The disclosure relates to a test equipment, more particularly to an electronic test equipment.
Referring to
Therefore, the object of the disclosure is to provide an electronic test equipment that can alleviate at least one of the drawbacks associated with the abovementioned prior art.
According to the disclosure, an electronic test equipment is adapted to test an electronic component. The electronic component has a circuit body and a plurality of connectors that are electrically connected to the circuit body. The electronic test equipment includes a metallic test seat and a plurality of spring probes. The metallic test seat is adapted to support the circuit body thereon, and is formed with a plurality of spaced-apart probe holes extending therethrough and possessing diameters that are substantially the same. Each of the probe holes is adapted to receive a corresponding one of the connectors. The spring probes are respectively and entirely positioned within the probe holes, and are adapted to electrically contact the connectors.
Other features and advantages of the disclosure will become apparent in the following detailed description of the embodiment with reference to the accompanying drawings, of which:
Referring to
Referring further to
Moreover, the test seat 2 is formed with a plurality of spaced-apart probe holes 21 extending through the upper and lower bodies 22, 23, and possessing diameters that are substantially the same. Each of the probe holes 21 is adapted to receive a corresponding one of the connectors 62. Specifically, the diameter of each probe hole 21 is within ±10% deviation from a reference diameter. Each of the probe holes 21 has a first opening 210 adapted to receive a corresponding one of the connectors 62, and a second opening 211 opposite to the first opening 210.
The spring probes 3 are respectively and entirely positioned within the probe holes 21 of the test seat 2, and each of the spring probes 3 is adapted to electrically contact a corresponding one of the connectors 62 of the electronic component 6. The spring probes 3 has a side surrounding surface 311, and opposite end portions 312 that are disposed at opposite sides of the side surrounding surface 311. One of the end portions 312 is adapted to electrically contact the corresponding one of the connectors 62.
More specifically, the spring probes 3 serve three functions—power source connection, grounding and signal transfer. At least one spring probe 3 is for power source connection, at least one spring probe 3 is for grounding, and the other spring probes 3 are for signal transfer.
The at least one spring probe 3 serving the grounding function electrically and directly contacts the test seat 2. The electric insulators 4 are disposed respectively inside of only the probe holes 21 that retain the spring probes 3 for the functions of power source connection and signal transfer, and are respectively sleeved on the side surrounding surfaces 311 of the corresponding spring probes 3 for respectively positioning the spring probes 3. As shown in
As shown in
Moreover, since the probe holes 21 of the test seat 2 are all formed with substantially the same diameter, the electronic test equipment according to the disclosure can approach an impedance matching between an input impedance of the electronic component 6 and an output impedance of the electronic test equipment and can prevent signal reflections to secure the operational accuracy by simply adjusting the sizes of the air gaps 5. Therefore, the electronic test equipment according to the disclosure is able to perform accurate examinations on the electronic component 6.
It should be further noted that, the connectors 62 may be partially exposed from the probe holes 21 to achieve the same electromagnetic shielding as long as the exposure of each of the connectors 62 is limited at a specific level. Specifically, as shown in
While the present invention has been described in connection with what is considered the exemplary embodiment, it is understood that this invention is not limited to the disclosed embodiment but is intended to cover various arrangements included within the spirit and scope of the broadest interpretation so as to encompass all such modifications and equivalent arrangements.