James D. Welch

Person

Omaha, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compact CMOS
- Patent number 12,136,661
- Issue date Nov 5, 2024
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
- Patent number 11,821,833
- Issue date Nov 21, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Compact FINFET CMOS
- Patent number 11,798,946
- Issue date Oct 24, 2023
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Patent number 11,740,176
- Issue date Aug 29, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,675,208
- Issue date Jun 13, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Lamp
- Patent number D685934
- Issue date Jul 9, 2013
- James D. Welch
- D26 - Lighting
Information Patent Grant
Lamp
- Patent number D674519
- Issue date Jan 15, 2013
- James D. Welch
- D26 - Lighting
Information Patent Grant
Lamp
- Patent number D661001
- Issue date May 29, 2012
- James D. Welch
- D26 - Lighting
Information Patent Grant
Lamp
- Patent number D660999
- Issue date May 29, 2012
- James D. Welch
- D26 - Lighting
Information Patent Grant
System and method of applying horizontally oriented arc-lamps in el...
- Patent number 8,189,193
- Issue date May 29, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Lamp
- Patent number D661000
- Issue date May 29, 2012
- James D. Welch
- D26 - Lighting
Information Patent Grant
Lamp
- Patent number D661003
- Issue date May 29, 2012
- James D. Welch
- D26 - Lighting
Information Patent Grant
Lamp
- Patent number D661002
- Issue date May 29, 2012
- James D. Welch
- D26 - Lighting
Information Patent Grant
Method of providing audio format professional information update se...
- Patent number 8,170,920
- Issue date May 1, 2012
- James D. Welch
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Non-destructive approach to ellipsometric monitoring of a film coat...
- Patent number 7,768,660
- Issue date Aug 3, 2010
- J. A. Woollam Co., Inc.
- Gregory K. Pribil
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System and method of applying horizontally oriented arc-lamps in el...
- Patent number 7,738,105
- Issue date Jun 15, 2010
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of providing audio format professional information update se...
- Patent number 7,606,735
- Issue date Oct 20, 2009
- James D. Welch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,522,279
- Issue date Apr 21, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,508,510
- Issue date Mar 24, 2009
- J.A. Wooliam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,505,134
- Issue date Mar 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System and method of applying xenon arc-lamps to provide 193 nm wav...
- Patent number 7,489,400
- Issue date Feb 10, 2009
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Sample masking in ellipsometer and the like systems including detec...
- Patent number 7,477,388
- Issue date Jan 13, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Reduced gas flow purging system in reflectometer, ellipsometer, pol...
- Patent number 7,426,030
- Issue date Sep 16, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System and method of selectively monitoring sample front and backsi...
- Patent number 7,385,698
- Issue date Jun 10, 2008
- J. A. Woollam Co., Inc.
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Grant
Control of beam spot size in ellipsometer and the like systems
- Patent number 7,345,762
- Issue date Mar 18, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Aspects of producing, directing, conditioning, impinging and detect...
- Patent number 7,317,529
- Issue date Jan 8, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Use of ellipsometry and surface plasmon resonance in monitoring thi...
- Patent number 7,283,234
- Issue date Oct 16, 2007
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,277,171
- Issue date Oct 2, 2007
- J.A. Woollan Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT CMOS FABRICATION
- Publication number 20240063063
- Publication date Feb 22, 2024
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast and accurated mueller matrix infrared ellipsometer
- Publication number 20230194414
- Publication date Jun 22, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Publication number 20230184671
- Publication date Jun 15, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
COMPACT CMOS
- Publication number 20230117871
- Publication date Apr 20, 2023
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact CMOS in wide bandgap semiconductor
- Publication number 20230080743
- Publication date Mar 16, 2023
- JAMES D. WELCH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overcoming uncertainty
- Publication number 20220349698
- Publication date Nov 3, 2022
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Publication number 20220244169
- Publication date Aug 4, 2022
- J. A. WOOLLAM CO., INC.
- Ping He
- G02 - OPTICS
Information Patent Application
COMPACT FINFET CMOS
- Publication number 20210020637
- Publication date Jan 21, 2021
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of bridging quantum and classical physics
- Publication number 20160252541
- Publication date Sep 1, 2016
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Application
Applying CRT tube-type electron directingplates in a double slit sy...
- Publication number 20140084178
- Publication date Mar 27, 2014
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Application
Application of a bistable energy system in overcomming uncertainty
- Publication number 20110291006
- Publication date Dec 1, 2011
- James D. Welch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Welch certainty principle continued
- Publication number 20110235044
- Publication date Sep 29, 2011
- James D. Welch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Welch certainty principle
- Publication number 20110116096
- Publication date May 19, 2011
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Application
Uncertainty of uncertainty
- Publication number 20100309481
- Publication date Dec 9, 2010
- James D. Welch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of improving probability of Knowing through which slit in a...
- Publication number 20100243917
- Publication date Sep 30, 2010
- James D. Welch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined use of oscillating means and ellipsometry to determine unc...
- Publication number 20060268273
- Publication date Nov 30, 2006
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Application
Economical and very simple to fabricate single device equivalent to...
- Publication number 20060022293
- Publication date Feb 2, 2006
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for investigating photon or particle trajectory a...
- Publication number 20050168748
- Publication date Aug 4, 2005
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor devices in compensated semiconductor
- Publication number 20040004262
- Publication date Jan 8, 2004
- James D. Welch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of improving electromagnetic radiation beam chara...
- Publication number 20010033377
- Publication date Oct 25, 2001
- James D. Welch
- G01 - MEASURING TESTING

James D. Welch

Person

Patents Grantslast 30 patents

Compact CMOS

Fast and accurate Mueller matrix infrared ellipsometer

Compact FINFET CMOS

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Lamp

Lamp

Lamp

Lamp

System and method of applying horizontally oriented arc-lamps in el...

Lamp

Lamp

Lamp

Method of providing audio format professional information update se...

Non-destructive approach to ellipsometric monitoring of a film coat...

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

System and method of applying horizontally oriented arc-lamps in el...

Method of providing audio format professional information update se...

System for and method of investigating the exact same point on a sa...

System for and method of investigating the exact same point on a sa...

Automated ellipsometer and the like systems

System and method of applying xenon arc-lamps to provide 193 nm wav...

Sample masking in ellipsometer and the like systems including detec...

Reduced gas flow purging system in reflectometer, ellipsometer, pol...

System and method of selectively monitoring sample front and backsi...

Control of beam spot size in ellipsometer and the like systems

Aspects of producing, directing, conditioning, impinging and detect...

Use of ellipsometry and surface plasmon resonance in monitoring thi...

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Patents Applicationslast 30 patents

COMPACT CMOS FABRICATION

Fast and accurated mueller matrix infrared ellipsometer

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

COMPACT CMOS

Compact CMOS in wide bandgap semiconductor

Overcoming uncertainty

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

COMPACT FINFET CMOS

Method of bridging quantum and classical physics

Applying CRT tube-type electron directingplates in a double slit sy...

Application of a bistable energy system in overcomming uncertainty

Welch certainty principle continued

Welch certainty principle

Uncertainty of uncertainty

Method of improving probability of Knowing through which slit in a...

System for and method of investigating the exact same point on a sa...

Combined use of oscillating means and ellipsometry to determine unc...

Economical and very simple to fabricate single device equivalent to...

System and method for investigating photon or particle trajectory a...

Semiconductor devices in compensated semiconductor

System and method of improving electromagnetic radiation beam chara...