of insulated gate transistor

Semiconductor device with electrical isolation means

Semiconductor device including a plurality of interconnection layers

Semiconductor device with gate electrode portion and method of manu...

Interconnection structure of semiconductor device

Module cell generating device for a semiconductor integrated circuit

Semiconductor memory device for storing a plurality of data on a wo...

Patents Applicationslast 30 patents

SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTER

SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTER

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing the same

Semiconductor device including a plurality of interconnection layer...

Apparatus, method and pattern for evaluating semiconductor device c...

Semiconductor device and method of arranging transistors for formin...

Semiconductor device and method of fabricating the semiconductor de...

Semiconductor device having an improved multi-layer interconnection...

Method of fabricating a semiconductor device

Semiconductor device evaluation method and apparatus, semiconductor...

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing the same

Semiconductor device

DEVICE FOR EVALUATING CHARACTERISTIC OF INSULATED GATE TRANSISTOR

Semiconductor device and method of manufacturing same

Semiconductor device including a plurality of interconnection layer...

Semiconductor device having a structure of a multilayer interconnec...