Hiroyuki Yoshida

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Examination assisting method, examination assisting apparatus, and...
- Patent number 11,291,431
- Issue date Apr 5, 2022
- Fujitsu Limited
- Masaaki Komatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image measuring method and apparatus
- Patent number 11,257,205
- Issue date Feb 22, 2022
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Anomalousness determination method, anomalousness determination app...
- Patent number 11,074,681
- Issue date Jul 27, 2021
- Fujitsu Limited
- Masaaki Komatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, pr...
- Patent number 10,895,730
- Issue date Jan 19, 2021
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Analysis method and analysis device
- Patent number 10,755,028
- Issue date Aug 25, 2020
- Fujitsu Limited
- Masahiro Kataoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image measuring device and program
- Patent number 10,475,202
- Issue date Nov 12, 2019
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection bias correction value calculation method, edge detec...
- Patent number 10,102,631
- Issue date Oct 16, 2018
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, pr...
- Patent number 9,420,160
- Issue date Aug 16, 2016
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Illumination setting method, apparatus and computer-readable medium...
- Patent number 9,417,123
- Issue date Aug 16, 2016
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Image measuring apparatus
- Patent number 9,354,433
- Issue date May 31, 2016
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vision measuring device
- Patent number 8,866,114
- Issue date Oct 21, 2014
- Mitutoyo Corporation
- Naoki Shirai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vision measuring device
- Patent number 8,829,480
- Issue date Sep 9, 2014
- Mitutoyo Corporation
- Naoki Shirai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vision measuring device and auto-focusing control method
- Patent number 8,809,756
- Issue date Aug 19, 2014
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Vision measuring device and auto-focusing control method
- Patent number 8,766,153
- Issue date Jul 1, 2014
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Illuminating device and method of calibrating illuminating device
- Patent number 8,269,427
- Issue date Sep 18, 2012
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Single-chip color camera for high accuracy image measurements
- Patent number 7,613,359
- Issue date Nov 3, 2009
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focus detecting method, focus detecting mechanism and image measuri...
- Patent number 7,342,608
- Issue date Mar 11, 2008
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G02 - OPTICS
Information Patent Grant
Method and apparatus for non-contact three-dimensional surface meas...
- Patent number 7,286,246
- Issue date Oct 23, 2007
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Image processing type of measuring device, lighting system for the...
- Patent number 7,177,033
- Issue date Feb 13, 2007
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Connector capable of preventing damages to electrically conductive...
- Patent number 7,052,304
- Issue date May 30, 2006
- Fujitsu Limited
- Hiroyuki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illuminance calibrating method of illuminator, illuminance calibrat...
- Patent number 7,015,447
- Issue date Mar 21, 2006
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Automatic program generation technology using data structure resolu...
- Patent number 6,973,639
- Issue date Dec 6, 2005
- Fujitsu Limited
- Keiji Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming cross point type DRAM cell
- Patent number 6,797,563
- Issue date Sep 28, 2004
- Texas Instruments Incorporated
- Yoichi Miyai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross point type DRAM cell composed of a pillar having an active re...
- Patent number 6,563,155
- Issue date May 13, 2003
- Texas Instruments Incorporated
- Yoichi Miyai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for IEEE 1394 bus analysis
- Patent number 6,519,544
- Issue date Feb 11, 2003
- Fujitsu Limited
- Tomohiro Deguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switching apparatus applied to a plurality of information processin...
- Patent number 6,385,640
- Issue date May 7, 2002
- Fujitsu Limited
- Rieko Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor memory device having variable pitch array
- Patent number 6,381,166
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Hiroyuki Yoshida
- G11 - INFORMATION STORAGE
Information Patent Grant
Inventory managing method for automatic inventory retrieval and app...
- Patent number 6,338,053
- Issue date Jan 8, 2002
- Fujitsu Limited
- Tadahiro Uehara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trench-type semiconductor memory device
- Patent number 5,861,649
- Issue date Jan 19, 1999
- Texas Instruments Incorporated
- Hiroyuki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a trench-type semiconductor memory device
- Patent number 5,804,478
- Issue date Sep 8, 1998
- Texas Instruments Incorporated
