James C. Tsang

Person

Yorktown Heights, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Graphene formation utilizing solid phase carbon sources
- Patent number 8,927,057
- Issue date Jan 6, 2015
- International Business Machines Corporation
- Ageeth A. Bol
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 7,791,087
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 7,791,086
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 7,781,782
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Method for defeating reverse engineering of integrated circuits by...
- Patent number 7,612,382
- Issue date Nov 3, 2009
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 7,399,992
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 7,115,912
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Noninvasive optical method and system for inspecting or testing CMO...
- Patent number 6,774,647
- Issue date Aug 10, 2004
- International Business Machines Corporation
- Jeffrey Alan Kash
- G01 - MEASURING TESTING
Information Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
- Patent number 6,650,768
- Issue date Nov 18, 2003
- International Business Machines Corporation
- Richard James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Device for defeating reverse engineering of integrated circuits by...
- Patent number 6,515,304
- Issue date Feb 4, 2003
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reverse engineering integrated circuits by...
- Patent number 6,496,022
- Issue date Dec 17, 2002
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for deriving temporal delays in integrated cir...
- Patent number 6,327,394
- Issue date Dec 4, 2001
- International Business Machines Corporation
- Jeffrey Alan Kash
- G01 - MEASURING TESTING
Information Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
- Patent number 6,304,668
- Issue date Oct 16, 2001
- International Business Machines Corporation
- Richard James Evans
Information Patent Grant
Image processing methods for the optical detection of dynamic error...
- Patent number 6,172,512
- Issue date Jan 9, 2001
- International Business Machines Corporation
- Richard James Evans
- G01 - MEASURING TESTING
Information Patent Grant
System and method for compressing and analyzing time-resolved optic...
- Patent number 6,028,952
- Issue date Feb 22, 2000
- International Business Machines Corporation
- Jeffrey Alan Kash
- G01 - MEASURING TESTING
Information Patent Grant
Noninvasive optical method for measuring internal switching and oth...
- Patent number 5,940,545
- Issue date Aug 17, 1999
- International Business Machines Corporation
- Jeffrey Alan Kash
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GRAPHENE FORMATION UTILIZING SOLID PHASE CARBON SOURCES
- Publication number 20110206934
- Publication date Aug 25, 2011
- International Business Machines Corporation
- Ageeth A. Bol
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
- Publication number 20100044724
- Publication date Feb 25, 2010
- International Business Machines Corp.
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
- Publication number 20100046756
- Publication date Feb 25, 2010
- JEFFREY A. KASH
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
- Publication number 20100044725
- Publication date Feb 25, 2010
- International Business Machines Corp.
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
- Publication number 20080252331
- Publication date Oct 16, 2008
- International Business Machines Corp.
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Application
Device for defeating reverse engineering of integrated circuits by...
- Publication number 20070030022
- Publication date Feb 8, 2007
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING
Information Patent Application
System and method for molecular optical emission
- Publication number 20040061422
- Publication date Apr 1, 2004
- International Business Machines Corporation
- Phaedon Avouris
- B82 - NANO-TECHNOLOGY
Information Patent Application
Noninvasive optical method and system for inspecting or testing CMO...
- Publication number 20030146768
- Publication date Aug 7, 2003
- International Business Machines Corporation
- Jeffrey Alan Kash
- G01 - MEASURING TESTING
Information Patent Application
Device for defeating reverse engineering of integrated circuits by...
- Publication number 20030122138
- Publication date Jul 3, 2003
- International Business Machines Corporation
- Jeffrey A. Kash
- G01 - MEASURING TESTING

James C. Tsang

Person

Patents Grantslast 30 patents

Graphene formation utilizing solid phase carbon sources

Device for defeating reverse engineering of integrated circuits by...

Device for defeating reverse engineering of integrated circuits by...

Device for defeating reverse engineering of integrated circuits by...

Method for defeating reverse engineering of integrated circuits by...

Device for defeating reverse engineering of integrated circuits by...

Device for defeating reverse engineering of integrated circuits by...

Noninvasive optical method and system for inspecting or testing CMO...

Using time resolved light emission from VLSI circuit devices for na...

Device for defeating reverse engineering of integrated circuits by...

Method and apparatus for reverse engineering integrated circuits by...

Apparatus and method for deriving temporal delays in integrated cir...

Using time resolved light emission from VLSI circuit devices for na...

Image processing methods for the optical detection of dynamic error...

System and method for compressing and analyzing time-resolved optic...

Noninvasive optical method for measuring internal switching and oth...

Patents Applicationslast 30 patents

GRAPHENE FORMATION UTILIZING SOLID PHASE CARBON SOURCES

DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...

DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...

DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...

DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...

Device for defeating reverse engineering of integrated circuits by...

System and method for molecular optical emission

Noninvasive optical method and system for inspecting or testing CMO...

Device for defeating reverse engineering of integrated circuits by...