Hsin-Chieh LU

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Kaohsiung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer probe card
- Patent number 8,901,948
- Issue date Dec 2, 2014
- Winway Technology Co., Ltd.
- Chia-Huang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Strip test method
- Patent number 7,388,396
- Issue date Jun 17, 2008
- Advanced Semiconductor Engineering Inc.
- Hsin-Chieh Lu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC TEST EQUIPMENT
- Publication number 20170146568
- Publication date May 25, 2017
- WinWay Tech. Co., Ltd.
- Jun-Xian LIU
- G01 - MEASURING TESTING
Information Patent Application
Wafer Probe Card
- Publication number 20130141130
- Publication date Jun 6, 2013
- Chia-Huang Wang
- G01 - MEASURING TESTING
Information Patent Application
STRIP TEST METHOD
- Publication number 20070152698
- Publication date Jul 5, 2007
- ADVANCED SEMICONDUCTOR ENGINEERING INC.
- Hsin-Chieh LU
- G01 - MEASURING TESTING