- Toshiyuki Nagata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
- Publication number 20250116503
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20250116504
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
- Publication number 20250117958
- Publication date Apr 10, 2025
- MITUTOYO CORPORATION
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
- Publication number 20250045931
- Publication date Feb 6, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LENS FLARE ELIMINATION METHOD, IMAGE CAPTURING APPARATUS, AND IMAGE...
- Publication number 20250047992
- Publication date Feb 6, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
EXAMINATION ASSISTING METHOD, EXAMINATION ASSISTING APPARATUS, AND...
- Publication number 20200060659
- Publication date Feb 27, 2020
- FUJITSU LIMITED
- Masaaki Komatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANOMALOUSNESS DETERMINATION METHOD, ANOMALOUSNESS DETERMINATION APP...
- Publication number 20200065954
- Publication date Feb 27, 2020
- FUJITSU LIMITED
- Masaaki Komatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PR...
- Publication number 20190293917
- Publication date Sep 26, 2019
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ANALYSIS METHOD AND ANALYSIS DEVICE
- Publication number 20180246856
- Publication date Aug 30, 2018
- Fujitsu Limited
- Masahiro Kataoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING DEVICE AND PROGRAM
- Publication number 20170228884
- Publication date Aug 10, 2017
- MITUTOYO CORPORATION
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE
- Publication number 20170178315
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- Gyokubu CHO
- G01 - MEASURING TESTING
Information Patent Application
EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...
- Publication number 20160295207
- Publication date Oct 6, 2016
- MITUTOYO CORPORATION
- Hiroyuki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PR...
- Publication number 20150070566
- Publication date Mar 12, 2015
- MITUTOYO CORPORATION
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASURING APPARATUS AND IMAGE MEASURING PROGRAM
- Publication number 20140333762
- Publication date Nov 13, 2014
- Hiroyuki YOSHIDA
- G02 - OPTICS
Information Patent Application
ILLUMINATION SETTING METHOD, APPARATUS AND COMPUTER-READABLE MEDIUM...
- Publication number 20140332662
- Publication date Nov 13, 2014
- Hiroyuki YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
VISION MEASURING DEVICE AND AUTO-FOCUSING CONTROL METHOD
- Publication number 20140232856
- Publication date Aug 21, 2014
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20120212607
- Publication date Aug 23, 2012
- Mitutoyo Corporation
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VISION MEASURING DEVICE AND AUTO-FOCUSING CONTROL METHOD
- Publication number 20120211638
- Publication date Aug 23, 2012
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VISION MEASURING DEVICE
- Publication number 20120187275
- Publication date Jul 26, 2012
- Mitutoyo Corporation
- Naoki SHIRAI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ILLUMINATING DEVICE AND METHOD OF CALIBRATING ILLUMINATING DEVICE
- Publication number 20110050107
- Publication date Mar 3, 2011
- MITUTOYO CORPORATION
- Hiroyuki Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image measuring apparatus and image measuring method
- Publication number 20070036465
- Publication date Feb 15, 2007
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING TYPE OF MEASURING DEVICE, LIGHTING SYSTEM FOR THE...
- Publication number 20060132800
- Publication date Jun 22, 2006
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Connector capable of preventing damages to electrically conductive...
- Publication number 20060030193
- Publication date Feb 9, 2006
- FUJITSU LIMITED
- Hiroyuki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Illuminance calibrating method of illuminator, illuminance calibrat...
- Publication number 20050007604
- Publication date Jan 13, 2005
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Focus detecting method, focus detecting mechanism and image measuri...
- Publication number 20040263672
- Publication date Dec 30, 2004
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G02 - OPTICS
Information Patent Application
Method and apparatus for non-contact three-dimensional surface meas...
- Publication number 20040246496
- Publication date Dec 9, 2004
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Image measuring method and image measuring device
- Publication number 20040246367
- Publication date Dec 9, 2004
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Image processing type of measuring device, lighting system for the...
- Publication number 20030169431
- Publication date Sep 11, 2003
- Mitutoyo Corporation
- Eisuke Moriuchi
- G01 - MEASURING TESTING
Information Patent Application
Method of forming cross point type DRAM cell
- Publication number 20030132456
- Publication date Jul 17, 2003
- Yoichi Miyai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS POINT TYPE DRAM CELL COMPOSED OF A PILLAR HAVING AN ACTIVE RE...
- Publication number 20030062555
- Publication date Apr 3, 2003
- Yoichi Miyai
- H01 - BASIC ELECTRIC ELEMENTS

