Hiroyuki Umimoto

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor device including a stress film
- Patent number 8,383,486
- Issue date Feb 26, 2013
- Panasonic Corporation
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a stress film
- Patent number 8,203,186
- Issue date Jun 19, 2012
- Panasonic Corporation
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including MISFET having internal stress film
- Patent number 7,893,501
- Issue date Feb 22, 2011
- Panasonic Corporation
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having internal stress film
- Patent number 7,417,289
- Issue date Aug 26, 2008
- Matsushita Electric Industrial Co., Ltd.
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,265,450
- Issue date Sep 4, 2007
- Matsushita Electric Industrial Co., Ltd.
- Takato Handa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a MISFET and a MIS capacitor
- Patent number 7,259,418
- Issue date Aug 21, 2007
- Matsushita Electric Industrial Co., Ltd.
- Tadashi Kadowaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having internal stress film
- Patent number 7,205,615
- Issue date Apr 17, 2007
- Matsushita Electric Industrial Co., Ltd.
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device having a pocket dopan...
- Patent number 7,091,093
- Issue date Aug 15, 2006
- Matsushita Electric Industrial Co., Ltd.
- Taiji Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,067,382
- Issue date Jun 27, 2006
- Matsushita Electric Industrial Co., Ltd.
- Hiroaki Nakaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,034,407
- Issue date Apr 25, 2006
- Matsushita Electric Industrial Co., Ltd.
- Masahiro Imade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 6,921,933
- Issue date Jul 26, 2005
- Matsushita Electric Industrial Co., Ltd.
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and capacitance measurement method
- Patent number 6,894,520
- Issue date May 17, 2005
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of checking semiconductor storage d...
- Patent number 6,876,208
- Issue date Apr 5, 2005
- Renesas Technology Corp.
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device including using a har...
- Patent number 6,821,830
- Issue date Nov 23, 2004
- Matsushita Electric Industrial Co., Ltd.
- Takato Handa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 6,768,201
- Issue date Jul 27, 2004
- Matsushita Electric Industrial Co., Ltd.
- Masahiro Imade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 6,764,921
- Issue date Jul 20, 2004
- Matsushita Electric Industrial Co., Ltd.
- Masahiro Imade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 6,667,216
- Issue date Dec 23, 2003
- Matsushita Electronics Corporation
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 6,660,601
- Issue date Dec 9, 2003
- Matsushita Electric Industrial Co., Ltd.
- Satoe Miyata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 6,432,802
- Issue date Aug 13, 2002
- Matsushita Electronics Corporation
- Taiji Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming MOSFET with channel, extension and pocket implants
- Patent number 6,333,217
- Issue date Dec 25, 2001
- Matsushita Electric Industrial Co., Ltd.
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 6,312,981
- Issue date Nov 6, 2001
- Matsushita Electric Industrial Co., Ltd.
- Kaori Akamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 6,251,718
- Issue date Jun 26, 2001
- Matsushita Electric Industrial Co., Ltd.
- Kaori Akamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process
- Patent number 5,633,211
- Issue date May 27, 1997
- Matsushita Electric Industrial Co., Ld.
- Shinichi Imai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device having reduced gate overlapping capacitance
- Patent number 5,610,430
- Issue date Mar 11, 1997
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor device with viscous flow of silic...
- Patent number 5,584,964
- Issue date Dec 17, 1996
- Matsushita Electric Industrial Co., Ltd.
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor device
- Patent number 5,455,205
- Issue date Oct 3, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor memory device
- Patent number 5,405,800
- Issue date Apr 11, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hisashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A STRESS FILM
- Publication number 20120238068
- Publication date Sep 20, 2012
- PANASONIC CORPORATION
- Masafumi TSUTSUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090050981
- Publication date Feb 26, 2009
- Matsushita Electric Industrial Co., Ltd.
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having internal stress film
- Publication number 20070194388
- Publication date Aug 23, 2007
- Matsushita Electric Industrial Co., Ltd.
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20060202287
- Publication date Sep 14, 2006
- Matsushita Electric Industrial Co., Ltd.
- Taiji Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20050087818
- Publication date Apr 28, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Masahiro Imade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20050054195
- Publication date Mar 10, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takato Handa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20050045888
- Publication date Mar 3, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Tadashi Kadowaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20050003621
- Publication date Jan 6, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Hiroaki Nakaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20040251479
- Publication date Dec 16, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Masafumi Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20040099890
- Publication date May 27, 2004
- Matsushita Electric Industrial Co., Ltd.
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating semiconductor device
- Publication number 20040087095
- Publication date May 6, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takato Handa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20040063299
- Publication date Apr 1, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Masahiro Imade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and capacitance measurement method
- Publication number 20030218473
- Publication date Nov 27, 2003
- Matsushita Electric Industrial Co., Ltd.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of checking semiconductor storage d...
- Publication number 20030117151
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tatsuya Kunikiyo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20020034865
- Publication date Mar 21, 2002
- Hiroyuki Umimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20020025662
- Publication date Feb 28, 2002
- Satoe Miyata
- H01 - BASIC ELECTRIC ELEMENTS

Hiroyuki Umimoto

Person

Patents Grantslast 30 patents

Method of manufacturing a semiconductor device including a stress film

Semiconductor device including a stress film

Semiconductor device including MISFET having internal stress film

Semiconductor device having internal stress film

Semiconductor device and method for fabricating the same

Semiconductor device including a MISFET and a MIS capacitor

Semiconductor device having internal stress film

Method for fabricating a semiconductor device having a pocket dopan...

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method of fabricating the same

Semiconductor device and capacitance measurement method

Semiconductor device and method of checking semiconductor storage d...

Method for fabricating a semiconductor device including using a har...

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method of fabricating the same

Semiconductor device and method for fabricating the same

Method for fabricating semiconductor device

Method of forming MOSFET with channel, extension and pocket implants

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Semiconductor device and process

Semiconductor device having reduced gate overlapping capacitance

Method of producing semiconductor device with viscous flow of silic...

Method of producing semiconductor device

Method of fabricating a semiconductor memory device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE INCLUDING A STRESS FILM

SEMICONDUCTOR DEVICE

Semiconductor device having internal stress film

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method of fabricating the same

Method for fabricating semiconductor device

Semiconductor device and method for fabricating the same

Semiconductor device and capacitance measurement method

Semiconductor device and method of checking semiconductor storage d...

Semiconductor device and method of fabricating the same

Semiconductor device and method for fabricating the same