James W. Hager

Person

Ontario, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Fourier transform quadrupole calibration method
- Patent number 12,080,531
- Issue date Sep 3, 2024
- DH Technologies Development Pte. Ltd.
- James Hager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto gain control for optimum ion trap filling
- Patent number 12,033,844
- Issue date Jul 9, 2024
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform mass spectrometers and methods of analysis using...
- Patent number 11,881,388
- Issue date Jan 23, 2024
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass separator for use in a mass spectrometry system
- Patent number 11,869,758
- Issue date Jan 9, 2024
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform mass spectrometer based on use of a fringing fiel...
- Patent number 11,810,771
- Issue date Nov 7, 2023
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF/DC filter to enhance mass spectrometer robustness
- Patent number 10,741,378
- Issue date Aug 11, 2020
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform mass spectrometer
- Patent number 10,446,384
- Issue date Oct 15, 2019
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF-only detection scheme and simultaneous detection of multiple ions
- Patent number 9,997,340
- Issue date Jun 12, 2018
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for arbitrary quadrupole transmission windowing
- Patent number 9,768,009
- Issue date Sep 19, 2017
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for quantitative and qualitative analysis using m...
- Patent number 9,202,676
- Issue date Dec 1, 2015
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing ions
- Patent number 8,399,826
- Issue date Mar 19, 2013
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole mass filter having improved mass resolution
- Patent number 7,880,140
- Issue date Feb 1, 2011
- DH Technologies Development Pte. Ltd.
- Michael-Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating an ion trap mass spectrometer system
- Patent number 7,622,712
- Issue date Nov 24, 2009
- MDS Analytical Technologies
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a mass spectrometer to provide resonant excitat...
- Patent number 7,601,952
- Issue date Oct 13, 2009
- MDS Analytical Technologies, a business unit of MDS Inc.
- Jim Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning an ion trap mass spectrometer
- Patent number 7,579,585
- Issue date Aug 25, 2009
- Sciex Division of MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for enhancing mass assignment accuracy
- Patent number 7,569,813
- Issue date Aug 4, 2009
- MDS Analytical Technologies, a business unit of MDS Inc.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for providing barrier fields at the entrance and exit end of...
- Patent number 7,365,319
- Issue date Apr 29, 2008
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for providing barrier fields at the entrance and exit end of...
- Patent number 7,227,130
- Issue date Jun 5, 2007
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple quadrupole mass spectrometer with capability to perform mult...
- Patent number 7,060,972
- Issue date Jun 13, 2006
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass spectrometry, to enhance separation of ions with dif...
- Patent number 7,041,967
- Issue date May 9, 2006
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for modifying the fringing fields of a radio freq...
- Patent number 7,019,290
- Issue date Mar 28, 2006
- Applera Corporation
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for reducing artifacts in mass spectrometers
- Patent number 6,909,089
- Issue date Jun 21, 2005
- MDS Inc.
- Frank R. Londry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple quadrupole mass spectrometer with capability to perform mult...
- Patent number 6,720,554
- Issue date Apr 13, 2004
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial ejection resolution in multipole mass spectrometers
- Patent number 6,703,607
- Issue date Mar 9, 2004
- MDS Inc.
- William R. Stott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving signal-to-noise ratios for atmospheric pressur...
- Patent number 6,700,120
- Issue date Mar 2, 2004
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing space charge in a linear ion trap mass spectrometer
- Patent number 6,627,876
- Issue date Sep 30, 2003
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole mass spectrometer with ION traps to enhance sensitivity
- Patent number 6,504,148
- Issue date Jan 7, 2003
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole mass analyzer and method of operation in RF only mode to...
- Patent number 6,194,717
- Issue date Feb 27, 2001
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial ejection in a multipole mass spectrometer
- Patent number 6,177,668
- Issue date Jan 23, 2001
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resolving RF mass spectrometer
- Patent number 6,028,308
- Issue date Feb 22, 2000
- MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Bent PCB Ion Guide for Reduction of Contamination and Noise
- Publication number 20240290600
- Publication date Aug 29, 2024
- DH Technologies Development Pte. Ltd.
- Aaron Timothy BOOY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Performing MS/MS of High Intensity Ion Beams Using a Band...
- Publication number 20240234123