Hiroyuki Yoshida

Person

Patents Grantslast 30 patents

Examination assisting method, examination assisting apparatus, and...

Image measuring method and apparatus

Anomalousness determination method, anomalousness determination app...

Information processing apparatus, information processing method, pr...

Analysis method and analysis device

Image measuring device and program

Edge detection bias correction value calculation method, edge detec...

Information processing apparatus, information processing method, pr...

Illumination setting method, apparatus and computer-readable medium...

Image measuring apparatus

Vision measuring device

Vision measuring device

Vision measuring device and auto-focusing control method

Vision measuring device and auto-focusing control method

Illuminating device and method of calibrating illuminating device

Single-chip color camera for high accuracy image measurements

Focus detecting method, focus detecting mechanism and image measuri...

Method and apparatus for non-contact three-dimensional surface meas...

Image processing type of measuring device, lighting system for the...

Connector capable of preventing damages to electrically conductive...

Illuminance calibrating method of illuminator, illuminance calibrat...

Automatic program generation technology using data structure resolu...

Method of forming cross point type DRAM cell

Cross point type DRAM cell composed of a pillar having an active re...

Method and apparatus for IEEE 1394 bus analysis

Switching apparatus applied to a plurality of information processin...

Semiconductor memory device having variable pitch array

Inventory managing method for automatic inventory retrieval and app...

Trench-type semiconductor memory device

Method of forming a trench-type semiconductor memory device

Patents Applicationslast 30 patents

IMAGE MEASURING APPARATUS AND PROGRAM

IMAGE MEASURING APPARATUS

IMAGE MEASURING APPARATUS AND PROGRAM

IMAGE MEASURING APPARATUS AND PROGRAM

LENS FLARE ELIMINATION METHOD, IMAGE CAPTURING APPARATUS, AND IMAGE...

EXAMINATION ASSISTING METHOD, EXAMINATION ASSISTING APPARATUS, AND...

ANOMALOUSNESS DETERMINATION METHOD, ANOMALOUSNESS DETERMINATION APP...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PR...

ANALYSIS METHOD AND ANALYSIS DEVICE

IMAGE MEASURING DEVICE AND PROGRAM

IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE

EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, PR...

IMAGE MEASURING APPARATUS AND IMAGE MEASURING PROGRAM

ILLUMINATION SETTING METHOD, APPARATUS AND COMPUTER-READABLE MEDIUM...

VISION MEASURING DEVICE AND AUTO-FOCUSING CONTROL METHOD

IMAGE MEASURING APPARATUS

VISION MEASURING DEVICE AND AUTO-FOCUSING CONTROL METHOD

VISION MEASURING DEVICE

ILLUMINATING DEVICE AND METHOD OF CALIBRATING ILLUMINATING DEVICE

Image measuring apparatus and image measuring method

IMAGE PROCESSING TYPE OF MEASURING DEVICE, LIGHTING SYSTEM FOR THE...

Connector capable of preventing damages to electrically conductive...

Illuminance calibrating method of illuminator, illuminance calibrat...

Focus detecting method, focus detecting mechanism and image measuri...

Method and apparatus for non-contact three-dimensional surface meas...

Image measuring method and image measuring device

Image processing type of measuring device, lighting system for the...

Method of forming cross point type DRAM cell

CROSS POINT TYPE DRAM CELL COMPOSED OF A PILLAR HAVING AN ACTIVE RE...