James M. Leas

Person

Bethesda, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thin single-crystal silicon solar cells mounted to a structural sup...
- Patent number 11,978,820
- Issue date May 7, 2024
- Semivation, LLC
- David Vaclav Horak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bowl-shaped wide-band vibration energy harvester
- Patent number 8,319,402
- Issue date Nov 27, 2012
- Lord Corporation
- David L. Churchill
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Wide-band vibration energy harvester with stop
- Patent number 8,154,177
- Issue date Apr 10, 2012
- Microstrain, Inc.
- David L. Churchill
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Wide-band vibration energy harvester with restoring spring
- Patent number 8,134,282
- Issue date Mar 13, 2012
- Microstrain, Inc.
- David L. Churchill
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Wideband vibration energy harvester
- Patent number 7,839,058
- Issue date Nov 23, 2010
- Microstrain, Inc.
- David L. Churchill
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated piezoelectric composite and support circuit
- Patent number 7,646,135
- Issue date Jan 12, 2010
- Microstrain, Inc.
- David L. Churchill
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Carrier for test, burn-in, and first level packaging
- Patent number 7,394,268
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Claude L. Bertin
- G11 - INFORMATION STORAGE
Information Patent Grant
Vertical dual gate field effect transistor
- Patent number 7,176,089
- Issue date Feb 13, 2007
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carrier for test, burn-in, and first level packaging
- Patent number 7,132,841
- Issue date Nov 7, 2006
- International Business Machines Corporation
- Claude L. Bertin
- G11 - INFORMATION STORAGE
Information Patent Grant
SiGe or germanium flip chip optical receiver
- Patent number 6,980,748
- Issue date Dec 27, 2005
- International Business Machines Corporation
- James M. Leas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vertical dual gate field effect transistor
- Patent number 6,798,017
- Issue date Sep 28, 2004
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 6,351,134
- Issue date Feb 26, 2002
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Optical FET
- Patent number 6,069,022
- Issue date May 30, 2000
- Internationl Business Machines Corporation
- James Marc Leas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell with transfer device node in selective polysilicon
- Patent number 6,037,210
- Issue date Mar 14, 2000
- International Business Machines Corporation
- James M. Leas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell with transfer device node in selective polysilicon
- Patent number 5,990,511
- Issue date Nov 23, 1999
- International Business Machines Corporation
- James M. Leas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal removal cleaning process and apparatus
- Patent number 5,980,647
- Issue date Nov 9, 1999
- International Business Machines Corporation
- Edward D. Buker
- B08 - CLEANING
Information Patent Grant
Multichip semiconductor structures with consolidated circuitry and...
- Patent number 5,943,254
- Issue date Aug 24, 1999
- International Business Machines Corporation
- Paul Evans Bakeman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 5,929,651
- Issue date Jul 27, 1999
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Structure for making sub-lithographic images by the intersection of...
- Patent number 5,920,101
- Issue date Jul 6, 1999
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for screening integrated circuit chips for lat...
- Patent number 5,841,293
- Issue date Nov 24, 1998
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Structure for making sub-lithographic images by the intersection of...
- Patent number 5,834,818
- Issue date Nov 10, 1998
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating multichip semiconductor structures with con...
- Patent number 5,807,791
- Issue date Sep 15, 1998
- International Business Machines Corporation
- Claude Louis Bertin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical FET
- Patent number 5,789,276
- Issue date Aug 4, 1998
- International Business Machines Corporation
- James Marc Leas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and workpiece for connecting a thin layer to a monolithic el...
- Patent number 5,786,628
- Issue date Jul 28, 1998
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichip semiconductor structures with consolidated circuitry and...
- Patent number 5,731,945
- Issue date Mar 24, 1998
- International Business Machines Corporation
- Claude Louis Bertin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and workpiece for connecting a thin layer to a monolithic el...
- Patent number 5,719,438
- Issue date Feb 17, 1998
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making sub-lithographic images by etching the intersecti...
- Patent number 5,714,039
- Issue date Feb 3, 1998
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,679,609
- Issue date Oct 21, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,661,330
- Issue date Aug 26, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a monolithic electronic module by dicing wafer s...
- Patent number 5,656,553
- Issue date Aug 12, 1997
- International Business Machines Corporation
- James Marc Leas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Thin Single-Crystal Silicon Solar Cells Mounted to a Structural Sup...
- Publication number 20240097065
- Publication date Mar 21, 2024
- Semivation, LLC
- David Vaclav Horak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Piezoelectric Composite and Support Circuit
- Publication number 20110156532
- Publication date Jun 30, 2011
- David L. Churchill
- G01 - MEASURING TESTING
Information Patent Application
CARRIER FOR TEST, BURN-IN, AND FIRST LEVEL PACKAGING
- Publication number 20070001708
- Publication date Jan 4, 2007
- International Business Machines Corporation
- Claude L. Bertin
- G01 - MEASURING TESTING
Information Patent Application
Vertical dual gate field effect transistor
- Publication number 20040219725
- Publication date Nov 4, 2004
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SiGe or germanium flip chip optical receiver
- Publication number 20030094699
- Publication date May 22, 2003
- International Business Corporation
- James M. Leas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Vertical dual gate field effect transistor
- Publication number 20030052364
- Publication date Mar 20, 2003
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TEST AND BURN-IN
- Publication number 20020003432
- Publication date Jan 10, 2002
- JAMES MARC LEAS
- G01 - MEASURING TESTING

James M. Leas

Person

Patents Grantslast 30 patents

Thin single-crystal silicon solar cells mounted to a structural sup...

Bowl-shaped wide-band vibration energy harvester

Wide-band vibration energy harvester with stop

Wide-band vibration energy harvester with restoring spring

Wideband vibration energy harvester

Integrated piezoelectric composite and support circuit

Carrier for test, burn-in, and first level packaging

Vertical dual gate field effect transistor

Carrier for test, burn-in, and first level packaging

SiGe or germanium flip chip optical receiver

Vertical dual gate field effect transistor

Semiconductor wafer test and burn-in

Optical FET

Memory cell with transfer device node in selective polysilicon

Memory cell with transfer device node in selective polysilicon

Metal removal cleaning process and apparatus

Multichip semiconductor structures with consolidated circuitry and...

Semiconductor wafer test and burn-in

Structure for making sub-lithographic images by the intersection of...

Method and apparatus for screening integrated circuit chips for lat...

Structure for making sub-lithographic images by the intersection of...

Methods for fabricating multichip semiconductor structures with con...

Optical FET

Method and workpiece for connecting a thin layer to a monolithic el...

Multichip semiconductor structures with consolidated circuitry and...

Method and workpiece for connecting a thin layer to a monolithic el...

Method for making sub-lithographic images by etching the intersecti...

Fabrication, testing and repair of multichip semiconductor structur...

Fabrication, testing and repair of multichip semiconductor structur...

Method for forming a monolithic electronic module by dicing wafer s...

Patents Applicationslast 30 patents

Thin Single-Crystal Silicon Solar Cells Mounted to a Structural Sup...

Integrated Piezoelectric Composite and Support Circuit

CARRIER FOR TEST, BURN-IN, AND FIRST LEVEL PACKAGING

Vertical dual gate field effect transistor

SiGe or germanium flip chip optical receiver

Vertical dual gate field effect transistor

SEMICONDUCTOR WAFER TEST AND BURN-IN