Isao Miyazaki

Person

Isesaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fabrication methods of semiconductor integrated circuit device and...
- Patent number 7,304,001
- Issue date Dec 4, 2007
- Renesas Technology Corp.
- Isao Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,404,911
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,185,324
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Fabrication methods of semiconductor integrated circuit device and...
- Publication number 20030056189
- Publication date Mar 20, 2003
- HITACHI LTD.
- Isao Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis system
- Publication number 20010000460
- Publication date Apr 26, 2001
- Kazuko Ishihara
- G01 - MEASURING TESTING

Isao Miyazaki

Person

Patents Grantslast 30 patents

Fabrication methods of semiconductor integrated circuit device and...

Process management system

Inspection data analyzing system

Process control system

Inspection data analyzing system

Semiconductor failure analysis system

Inspection data analyzing system

Inspection data analyzing system

Inspection system and method using separate processors for processi...

Semiconductor failure analysis system

Inspection data analyzing system

Patents Applicationslast 30 patents

Process management system

Fabrication methods of semiconductor integrated circuit device and...

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Semiconductor failure analysis system