- Publication date Jul 11, 2024
- DH Technologies Development Pte. Ltd.
- Bruce COLLINGS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Planar Ion Processing Station
- Publication number 20240203719
- Publication date Jun 20, 2024
- DH Technologies Development Pte. Ltd.
- Aaron Timothy BOOY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Analyzing Samples Including a High M/Z Cutoff
- Publication number 20240177987
- Publication date May 30, 2024
- DH Technologies Development Pte. Ltd.
- Leigh BEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Variable FFT Analysis Windows in Mass Spectro...
- Publication number 20240162027
- Publication date May 16, 2024
- DH Technologies Development Pte. Ltd.
- James HAGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Identification of Harmonics in RF Quadrupole Fourier Transform Mass...
- Publication number 20230290628
- Publication date Sep 14, 2023
- DH Technologies Development Pte. Ltd.
- James W. HAGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal-to-Noise Improvement in Fourier Transform Quadrupole Mass Sp...
- Publication number 20230290630
- Publication date Sep 14, 2023
- DH Technologies Development Pte. Ltd.
- James W. HAGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Separator for Use in a Mass Spectrometry System
- Publication number 20230147220
- Publication date May 11, 2023
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Pressure Mass Analyzer
- Publication number 20230027201
- Publication date Jan 26, 2023
- DH Technologies Development Pte. Ltd.
- James HAGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fourier Transform Quadrupole Calibration Method
- Publication number 20230010966
- Publication date Jan 12, 2023
- DH Technologies Development Pte. Ltd.
- James Hager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems of Fourier Transform Mass Spectrometry
- Publication number 20220384173
- Publication date Dec 1, 2022
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOURIER TRANSFORM MASS SPECTROMETERS AND METHODS OF ANALYSIS USING...
- Publication number 20220148873
- Publication date May 12, 2022
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Auto Gain Control for Optimum Ion Trap Filling
- Publication number 20220102135
- Publication date Mar 31, 2022
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF/DC Cutoff to Reduce Contamination and Enhance Robustness of Mass...
- Publication number 20210327700
- Publication date Oct 21, 2021
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fourier Transform Mass Spectrometer
- Publication number 20210134573
- Publication date May 6, 2021
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fourier Transform Mass Spectrometer
- Publication number 20180114685
- Publication date Apr 26, 2018
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF/DC FILTER TO ENHANCE MASS SPECTROMETER ROBUSTNESS
- Publication number 20180096832
- Publication date Apr 5, 2018
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Arbitrary Quadrupole Transmission Windowing
- Publication number 20160233077
- Publication date Aug 11, 2016
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF-Only Detection Scheme and Simultaneous Detection of Multiple Ions
- Publication number 20160225593
- Publication date Aug 4, 2016
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR QUANTITATIVE AND QUALITATIVE ANALYSIS USING M...
- Publication number 20150235828
- Publication date Aug 20, 2015
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREATING AN ION-ION REACTION REGION WITHIN A LOW-PRESSURE LINEAR IO...
- Publication number 20140353491
- Publication date Dec 4, 2014
- DH Technologies Development Pte,Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Processing Ions
- Publication number 20110204218
- Publication date Aug 25, 2011
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20100176291
- Publication date Jul 15, 2010
- MDS ANALYTICAL TECHNOLOGIES
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ENHANCING MASS ASSIGNMENT ACCURACY
- Publication number 20090050796
- Publication date Feb 26, 2009
- MDS Analytical Technologies, a business unit of MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPOLE MASS FILTER HAVING IMPROVED MASS RESOLUTION
- Publication number 20080272295
- Publication date Nov 6, 2008
- Michael Mircea-Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING AN ION TRAP MASS SPECTROMETER SYSTEM
- Publication number 20080230691
- Publication date Sep 25, 2008
- MDS Analytical Technologies, a business unit of MDS Inc., doing business thro...
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...
- Publication number 20080017789
- Publication date Jan 24, 2008
- MDS Analytical Technologies, a business unit of MDS Inc.
- Jim Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Scanning an Ion Trap Mass Spectrometer
- Publication number 20070114376
- Publication date May 24, 2007
- Sciex Division of MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for providing barrier fields at the entrance and exit end of...
- Publication number 20070018094
- Publication date Jan 25, 2007
- Sciex Division of MDS Inc.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for providing barrier fields at the entrance and exit end of...
- Publication number 20050263697
- Publication date Dec 1, 2005
- Hydrogenics Corporation
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS

