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Javier MIGUEL SÁNCHEZ
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Zurich, CH
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Patents Grants
last 30 patents
Information
Patent Grant
Time-of-flight measurement with background light correction
Patent number
12,169,255
Issue date
Dec 17, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sànchez
G01 - MEASURING TESTING
Information
Patent Grant
Linear temperature calibration compensation for spectrometer systems
Patent number
12,163,835
Issue date
Dec 10, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection system calibration
Patent number
12,092,567
Issue date
Sep 17, 2024
ams Sensors Singapore Pte. Ltd.
Francesco Paolo D'Aleo
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating spectral sensor modules
Patent number
12,018,987
Issue date
Jun 25, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating spectral sensor modules
Patent number
11,821,790
Issue date
Nov 21, 2023
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
Measurements using systems having multiple spectrometers
Patent number
11,714,004
Issue date
Aug 1, 2023
ams Sensors Singapore Pte. Ltd.
James Eilertsen
G01 - MEASURING TESTING
Information
Patent Grant
Distance measurements using spectrometer systems
Patent number
11,441,945
Issue date
Sep 13, 2022
ams Sensors Singapore Pte. Ltd.
James Eilertsen
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules and methods for operating the same
Patent number
10,746,544
Issue date
Aug 18, 2020
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sànchez
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTOELECTRONIC MODULE COMPRISING AN INTERLOCK FEATURE
Publication number
20230408697
Publication date
Dec 21, 2023
AMSN SENSORS SINGAPORE PTE. LTD
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MONITORING MECHANICAL INTEGRITY OF AN EYE-SAFETY COMP...
Publication number
20230094981
Publication date
Mar 30, 2023
ams Sensors Singapore Pte. Ltd.
Javier MIGUEL SÁNCHEZ
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR WAVELENGTH CALIBRATION
Publication number
20230052878
Publication date
Feb 16, 2023
ams Sensors Singapore Pte. Ltd.
Javier MIGUEL SÁNCHEZ
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DETECTION SYSTEM CALIBRATION
Publication number
20220373454
Publication date
Nov 24, 2022
ams Sensors Singapore Pte. Ltd.
Francesco Paolo D'Aleo
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL SENSOR
Publication number
20220357200
Publication date
Nov 10, 2022
ams International AG
Francesco Paolo D'Aleo
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING SPECTRAL SENSOR MODULES
Publication number
20220136898
Publication date
May 5, 2022
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING SPECTRAL SENSOR MODULES
Publication number
20220136901
Publication date
May 5, 2022
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
LINEAR TEMPERATURE CALIBRATION COMPENSATION FOR SPECTROMETER SYSTEMS
Publication number
20220026273
Publication date
Jan 27, 2022
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASUREMENTS USING SPECTROMETER SYSTEMS
Publication number
20210396577
Publication date
Dec 23, 2021
James Eilertsen
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENTS USING SYSTEMS HAVING MULTIPLE SPECTROMETERS
Publication number
20210389179
Publication date
Dec 16, 2021
ams Sensors Singapore Pte. Ltd.
James Eilertsen
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT MEASUREMENT WITH BACKGROUND LIGHT CORRECTION
Publication number
20210270946
Publication date
Sep 2, 2021
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
Optoelectronic Modules and Methods for Operating the Same
Publication number
20190033071
Publication date
Jan 31, 2019
HEPTAGON MICRO OPTICS PTE. LTD.
Javier MIGUEL SÁNCHEZ
G01 - MEASURING TESTING