James A. Forster

Person

Barrington, RI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stud-cone bump for probe tips used in known good die carriers
- Patent number 7,122,895
- Issue date Oct 17, 2006
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with contact apparatus and method of manufacture
- Patent number 6,636,063
- Issue date Oct 21, 2003
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Socket apparatus particularly adapted for LGA type semiconductor de...
- Patent number 6,570,398
- Issue date May 27, 2003
- Texas Instruments Incorporated
- Raymond F. Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test structure having a laser defined current carryin...
- Patent number 6,553,661
- Issue date Apr 29, 2003
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Socket apparatus particularly adapted for land grid array type semi...
- Patent number 6,547,580
- Issue date Apr 15, 2003
- Texas Instruments Incorporated
- Scott A. Leavitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital signal processor/known good die packaging using rerouted ex...
- Patent number 6,489,673
- Issue date Dec 3, 2002
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Stud-cone bump for probe tips used in known good die carriers
- Patent number 6,376,352
- Issue date Apr 23, 2002
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Digital signal processor/known good die packaging using rerouted ex...
- Patent number 6,335,226
- Issue date Jan 1, 2002
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Clad metal substrate
- Patent number 5,653,379
- Issue date Aug 5, 1997
- Texas Instruments Incorporated
- James Forster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Heat exchanger assemblies-material for use therin, and a method of...
- Patent number 5,553,770
- Issue date Sep 10, 1996
- Texas Instruments Incorporated
- Sunil C. Jha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Package for integrated circuits
- Patent number 5,536,906
- Issue date Jul 16, 1996
- Texas Instruments Incorporated
- Glen R. Haas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making metal foil material for catalytic converters
- Patent number 5,516,383
- Issue date May 14, 1996
- Texas Instruments Incorporated
- Sunil C. Jha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Titanium metal foils and method of making
- Patent number 5,489,411
- Issue date Feb 6, 1996
- Texas Instruments Incorporated
- Sunil C. Jha
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Catalytic converters--metal foil material for use therein, and a me...
- Patent number 5,447,698
- Issue date Sep 5, 1995
- Texas Instruments Incorporated
- Sunil C. Jha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Catalytic converters--metal foil material for use therein, and a me...
- Patent number 5,366,139
- Issue date Nov 22, 1994
- Texas Instruments Incorporated
- Sunil C. Jha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Circuit system, a composite material for use therein, and a method...
- Patent number 5,310,520
- Issue date May 10, 1994
- Texas Instruments Incorporated
- Sunil C. Jha
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Circuit units, substrates therefor and method of making
- Patent number 5,276,423
- Issue date Jan 4, 1994
- Texas Instruments Incorporated
- Henry F. Breit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat-transferring circuit substrate with limited thermal expansion...
- Patent number 5,156,923
- Issue date Oct 20, 1992
- Texas Instruments Incorporated
- Sunil C. Jha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate for an electrical circuit system and a circuit system usi...
- Patent number 5,055,967
- Issue date Oct 8, 1991
- Texas Instruments Incorporated
- Israil M. Sukonnik
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Stud-cone bump for probe tips used in known good die carriers
- Publication number 20040152232
- Publication date Aug 5, 2004
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Low cost area array probe for circuits having solder-ball contacts...
- Publication number 20030116346
- Publication date Jun 26, 2003
- James Allam Forster
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test structure having a laser defined current carryin...
- Publication number 20030088975
- Publication date May 15, 2003
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Probe card with contact apparatus and method of manufacture
- Publication number 20030062915
- Publication date Apr 3, 2003
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Application
SOCKET APPARATUS PARTICULARLY ADAPTED FOR LGA TYPE SEMICONDUCTOR DE...
- Publication number 20030057980
- Publication date Mar 27, 2003
- Raymond F. Murphy
- G01 - MEASURING TESTING
Information Patent Application
SOCKET APPARATUS PARTICULARLY ADAPTED FOR LAND GRID ARRAY TYPE SEMI...
- Publication number 20030060073
- Publication date Mar 27, 2003
- Scott A. Leavitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor test structure having a laser defined current carryin...
- Publication number 20020084799
- Publication date Jul 4, 2002
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Digital signal processor/known good die packaging using rerouted ex...
- Publication number 20010030360
- Publication date Oct 18, 2001
- Richard W. Arnold
- G01 - MEASURING TESTING

James A. Forster

Person

Patents Grantslast 30 patents

Stud-cone bump for probe tips used in known good die carriers

Probe card with contact apparatus and method of manufacture

Socket apparatus particularly adapted for LGA type semiconductor de...

Semiconductor test structure having a laser defined current carryin...

Socket apparatus particularly adapted for land grid array type semi...

Digital signal processor/known good die packaging using rerouted ex...

Stud-cone bump for probe tips used in known good die carriers

Digital signal processor/known good die packaging using rerouted ex...

Clad metal substrate

Heat exchanger assemblies-material for use therin, and a method of...

Package for integrated circuits

Method of making metal foil material for catalytic converters

Titanium metal foils and method of making

Catalytic converters--metal foil material for use therein, and a me...

Catalytic converters--metal foil material for use therein, and a me...

Circuit system, a composite material for use therein, and a method...

Circuit units, substrates therefor and method of making

Heat-transferring circuit substrate with limited thermal expansion...

Substrate for an electrical circuit system and a circuit system usi...

Patents Applicationslast 30 patents

Stud-cone bump for probe tips used in known good die carriers

Low cost area array probe for circuits having solder-ball contacts...

Semiconductor test structure having a laser defined current carryin...

Probe card with contact apparatus and method of manufacture

SOCKET APPARATUS PARTICULARLY ADAPTED FOR LGA TYPE SEMICONDUCTOR DE...

SOCKET APPARATUS PARTICULARLY ADAPTED FOR LAND GRID ARRAY TYPE SEMI...

Semiconductor test structure having a laser defined current carryin...

Digital signal processor/known good die packaging using rerouted ex...