James W. Hager

Person

Patents Grantslast 30 patents

Fourier transform quadrupole calibration method

Auto gain control for optimum ion trap filling

Fourier transform mass spectrometers and methods of analysis using...

Mass separator for use in a mass spectrometry system

Fourier transform mass spectrometer based on use of a fringing fiel...

RF/DC filter to enhance mass spectrometer robustness

Fourier transform mass spectrometer

RF-only detection scheme and simultaneous detection of multiple ions

Systems and methods for arbitrary quadrupole transmission windowing

Method and system for quantitative and qualitative analysis using m...

Method of processing ions

Multipole mass filter having improved mass resolution

Method for operating an ion trap mass spectrometer system

Method of operating a mass spectrometer to provide resonant excitat...

Method and apparatus for scanning an ion trap mass spectrometer

Method for enhancing mass assignment accuracy

Method for providing barrier fields at the entrance and exit end of...

Method for providing barrier fields at the entrance and exit end of...

Triple quadrupole mass spectrometer with capability to perform mult...

Method of mass spectrometry, to enhance separation of ions with dif...

System and method for modifying the fringing fields of a radio freq...

Methods and apparatus for reducing artifacts in mass spectrometers

Triple quadrupole mass spectrometer with capability to perform mult...

Axial ejection resolution in multipole mass spectrometers

Method for improving signal-to-noise ratios for atmospheric pressur...

Method of reducing space charge in a linear ion trap mass spectrometer

Quadrupole mass spectrometer with ION traps to enhance sensitivity

Quadrupole mass analyzer and method of operation in RF only mode to...

Axial ejection in a multipole mass spectrometer

Resolving RF mass spectrometer

Patents Applicationslast 30 patents

Bent PCB Ion Guide for Reduction of Contamination and Noise

Method of Performing MS/MS of High Intensity Ion Beams Using a Band...

Planar Ion Processing Station

Method for Analyzing Samples Including a High M/Z Cutoff

System and Method for Variable FFT Analysis Windows in Mass Spectro...

Identification of Harmonics in RF Quadrupole Fourier Transform Mass...

Signal-to-Noise Improvement in Fourier Transform Quadrupole Mass Sp...

Mass Separator for Use in a Mass Spectrometry System

High Pressure Mass Analyzer

Fourier Transform Quadrupole Calibration Method

Methods and Systems of Fourier Transform Mass Spectrometry

FOURIER TRANSFORM MASS SPECTROMETERS AND METHODS OF ANALYSIS USING...

Auto Gain Control for Optimum Ion Trap Filling

RF/DC Cutoff to Reduce Contamination and Enhance Robustness of Mass...

Fourier Transform Mass Spectrometer

Fourier Transform Mass Spectrometer

RF/DC FILTER TO ENHANCE MASS SPECTROMETER ROBUSTNESS

Systems and Methods for Arbitrary Quadrupole Transmission Windowing

RF-Only Detection Scheme and Simultaneous Detection of Multiple Ions

METHOD AND SYSTEM FOR QUANTITATIVE AND QUALITATIVE ANALYSIS USING M...

CREATING AN ION-ION REACTION REGION WITHIN A LOW-PRESSURE LINEAR IO...

Method of Processing Ions

MASS SPECTROMETER

METHOD FOR ENHANCING MASS ASSIGNMENT ACCURACY

MULTIPOLE MASS FILTER HAVING IMPROVED MASS RESOLUTION

METHOD FOR OPERATING AN ION TRAP MASS SPECTROMETER SYSTEM

METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...

Method and Apparatus for Scanning an Ion Trap Mass Spectrometer

Method for providing barrier fields at the entrance and exit end of...

Method for providing barrier fields at the entrance and exit end of...